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Displaying records 971 to 980 of 1000 records.
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971. The Study of Silicon Stepped Surfaces as Atomic Force Microscope Calibration Standards With a Calibrated AFM at NIST
Topic: Manufacturing
Published: 1/1/1998
Authors: V W. Tsai, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, R Koning, Richard M Silver, E. C. Williams
Abstract: Due to the limitations of modern manufacturing technology, there is no commercial height artifact at the sub-nanometer scale currently available. The single-atom steps on a cleaned silicon (111) surface with a height of 0.314 nm, derived from the lat ...

972. The Validation of CMM Task Specific Measurement Uncertainty Software
Topic: Manufacturing
Published: 1/1/2003
Authors: Steven David Phillips, Bruce R. Borchardt, A Abackerli, Craig M Shakarji, Daniel S Sawyer, P Murray, B Rasnick, K Summerhays, J M Baldwin, M P Henke
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...

973. The stability of milling: an impact oscillator with delay
Topic: Manufacturing
Published: 6/20/2014
Authors: Matthew A Davies, Tony Schmitz, Timothy J Burns

974. Theory and Algorithms for L1 Fitting Used for Planar Datum Establishment in Support of Tolerancing Standards
Topic: Manufacturing
Published: 10/15/2013
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present the theory and algorithms for establishing a datum plane consistent with ASME Y14.5 standard definitions corresponding to a planar datum feature sampled with coordinate data that is weighted,. The method uses a one-sided minimization searc ...

975. Theory and Algorithms for Weighted Total Least-Squares Fitting of Lines, Planes, and Parallel Planes to Support Tolerancing Standards
Topic: Manufacturing
Published: 8/16/2013
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present the theory and algorithms for fitting a line, a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems ...

976. Thermal Expansion of Long Slender Rods With Forced Convection Cooling Along the Rod Length
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5975
Topic: Manufacturing
Published: 1/1/1997
Author: F Rudder
Abstract: This report presents explicit analytical expressions for the thermal expansion of a rod with heat input at one end and forced convection cooling along the length of the rod. When the rod is graduated for length measurement (i.e., a ruler or ball scre ...

977. Thermal and Flammability Properties of a Silica-Pmma Nanocomposite
Topic: Manufacturing
Published: 1/1/2000
Authors: Abby W. Morgan, Joseph M Antonucci, Mark R VanLandingham, R H Harris, Takashi Kashiwagi

978. Three steps towards metrological traceability for ballistics signature measurements
Topic: Manufacturing
Published: 2/1/2010
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Xiaoyu A Zheng, Li Ma, James H Yen, Martin Ols
Abstract: The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 bullets and 2461 casings. NIST and ATF are propos ...

979. Three-dimensional Scanning Optical Tweezers
Topic: Manufacturing
Published: 12/5/2005
Authors: Thomas W LeBrun, T W. Hwang, I Y Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G Dagalakis, Cedric Victor Lucien Gagnon, Arvind Kumar Balijepalli
Abstract: There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily release an object without the need of a complicated detaching scheme. Secondly, it is antici ...

980. Through-focus scanning optical microscope imaging method for nano-scale dimensional analysis
Topic: Manufacturing
Published: 9/1/2008
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present a novel optical technique that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope, by analyzing two-dimensional through-focus scanning optical microscope (TSOM) images constructed us ...

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