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You searched on: Topic Area: Manufacturing Sorted by: title

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Displaying records 931 to 940 of 1000 records.
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931. Strut Structure and Rigid Joint Therefor
Topic: Manufacturing
Published: 1/1/1996
Author: James Edward Potzick
Abstract: A highly rigid structure is provided using six struts connected at three upper and three lower nodes to upper and lower support structures. The joint assemblies are formed by half- spherical balls attached to the ends of each of the struts, and retai ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820813

932. Studies of Samples Having Shallow Surface Topography by the Low-Loss Electron (LLE) Method in the Scanning Electron Microscope (SEM)
Topic: Manufacturing
Published: 3/1/2002
Authors: O C Wells, M Mcglashen-powell, Michael T Postek, Andras Vladar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821793

933. Study on an Image Stitching Method for Linewidth Measurement
Topic: Manufacturing
Published: 4/1/2004
Authors: Wei Chu, Xuezeng Zhao, Joseph Fu, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822240

934. Stylus Flight in Surface Profiling
Topic: Manufacturing
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: In this paper, theoretical and experimental work on stylus flight is described. Experiments on the surfaces of different roughness specimens with sinusoidal, rectangular, triangular and random waveforms support the theoretical model, which predicts s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820821

935. Stylus Technique for Direct Verification of Rockwell Diamond Indenters
Topic: Manufacturing
Published: 11/23/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: Based on a stylus technique, a microform calibration system was developed at NIST for the direct verification of Rockwell diamond indenters. The least-squares radius and profile deviations, cone angle and cone flank straightness, and the holder axis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820771

936. Stylus-Laser Surface Calibration System
Topic: Manufacturing
Published: 10/1/1996
Authors: Theodore Vincent Vorburger, Jun-Feng Song, T Giauque, Thomas B Renegar, Eric Paul Whitenton, M Croarkin
Abstract: A stylus-laser surface calibration system was developed to calibrate the NIST sinusoidal roughness Standard Reference Materials (SRM) 2071-2075. Step height standards are used to calibrate the stylus instrument in the vertical direction, and a laser ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820830

937. Submicrometer Linewidth Metrology
Series: Technical Note (NIST TN)
Report Number: 958
Topic: Manufacturing
Published: 1/1/2001
Authors: Michael T Postek, Robert D. Larrabee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821788

938. Subnanometer Wavelength Metrology of Lithographically Prepared structures: A Comparison of Neutron and X-Ray Scattering
Topic: Manufacturing
Published: 5/1/2003
Authors: D Casa, R Jones, Theodore Vincent Vorburger, Ndubuisi George Orji, G Barclay, P Bolton, W Wu, E Lin, T Hu
Abstract: The challenges facing current metrologies based on SEM, AFM, and light scatterometry for technology nodes of 157 nm imaging and beyond suggest that the development of new metrologies capable of routine measurement in this regime are required. We prov ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822042

939. Summary Report of NIST/MSC Workshop on Traceability in Length
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6149
Topic: Manufacturing
Published: 4/1/1998
Author: Dennis A Swyt
Abstract: The National Institute of Standards and Technology, in conjunction with the Measurement Science Conference, conducted an industry-needs workshop on February 4, 1998, on issues with U.S. manufacturing companies, particularly smaller ones, may have in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820916

940. Summary Report: Second Workshop in Industrial Applications of Scanned Probe Microscopy
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5752
Topic: Manufacturing
Published: 1/1/1995
Authors: John A Dagata, A Diebold, C Shih, R Colton
Abstract: The Second Workshop on Industrial Applications of Scanned Probe Microscopy (IASPM) was held at the National Institute of Standards and Technology (NIST) Gaithersburg on May 2-3, 1995. The meeting, co-sponsored by NIST, SEMATECH, the American Society ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820731



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