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951. SEM Sentinel - SEM Performance Measurement System, Part 1
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6498
Topic: Manufacturing
Published: 4/1/2000
Authors: Alice V. Ling, Andras Vladar, Bradley N Damazo, M Alkan Donmez, Michael T Postek
Abstract: This report describes the current design of a system for monitoring the performance of several major subsystems of a scanning electron microscope (SEM). The following subsystems and the associated functional parameters will be monitored. 1) Vacuum sy ...

952. SEM Sentinel-SEM Performance Measurement System
Topic: Manufacturing
Published: 8/1/2001
Authors: Bradley N Damazo, Andras Vladar, Alice V. Ling, M Alkan Donmez, Michael T Postek, Crossley E Jayewardene
Abstract: This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagnosis of the vacuum system and ...

953. SI Traceability of Force at the Nanonewton Level
Topic: Manufacturing
Published: 1/1/2001
Authors: David B Newell, Jon Robert Pratt, John A Kramar, Douglas T Smith, L Feeney, Edwin Ross Williams
Abstract: Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI) below one newton. The National Institute of Standards and Technology has launched a five-y ...

Topic: Manufacturing
Published: 5/19/2014
Authors: Deogratias Kibira, Yung-Tsun Tina Lee, Jennifer Lyn Marshall, Allison Barnard Feeney, Larry Avery, Allie Jacobs
Abstract: To address the inadequacy of existing standards regarding interior layout design, the Department of Homeland Security (DHS) Science and Technology Directorate, the National Institute of Standards and Technology (NIST), the National Institute for Occu ...

Topic: Manufacturing
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...

956. SPM-Based Lithography for Electronics Device Fabrication: New Strategies and Directions
Topic: Manufacturing
Published: 1/1/1995
Author: John A Dagata
Abstract: Direct patterning of a semiconductor surface to produce an ultrathin oxide mask has proven to be a promising approach for integrating lithographic methods based on scanned probe microscopy (SPM) into existing electronics device processing. The result ...

957. SRM 2460/2461 Standard Bullets and Casings Project
Topic: Manufacturing
Published: 7/10/2002
Authors: Jun-Feng Song, Eric Paul Whitenton, David R Kelley, Robert A. Clary, L Ma, Susan M Ballou, M Ols
Abstract: The National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 2460/2461 standard bullets and casings project will provide support to firearms examiners and to the National Integrated Ballistics Information Network (NIBIN ...

958. STEP - Compliant NC Research: The Search for Intelligent CAD/CAPP/CAM/CNC Integration
Topic: Manufacturing
Published: 5/31/2004
Authors: Xun W. Xu, H Wang, Jian Mao, S T Newman, Thomas Rollin Kramer, Frederick M Proctor, John L Michaloski
Abstract: Since the first generation of NC machine tool was developed in 1950s, there have been many developments, which make today's NC machines completely unrecognisable from their early ancestors. These developments however are now being significantly l ...

959. STEP, XML, and UML: Complementary Technologies
Topic: Manufacturing
Published: 12/15/2004
Authors: Russell S. Peak, Joshua Lubell, Vijay Srinivasan, Stephen C. Waterbury
Abstract: One important aspect of product lifecycle management (PLM)is the computer-sensible representation of product information. Over the past 15 years or so, several languages and technologies have emerged that vary in their emphasis and applicability for ...

960. STEP-OAGIS Harmonization Joint Working Group, PDM Subgroup Interim Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7618
Topic: Manufacturing
Published: 8/27/2009
Authors: Xenia Fiorentini, Rachuri Rachuri
Abstract: In any manufacturing enterprise, there are two types of tools used to create and share product related data across its extended network. The engineering information of the product is created using what is commonly called engineering authoring tool (e ...

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