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931. The DOE2000 Materials MicroCharacterization Collaboratory
Topic: Manufacturing
Published: 1/1/1998
Authors: E Voelkl, K Alexander, J Mabon, M O'Keefe, Michael T Postek, M Wright, N J Zaluzec
Abstract: The Materials Microcharacterization Collaboratory (MMC) was created last year as a pilot project within the U.S. Department of Energy''s DOE2000 program. The DOE2000 program has, as its main goals, to develop improved capabilities for solving DOE''s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820921

932. The Design of an Atomic Force Microscope for Metrology
Topic: Manufacturing
Published: 1/1/1994
Authors: T Mcwaid, J Schneir
Abstract: Atomic force microscope (AFM) is a rapidly evolving technique which has been used in numerous academic studies since its invention eight years ago. AFM manufacturers are now marketing instruments for industrial metrology applications. The National In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820694

933. The Development of a Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1994
Authors: T Mcwaid, J Schneir
Abstract: Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in ultraprecision metrology. Each of these industries is currently investigating the use of A ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820695

934. The Development of an Industrial Standard (Standard Reference Material) SRM 2090
Topic: Manufacturing
Published: 11/22/1996
Author: Michael T Postek
Abstract: This management report documents, as a case study, the development of a new industrial standard, SRM 2090, from the view point of the technologist. This report can be viewed as a generic template for the development of a state-of-the-art NIST standar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820860

935. The Dimensional Markup Language Specification for Inspection Results Data
Topic: Manufacturing
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results file ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903179

936. The Effect of Gaussian Filter Long Wavelength Cutoff in Topography Comparisons and Measurements
Topic: Manufacturing
Published: 1/1/2006
Authors: Jun-Feng Song, Lijun Ma, Theodore Vincent Vorburger
Abstract: Five parameters are used for 2D and 3D topography comparisons and measurements, those include two correlation parameters Ds and CCFmax , and three surface parameters: the r-m-s roughness Rq (or Sq for 3D), r-m-s waviness Wq and Gaussian filter long w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823217

937. The Effects of Quantization on 3D Topography Characterization
Topic: Manufacturing
Published: 2/1/1994
Authors: E Mainsah, P Sullivan, K Stout
Abstract: This paper investigates the influence of quantization on 3D surface characterization by carrying out an analysis of surface parameter changes on a range of real and simulated surfaces. The changes in parameters are calculated as a percentage of the o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820691

938. The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5698
Topic: Manufacturing
Published: 2/1/1995
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820754

939. The Estimation of Measurement Uncertainty of Small Circular Features Measured by Coordinate Measuring Machines
Topic: Manufacturing
Published: 4/1/1998
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler, J Buttress
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy; i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820903

940. The Gage Block Handbook
Series: Monograph (NIST MN)
Report Number: 180
Topic: Manufacturing
Published: 6/1/1995
Authors: Theodore D Doiron, John S Beers
Abstract: Gage blocks are the primary method used by industry to standardize the measurement of dimension. This work discusses every aspect of gage block calibration, including definitions, characteristics of gage blocks, calibration by interferometry and mech ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820735



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