NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing
Sorted by: title

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 971 to 980 of 1000 records.
Resort by: Date / Title

971. Selecting Valid Correlation Areas for Automated Bullet Identification Systems Based on Striation Detection
Topic: Manufacturing
Published: 5/1/2011
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Richard M Silver

972. Self-Calibration and Error Compensation Using Reference Position Markers
Topic: Manufacturing
Published: 1/1/1999
Author: H Zou
Abstract: In this paper, reference position markers are proposed for self-calibration and error compensation. Self-calibration of x-y motion guides is discussed with a focus on the orthogonality calibration. An algorithm is developed using a closure method and ...

973. Self-Calibration: Reversal, Redundancy, Error Separation, and "Absolute Testing"
Topic: Manufacturing
Published: 1/1/1996
Authors: Christopher J. Evans, R Hocken, William Tyler Estler
Abstract: Over the years many techniques have been developed for accurate measurement of part features without reference to an externally calibrated artifact. This paper presents a partial survey of such methods for dimensional metrology, their ranges of appli ...

974. Self-Similarity Simplification Approaches for the Modeling and Analysis of Rockwell Hardness Indentation
Series: Journal of Research (NIST JRES)
Topic: Manufacturing
Published: 9/1/2003
Authors: Li Ma, J Zhou, A Lau, Samuel Rea Low III, R Dewit
Abstract: The indentation process of pressing a rockwell diamond indenter into inelastic material has been studied to provide a means for the analysis, simulation and prediction of Rockwell hardness tests. The geometrical characteristics of the spheroconical-s ...

975. Semantic B2B-integration Using an Ontological Message Metamodel
Topic: Manufacturing
Published: 9/1/2010
Authors: Marko Vujasinovic, Nenad Ivezic, Edward J Barkmeyer, Zoran Marjanovic
Abstract: E-Business applications are often required to use different, incompatible, message sets to implement message interfaces for a business-to-business (B2B) communication. This makes communication with every new partner a new interoperability problem. In ...

976. Semantic-Mediation for Standards-based B2B Interoperability
Topic: Manufacturing
Published: 6/15/2009
Authors: Marko Vujasinovic, Nenad Ivezic, Boonserm Kulvatunyou, Edward J Barkmeyer, Michele Missikoff, Francesco Taglino, Zoran Marjanovic, Igor Miletic
Abstract: The authors discuss a semantic-mediation architecture to advance traditional approaches for standards-based business-to-business (B2B) interoperability. The architecture is supported by the ATHENA Knowledge Representation and Semantics Mediation tool ...

977. Semiconductor Manufacturing Equipment Data Acquisition Simulation for Timing Performance Analysis
Topic: Manufacturing
Published: 9/22/2008
Authors: James Moyne, YaShian Li-Baboud, Xiao Zhu, Dhananjay Anand, Sulaiman Hussain
Abstract: The ability to acquire quality equipment and process data is pertinent for future real-time process control systems to maximize opportunities for semiconductor manufacturing yield enhancement and equipment efficiency. Clock synchronization for accur ...

978. Sensors and Process Control in Gas Atomization
Topic: Manufacturing
Published: 1/1/1991
Authors: S Ridder, Steve Osella, P Espina, F Biancaniello

979. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Topic: Manufacturing
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...

980. Separation of Inner Shell Vacancy Transfer Mechanisms in Collisions of Slow Ar17+ Ions with SiO2
Topic: Manufacturing
Published: 1/1/2001
Authors: Z Berenyi, N Stolterfoht, E Takacs, J Pedulla, R Deslattes, J Gillaspy, R Minniti, L Ratliff
Abstract: We have studied the spectrum of x-rays emitted when 130 and 200 keV kinetic energy hydrogen-like argon ions impact silicon dioxide surfaces. Specifically, we were interested in the mechanism for creation of K-shell holes in the silicon target atoms, ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series