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Topic Area: Manufacturing
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Displaying records 931 to 940 of 1000 records.
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931. Relativistic Covariance and the Interpretation of Quantum Mechanics
Topic: Manufacturing
Published: 1/1/1996
Author: Egon Marx
Abstract: The standard interpretation of quantum mechanics is revised to conform to the relativistic theory based on the many-amplitudes formalism for the N-particle system. The wave function acquires a significance closer to that of the electromagnetic field, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820797

932. Relaxation Effects in Small Critical Nozzles
Topic: Manufacturing
Published: 1/1/2006
Authors: Aaron N Johnson, C L Merkle, Michael R Moldover, John D Wright
Abstract: We computed the flow of four gases (He, N^d2^, CO^d2^, and SF^d^6) through a critical nozzle by augmenting traditional computational fluid dynamics (CFD) with a rate equation that accounts for {tau}^drelax^, a species-dependent relaxation time that c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830846

933. Report from a 2013 ASME Panel on Geometric Interoperability for Advanced Manufacturing
Topic: Manufacturing
Published: 5/19/2014
Authors: Vijay Srinivasan, Vadim Shapiro
Abstract: During the Summer of 2013 in a conference organized by the American Society of Mechanical Engineers (ASME) at Madison, Wisconsin, a panel of academic, industrial, and government researchers engaged in a spirited discussion on the issue of geometric i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914694

934. Report of External Review of NIST NAMT Project on Nanomanufacturing of Atom-Based Dimensional Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6023
Topic: Manufacturing
Published: 1/1/1997
Authors: J Land, Dennis A Swyt
Abstract: This report summarizes a workshop held on August 15, 1996, which provided an opportunity to U.S. industry in distributed and virtual manufacturing technologies to review and provide a critique of the Nanomanufacturing of Atom-Based Dimensional Standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820849

935. Report of Investigation: Reference Material 8090 - SEM Magnification Calibration Reference Material
Topic: Manufacturing
Published: 8/9/1995
Authors: Michael T Postek, R Gettings
Abstract: Reference Material (RM) 8090 is intended primarily for use in calibrating the magnification scale of a scanning electron microscope (SEM) over a wide range of magnifications, from less than 100X to greater than 300,000X. RM 8090 contains structures i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820806

936. Report of Investigation: Reference Material 8091 - Scanning Electron Microscope Sharpness Standard
Topic: Manufacturing
Published: 5/10/2001
Authors: Michael T Postek, Andras Vladar, Robert D. Larrabee
Abstract: Reference Material (RM 8091) is intended primarily for use in checking the sharpness performance of scanning electron microscopes. It is supplied as a small (2 rnrn x 2 rnm) diced semiconductor chip. This sample is capable of being mounted directly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821789

937. Representation of Heterogeneous Material Properties in the Core Product Model
Topic: Manufacturing
Published: 6/1/2006
Authors: Arpan Biswas, Steven J. Fenves, V Shapiro, Ram D Sriram
Abstract: The Core Product Model (CPM) was developed at NIST as a high level abstraction for representing product related information, to support data exchange, in a distributive and a collaborative environment. In this paper, we extend the CPM to components w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822612

938. Representation of functional networks in STEP AP210 with application to SPICE circuit simulation
Series: Grant/Contract Reports (NISTGCR)
Report Number: 11-949
Topic: Manufacturing
Published: 11/11/2011
Author: Jamie Stori
Abstract: STEP AP210 (ISO 10303-210) supports a comprehensive functional network model representation. SPICE (Simulation Program with Integrated Circuit Emphasis) is a general purpose, industry standard, analog electronic circuit simulation. Originally dev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910094

939. Representing Layout Information in the CMSD Specification
Topic: Manufacturing
Published: 8/26/2009
Authors: Frank H Riddick, Yung-Tsun Tina Lee
Abstract: Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem. For many areas of manufacturing, neither representations for the information nor mechanisms for exchanging the in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903460

940. Requirements and Conformance Test Assertions for ANSI/NIST-ITL 1-2011 Record Type 18 - DNA Record
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7933
Topic: Manufacturing
Published: 6/21/2013
Authors: Fernando L Podio, Dylan James Yaga, Christofer Justin McGinnis
Abstract: The Computer Security Division (CSD) of NIST/ITL develops conformance test architectures (CTAs) and test suites (CTSs) to support users that require conformance to selected biometric standards. Product developers as well as testing laboratories c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913465



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