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Displaying records 931 to 940 of 1000 records.
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931.
Single-Integral-Equation Method for Three-Dimensional Scattering
Topic: Manufacturing
Published: 7/1/2001
Author: Egon Marx
Abstract: The fields scattered by a homogeneous dielectric or finitely conducting object can be obtained from two tangential vector fields, the components of the electric and magnetic fields, on the interface. We have adapted the single-integral-equation metho
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822445
932.
Sliding Mode Control for Active Vibration Isolation of a Long Range Scanning Tunneling Microscope
Topic: Manufacturing
Published: 10/29/2004
Authors: K J Lan, James H Yen, John A Kramar
Abstract: An active vibration isolation (AVI) system has been designed and implemented for the Molecular Measuring Machine (M3) at the National Institute of Standards and Technology (NIST). NIST is investigating active vibration isolation as an approach to imp
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822380
933.
Some Considerations for a Measurement Strategy for Circular Features
Topic: Manufacturing
Published: 1/1/1994
Authors: Howard H. Harary, C Buchard, P L heritier, J Dufraigne, P Chollet
Abstract: The careful study of manufactured parts is a prerequisite for their intelligent inspection. For this study, we conducted a survey of the processes for making holes by manufacturing a set of test parts using ten different machining processes. The hole
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820683
934.
Some Developments at NIST on Traceability in Dimensional Measurements
Topic: Manufacturing
Published: 10/1/2001
Authors: Dennis A Swyt, Steven David Phillips, J Palmateer
Abstract: This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These d
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821616
935.
Some Interactions of Information and Control in Integrated Automation Systems
Topic: Manufacturing
Published: 6/1/1989
Author: Edward J Barkmeyer
Abstract: The ready availability of inexpensive and standard communications hardware in the late 1980's, coupled with sufficient standardization of intermediate-layer protocols to make reliable machine-to-machine communications thorough any combination of
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821010
936.
Sources of Error in Absolute Distance Interferometry
Topic: Manufacturing
Published: 1/1/1999
Authors: Jack A Stone Jr, Alois Stejskal, Lowell P. Howard
Abstract: In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of uncertainty that limit the accuracy of this technique for distance measurement. We have primaril
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820951
937.
Space-Scale Analysis of Line Edge Roughness on 193 nm Lithography Test Structures
Topic: Manufacturing
Published: 10/1/2003
Authors: Ndubuisi George Orji, Jayaraman Raja, Theodore Vincent Vorburger, Xiaohong Gu
Abstract: Line edge roughness (LER) is a potential showstopper for the semiconductor industry. As the width of patterned line structures decreases, LER is becoming a non-negligible contributor to resist critical dimension (CD) variation. The International Te
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823166
938.
Special Issue on Collaborative Engineering
Topic: Manufacturing
Published: 6/1/2006
Authors: Ram D Sriram, Simon Szykman, D Durham
Abstract: Design of complex engineering systems is increasingly becoming a collaborative task among designers or design teams that are physically, geographically, and temporally distributed. The complexity of modern products means that a single designer or des
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822614
939.
Stability Analysis of Interrupted Cutting With Finite Time in the Cut
Topic: Manufacturing
Published: 1/1/2001
Authors: P V Bayly, J E Halley, Matthew A. Davies, Jon Robert Pratt
Abstract: The stability of interrupted cutting is examined for the case in which the tool is in contact with the work piece for a small, but finite, fraction of the tooth-passing period. A model of a single degree-of-freedom tool excited by intermittent, rege
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821864
940.
Standard Deviation or Standard Deviation of the Mean - How to Report Statistical Variation in Surface Calibrations?
Topic: Manufacturing
Published: 10/1/2004
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Both the standard deviation and the standard deviation of the mean might be used for reporting the statistical variation in the surface calibration reports. In practice, however, if the calibration laboratories or standard agencies could not provide
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822235