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951. Static and Dynamic Stability Performance Measurements of the Home Lift, Position and Rehabilitation (HLPR) Chair/Forklift
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7667
Topic: Manufacturing
Published: 3/3/2010
Authors: Joshua Johnson, Roger V Bostelman
Abstract: The Home Lift, Position and Rehabilitation (HLPR) Chair, developed at the National Institute of Standards and Technology (NIST), has unique capabilities and a unique shape as compared to conventional wheelchairs and powered chairs. The evaluation of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902750

952. Statistical Measure for the Sharpness of the SEM Image
Topic: Manufacturing
Published: 7/1/1997
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820884

953. Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments
Topic: Manufacturing
Published: 1/1/1996
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: The measurement of pitch in metrology instruments is through to be a benign self-compensating function. In the course of issuing the new scanning electron microscope standard SRM 2090, a new algorithm for the measurement of pitch was developed. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820885

954. Step Height Metrology for Data Storage Applications
Topic: Manufacturing
Published: 11/1/1999
Authors: R Koning, Ronald G Dixson, Joseph Fu, Thomas B Renegar, Theodore Vincent Vorburger, V W. Tsai, Michael T Postek
Abstract: The measurements of bump heights and pit depth on compact discs (CD) with atomic force microscopes (AFMs) are quite different from the measurement of step heights on step height calibration standards.  Both the bumps and the pits show much large ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823118

955. Step-height Metrology for Data Storage Applications
Topic: Manufacturing
Published: 11/1/1999
Authors: R Koning, Ronald G Dixson, Joseph Fu, Thomas B Renegar, Theodore Vincent Vorburger, V W. Tsai, Michael T Postek
Abstract: The measurement of bump heights and pit depth on compact discs (CD) with atomic force microscopes (AFMs) is quite different from the measurement of step heights on step height calibration standards. Both the bumps and the pits show much larger transi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820931

956. Stitching of Equatorial Profiles for Extended Spatial Range Assessment
Topic: Manufacturing
Published: 8/1/1996
Authors: P Sullivan, R E. Parks, Lianzhen Shao
Abstract: This paper describes a method for stitching multiple overlapping interferometric measurements of the equator of a high quality sphere to produce a single profile representing the roundness of the ball. The resulting optical profile measurement is com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820826

957. Stopping the Flow of Counterfeit Manufactured Goods into the United States
Series: Grant/Contract Reports (NISTGCR)
Topic: Manufacturing
Published: 1/30/2012
Author: Charles McLean
Abstract: This report identifies some of the issues that the U.S. currently faces with respect to counterfeit manufactured goods and suggests possible solutions to this growing problem. Manufacturing industries and products affected by counterfeiting include ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910671

958. Strategy for Faster Blind Reconstruction of Tip Geometry for Scanned Probe Microscopy
Topic: Manufacturing
Published: 6/1/1998
Author: John S Villarrubia
Abstract: In scanned probe microscopy, it is necessary to know the tip's geometry in order to correct image distortions due to its finite size. Heretofore, methods have focused upon determining the tip shape by erosion of a tip characterizer of known geometry ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820919

959. Strategy for Post-Process Control of a Machine Tool
Topic: Manufacturing
Published: 1/1/1994
Authors: Theodore Vincent Vorburger, K Yee, Brian R Scace, F Rudder
Abstract: The automated control of machine-tool accuracy is discussed based on a quality architecture containing three control loops: real-time, process-intermittent, and post-process. This paper highlights the post-process loop. The architecture is being impl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820726

960. Strengths and Limitations of Surface Texture Characterization Techniques
Topic: Manufacturing
Published: 1/1/2001
Author: Theodore Vincent Vorburger
Abstract: Surface finish is important to the function of a wide range of industrial components including highways, ship hulls and propellers, mechanical parts, semiconductors, and optics. Hence, many documentary standards have been developed for specifying su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823141