NIST logo

Publications Portal

You searched on: Topic Area: Manufacturing Sorted by: title

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 951 to 960 of 1000 records.
Resort by: Date / Title


951. Theory and Algorithms for Weighted Total Least-Squares Fitting of Lines, Planes, and Parallel Planes to Support Tolerancing Standards
Topic: Manufacturing
Published: 8/16/2013
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present the theory and algorithms for fitting a line, a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912180

952. Thermal Expansion of Long Slender Rods With Forced Convection Cooling Along the Rod Length
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5975
Topic: Manufacturing
Published: 1/1/1997
Author: F Rudder
Abstract: This report presents explicit analytical expressions for the thermal expansion of a rod with heat input at one end and forced convection cooling along the length of the rod. When the rod is graduated for length measurement (i.e., a ruler or ball scre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820871

953. Thermal and Flammability Properties of a Silica-Pmma Nanocomposite
Topic: Manufacturing
Published: 1/1/2000
Authors: Abby W. Morgan, Joseph M Antonucci, Mark R VanLandingham, R H Harris, Takashi Kashiwagi
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853638

954. Three steps towards metrological traceability for ballistics signature measurements
Topic: Manufacturing
Published: 2/1/2010
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Xiaoyu A Zheng, Li Ma, James H Yen, Martin Ols
Abstract: The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 bullets and 2461 casings. NIST and ATF are propos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901492

955. Three-dimensional Scanning Optical Tweezers
Topic: Manufacturing
Published: 12/5/2005
Authors: Thomas W LeBrun, T W. Hwang, I Y Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G Dagalakis, Cedric Victor Lucien Gagnon, Arvind Kumar Balijepalli
Abstract: There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily release an object without the need of a complicated detaching scheme. Secondly, it is antici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822371

956. Through-focus scanning optical microscope imaging method for nano-scale dimensional analysis
Topic: Manufacturing
Published: 9/1/2008
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present a novel optical technique that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope, by analyzing two-dimensional through-focus scanning optical microscope (TSOM) images constructed us ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824668

957. Tip Characterization for Dimensional Nanometrology
Topic: Manufacturing
Published: 1/1/1999
Author: John S Villarrubia
Abstract: Technological trends are increasingly requiring dimensional metrology at size scales below a micrometer. Scanning probe microscopy has unique advantages in this size regime, but width and roughness measurements must be corrected for imaging artifacts ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822459

958. Tip Characterization for Dimensional Nanometrology
Topic: Manufacturing
Published: 1/1/2004
Author: John S Villarrubia
Abstract: Abstract: Technological trends are increasingly requiring dimensional metrology at size scales below a micrometer. Scanning probe microscopy has unique advantages in this size regime, but width and roughness measurements must be corrected for imagin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822539

959. Tip Characterization for Scanned Probe Microscope Width Metrology
Topic: Manufacturing
Published: 3/1/1998
Authors: Samuel Dongmo, John S Villarrubia, Samuel N Jones, Thomas B Renegar, Michael T Postek, Jun-Feng Song
Abstract: Determination of the tip shape is an important prerequisite for converting the various scanning probe microscopies form imaging tools into dimensional metrology tools with sufficient accuracy to meet the critical dimension measurement requirements of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823092

960. Tip and Surface Reconstruction in Scanned Probe Microscopy
Topic: Manufacturing
Published: 1/1/1997
Author: John S Villarrubia
Abstract: The non-vanishing size of tips in scanned probe microscopes (e.g., atomic force microscope or scanning tunneling microscope) results in imaging errors. Correction of these errors requires estimation of the tip shape (tip reconstruction) followed by e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820881



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series