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You searched on: Topic Area: Manufacturing Sorted by: title

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Displaying records 971 to 980 of 1000 records.
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971. The Advanced Angle Metrology System at NIST
Topic: Manufacturing
Published: 11/1/2003
Author: Jack A Stone Jr.
Abstract: At the National Institute of Standards and Technology, our best capability for angle measurement is our Advanced Automated Master Angle Calibration System (AAMACS). This instrument is based on a triple-stack of indexing tables, used in conjunction w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823171

972. The Biological Evidence Preservation Handbook: Best Practices for Evidence Handlers
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7928
Topic: Manufacturing
Published: 4/23/2013
Authors: Susan M Ballou, Margaret C Kline, Mark David Stolorow, Melissa K Taylor, Shannan R Williams, Phylis S Bamberger, Burney Yvette, Larry Brown, Cynthia E. Jones, Ralph Keaton, William Kiley, Karen Thiessen, Gerry LaPorte, Joseph Latta, Linda E Ledray, Randy Nagy, Linda Schwind, Stephanie Stoiloff, Brian Ostrom
Abstract: The report of the Technical Working Group on Biological Evidence Preservation offers guidance for individuals involved in the collection, examination, tracking, packaging, storing, and disposition of biological evidence. This may include crime sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913699

973. The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints
Topic: Manufacturing
Published: 1/1/1997
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, David E Ward, K Eberhardt, M. Levenson, Marjorie A McClain, B Melvin, Ted Hopp, Y Shen
Abstract: The calculation of task specific measurement uncertainty when using coordinate measuring machines is an important and challenging task. Current methods to address this issue use simulation techniques (e.g., the virtual CMM) where the propagation of k ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820857

974. The Challenge of Nanometrology
Topic: Manufacturing
Published: 7/1/2002
Author: Michael T Postek
Abstract: The promise and challenge of nanotechnology is immense. The National Nanotechnology Initiative provides an opportunity to develop a new technological base for U.S. Industry. Nanometrology is the basis of the new measurement methods that must be devel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821759

975. The Challenges of Nanometrology
Topic: Manufacturing
Published: 1/1/2002
Author: Michael T Postek
Abstract: The promise and challenge of nanotechnology is immense. The National Nanotechnology Initiative provides an opportunity to develop a new technological base for U.S. Industry. Nanometrology is the basis of the new measurement methods that must be dev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823145

976. The Coming of Age of Tilt CD-SEM
Topic: Manufacturing
Published: 3/1/2007
Authors: B Bunday, J Allgair, E Solecky, C Archie, Ndubuisi George Orji
Abstract: The need for 3D metrology is becoming more urgent to address critical gaps in metrology for both lithographic and etch processes. Current generation lithographic processing (ArF source, where lambda=193 nm) sometimes results in photoresist lines with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823229

977. The DOE2000 Materials MicroCharacterization Collaboratory
Topic: Manufacturing
Published: 1/1/1998
Authors: E Voelkl, K Alexander, J Mabon, M O'Keefe, Michael T Postek, M Wright, N J Zaluzec
Abstract: The Materials Microcharacterization Collaboratory (MMC) was created last year as a pilot project within the U.S. Department of Energy''s DOE2000 program. The DOE2000 program has, as its main goals, to develop improved capabilities for solving DOE''s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820921

978. The Design of an Atomic Force Microscope for Metrology
Topic: Manufacturing
Published: 1/1/1994
Authors: T Mcwaid, J Schneir
Abstract: Atomic force microscope (AFM) is a rapidly evolving technique which has been used in numerous academic studies since its invention eight years ago. AFM manufacturers are now marketing instruments for industrial metrology applications. The National In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820694

979. The Development of a Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1994
Authors: T Mcwaid, J Schneir
Abstract: Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in ultraprecision metrology. Each of these industries is currently investigating the use of A ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820695

980. The Development of an Industrial Standard (Standard Reference Material) SRM 2090
Topic: Manufacturing
Published: 11/22/1996
Author: Michael T Postek
Abstract: This management report documents, as a case study, the development of a new industrial standard, SRM 2090, from the view point of the technologist. This report can be viewed as a generic template for the development of a state-of-the-art NIST standar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820860



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