Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Materials Science

Displaying records 321 to 330 of 441 records.
Resort by: Date / Title


321. Optimization of arrays of gold nanodisks for plasmon-mediated Brillouin light scattering
Topic: Materials Science
Published: 7/22/2009
Authors: Ward L Johnson, Sudook A. Kim, Zhandos Utegulov, B. T. Draine
Abstract: Distributions of electric fields in two-dimensional arrays of gold nanodisks on a Si3N4 membrane, with light incident through the membrane, are modeled with the aim of determining array geometries for effective plasmon-mediated Brillouin light scat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854474

322. Long-Term Performance of Nano-Filled Polymeric Materials: Effect of ZnO Nanoparticles on Photodegradation of a Waterborne Polyurethane Coating
Topic: Materials Science
Published: 7/8/2009
Authors: Xiaohong Gu, Dongmei Zhe, Minhua Zhao, Guodong Chen, Nhieu Ly, Paul E Stutzman, Li Piin Sung, Tinh Nguyen, Joannie W Chin
Abstract: Polymers are widely used as exterior coatings in buildings, bridges, aircrafts and automobiles for both protection and aesthetic purposes. However, the service life of the applied coatings is limited due to the photodegradation of polymers induced by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902293

323. Methodology for quantitative measurements of multilayer polymer thin films with IR spectroscopic ellipsometry
Topic: Materials Science
Published: 7/2/2009
Authors: Shuhui Kang, Vivek M Prabhu, Christopher L Soles, Eric K Lin, Wen-Li Wu
Abstract: A new methodology to quantify the sensitivity and resolution of infrared variable angle spectroscopic ellipsometry (IRSE) measurements was developed for probing the depth profile of composition in thin polymer films. A multilayer system comprised of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902197

324. Microscale Polymer-Nanotube Composites
Topic: Materials Science
Published: 7/2/2009
Authors: Erik K. Hobbie, Jeffrey A Fagan, Jan Obrzut, Steven D Hudson
Abstract: Microscopic polymer colloids with an interfacial coating of purified single-wall carbon nanotubes (SWCNTs) have been synthesized from length and type sorted SWCNTs. Aqueous SWNCT suspensions sorted through density-gradient ultracentrifugation are use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901650

325. The Influence Of Hydrogen On The Elastic Modulus And Anelastic Response Of Cold Worked Pure Iron
Topic: Materials Science
Published: 7/1/2009
Authors: Richard E Ricker, David J Pitchure
Abstract: Understanding the influence of hydrogen on elastic deformation and anelastic response should contribute to our understanding of the influence of hydrogen on deformation and fracture. To accomplish this objective, samples of pure iron were cold-worked ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901982

326. Internal tin Nb3Sn conductors engineered for fusion and particle accelerator applications
Topic: Materials Science
Published: 6/22/2009
Authors: Jeffrey Parrell, Y. Zhang, Michael Field, M Meinesz, Yonghua Huang, H Miao, Seungok Hong, Najib Cheggour, Loren Frederick Goodrich
Abstract: The critical current density (Jc) of Nb3Sn strand has been significantly improved over the last several years. For most magnet applications, high Jc internal tin has displaced bronze process strand. The highest Jc values are obtained from distributed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900165

327. Determination of the Electron Escape Depth for NEXAFS Spectroscopy
Topic: Materials Science
Published: 6/2/2009
Authors: Daniel A Fischer, K E Sohn, M D Dimitriou, Jan Genzer, C Hawker, E. J Kramer
Abstract: Depth profiling using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy was used to determine the carbon atom density as a function of depth by analyzing the post-edge signal in NEXAFS spectra. We show that the common assumption in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901683

328. High Strain Rate Tissue Simulant Measurements Using digital Image Correlation
Topic: Materials Science
Published: 6/1/2009
Authors: Steven P Mates, Richard L. Rhorer, Richard Everett, Kirth Simmonds, Amit Bagchi
Abstract: Measuring the response of soft materials to high strain rate deformation is extremely challenging because of the difficulty of achieving dynamic equilibrium during high strain rate mechanical testing such as Kolsky bar testing. Digital image correlat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902304

329. Capillary Instability in Nanoimprinted Polymer Films
Topic: Materials Science
Published: 5/21/2009
Authors: Kyle J. Alvine, Yifu Ding, Hyun Wook Ro, Brian C. Okerberg, Alamgir Karim, Christopher L Soles, Jack F Douglas
Abstract: Capillary forces play an active role in defining the equilibrium structure of nanoscale structures. This effect can be especially pronounced in soft materials such as polymers near or above their glass transition temperatures where material flow is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852751

330. Response of Vascular Smooth Muscle Cells Under Mechanical Deformation Using Silane-Linked Laminin
Topic: Materials Science
Published: 4/22/2009
Authors: Joy P Dunkers, Juan M. Taboas
Abstract: For mechanotransduction studies, extracellular matrix proteins should be robustly attached to the surface to prevent cell delamination during deformation. The standard surface modification method is to incubate proteins on an oxidized, flexible surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900879



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series