NIST logo

Publications Portal

You searched on: Topic Area: Manufacturing Sorted by: title

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 931 to 940 of 1000 records.
Resort by: Date / Title

931. Test Tool for Industrial Ethernet Network Performance
Topic: Manufacturing
Published: 6/5/2009
Authors: James D Gilsinn, Freemon Johnson
Abstract: The number of devices that implement Ethernet interfaces on the factory floor is growing at an exponential rate along with the adoption of industrial-grade Ethernet networks on the plant floor. In addition to the sheer number of devices using indust ...

932. Test of CD-SEM Shape-Sensitive Linewidth Measurement
Topic: Manufacturing
Published: 7/1/2004
Authors: John S Villarrubia, Andras Vladar, Michael T Postek
Abstract: In a model-based library (MBL) approach to scanning electron microscope (SEM) linewidth measurement, a library of simulation results for a range of lineshapes is searched for a match to the measured image of the unknown line. Compared to standard alg ...

933. Test of a Slow Off-Axis Parabola at it
Topic: Manufacturing
Published: 11/1/1995
Authors: R E. Parks, Christopher J. Evans, Lianzhen Shao
Abstract: We describe the interferometric testing of a slow (f/16 at the center of curvature) off-axis parabola, intended for use in an x-ray spectrometer, that uses a spherical wave front matched to the mean radius of the asphere. We find the figure error in ...

934. Testing Displacement-Measuring Interferometer Systems
Topic: Manufacturing
Published: 1/1/1998
Authors: Jack A Stone Jr., Martin Schroeck, Michael T. Stocker
Abstract: We have made a study of one method for testing displacement-measuring interferometer systems, a modified back-to-back comparison, that automatically compensates for changes in the optical path length between the two interferometers.  Although th ...

935. Testing Interoperability Standards - A Test Case Generation Methodology
Topic: Manufacturing
Published: 6/16/2010
Authors: Nenad Ivezic, Jungyub Woo
Abstract: Over many years, National Institute of Standards and Technology (NIST) built test beds to support interoperability standards development and their implementation within software applications. A general test framework has been proposed to enhance new ...

936. Testing System of IEEE 1451.5-802.11 Standard-based Wireless Sensors
Topic: Manufacturing
Published: Date unknown
Authors: Kang B Lee, Yuyin Song, Frederick M Proctor
Abstract: The hierarchical architecture of factory equipment networks consists of the factory level, cell level, and device level. The equipment at different levels of the factory networks may employ different network communication protocols. The challenges th ...

937. The Advanced Angle Metrology System at NIST
Topic: Manufacturing
Published: 11/1/2003
Author: Jack A Stone Jr.
Abstract: At the National Institute of Standards and Technology, our best capability for angle measurement is our Advanced Automated Master Angle Calibration System (AAMACS). This instrument is based on a triple-stack of indexing tables, used in conjunction w ...

938. The Biological Evidence Preservation Handbook: Best Practices for Evidence Handlers
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7928
Topic: Manufacturing
Published: 4/23/2013
Authors: Susan M Ballou, Margaret C Kline, Mark David Stolorow, Melissa K Taylor, Shannan Williams, Phylis S Bamberger, Burney Yvette, Larry Brown, Cynthia E. Jones, Ralph Keaton, William Kiley, Karen Thiessen, Gerry LaPorte, Joseph Latta, Linda E Ledray, Randy Nagy, Linda Schwind, Stephanie Stoiloff, Brian Ostrom
Abstract: The report of the Technical Working Group on Biological Evidence Preservation offers guidance for individuals involved in the collection, examination, tracking, packaging, storing, and disposition of biological evidence. This may include crime sc ...

939. The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints
Topic: Manufacturing
Published: 1/1/1997
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, David E Ward, K Eberhardt, M. Levenson, Marjorie A McClain, B Melvin, Ted Hopp, Y Shen
Abstract: The calculation of task specific measurement uncertainty when using coordinate measuring machines is an important and challenging task. Current methods to address this issue use simulation techniques (e.g., the virtual CMM) where the propagation of k ...

940. The Challenge of Nanometrology
Topic: Manufacturing
Published: 7/1/2002
Author: Michael T Postek
Abstract: The promise and challenge of nanotechnology is immense. The National Nanotechnology Initiative provides an opportunity to develop a new technological base for U.S. Industry. Nanometrology is the basis of the new measurement methods that must be devel ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series