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You searched on: Topic Area: Manufacturing Sorted by: title

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Displaying records 951 to 960 of 1000 records.
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951. THE MULTI-RELATIONSHIP EVALUATION DESIGN FRAMEWORK: DESIGNING TESTING PLANS TO COMPREHENSIVELY ASSESS ADVANCED AND INTELLIGENT TECHNOLOGIES
Topic: Manufacturing
Published: 5/5/2010
Authors: Brian A Weiss, Linda C. Schmidt, Harry A. Scott, Craig I Schlenoff
Abstract: As new technologies are developed and mature, it becomes extremely important to provide both formative and summative assessments on their performance. Performance assessment events range in form from a few simple tests of key elements of the technolo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905063

952. TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces
Topic: Manufacturing
Published: 1/1/1994
Authors: J. Bennett, John A Dagata
Abstract: Not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820670

953. TOWARDS CONTINUOUSLY UPDATED SIMULATION MODELS: Combining Automated Raw Data Collection and Automated Data Processing
Topic: Manufacturing
Published: 12/10/2010
Authors: John L Michaloski, Anders Skoogh, Nils Bengtsson
Abstract: Discrete Event Simulation (DES) is a powerful tool for efficiency improvements in production. However, instead of integrating the tool in the daily work of production engineers, companies apply it mostly in single-purpose studies such as major invest ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905776

954. TOWARDS DATA DRIVEN SUSTAINABLE MACHINING Combining Mtconnect Production Data and Discrete Event Simulation
Topic: Manufacturing
Published: 10/15/2010
Authors: Nils Bengtsson, John L Michaloski, Frederick M Proctor, Guodong Shao, Sid Venkatesh
Abstract: Recently there has been an increased focus on the environmental aspects of the manufacturing industry across the world. Boeing and NIST have studied the incorporation of Life Cycle Assessments (LCA) parameters into Discrete Event Simulation (DES) as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906603

955. Technical Directions of the NIST Precision Engineering Division: 1997-2001
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6218
Topic: Manufacturing
Published: 1/1/1998
Authors: Dennis A Swyt, Howard H. Harary, Michael T Postek, Richard M Silver, Theodore Vincent Vorburger
Abstract: This report, based on U.S. industry roadmaps and related National Institute of Standards and Technology studies, is a product of the process of strategic planning for the NIST Precision Engineering Division (PED) and presents the major technological ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820917

956. Technology Readiness Levels for Randomized Bin Picking
Topic: Manufacturing
Published: 6/13/2012
Authors: Jeremy A Marvel, Roger D. Eastman, Geraldine S Cheok, Kamel S Saidi, Tsai Hong Hong, Elena R Messina
Abstract: A proposal for the utilization of Technology Readiness Levels to the application of unstructured bin picking is discussed. A special session was held during the 2012 Performance Metrics for Intelligent Systems workshop to discuss the challenges and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911421

957. Technology Readiness Levels for Randomized Bin Picking, Performance Metrics for Intelligent Systems (PerMIS) 2012 Workshop, Special Session
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7876
Topic: Manufacturing
Published: 9/4/2012
Authors: Jeremy A Marvel, Roger D. Eastman, Geraldine S Cheok, Kamel S Saidi, Tsai Hong Hong, Elena R Messina, Bob Bollinger, Paul Evans, Joyce Guthrie, Eric Hershberger, Carlos Martinez, Karen McNamara, James Wells
Abstract: The special session on Technology Readiness Levels (TRLs) for Randomized Bin Picking was held during the morning session of the 2012 Performance Metrics for Intelligent Systems (PerMIS) workshop, 21 March, 2012. The stated objective of the speci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911415

958. Telepresence:  A New Paradigm for Industrial and Scientific Collaboration
Topic: Manufacturing
Published: 6/1/1999
Authors: Michael T Postek, Marylyn H. Bennett, N J Zaluzec
Abstract: A portion of the mission of the National Institute of Standards and Technology (NIST) Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. industry.  The successful development of a Collaboratory f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823114

959. Telepresence:  A New Paradigm for Solving Contamination Problems
Topic: Manufacturing
Published: 1/1/1999
Authors: Michael T Postek, Marylyn H. Bennett, N J Zaluzec
Abstract: When a contamination event occurs in a semiconductor fab, a process engineer must act quickly to find the cause. It is cost-prohibitive to maintain a full complement of analytical tools in a fab that would be necessary to identify very small particle ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823117

960. Telepresence: A New Paradigm for Industrial and Scientific Collaboration
Topic: Manufacturing
Published: 6/1/1999
Authors: Michael T Postek, Marylyn H. Bennett, N J Zaluzec
Abstract: The successful development of a collaboratory for Telepresence Microscopy (TPM) provides an important new tool to promote technology transfer in the areas of measurement technology. NIST and Texas Instruments (TI), under the auspices of the National ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820945



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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
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  • SP 400-XX: Semiconductor Measurement Technology
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  • SP 700-XX: Industrial Measurement Series
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