NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing
Sorted by: title

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 931 to 940 of 1000 records.
Resort by: Date / Title


931. Report of External Review of NIST NAMT Project on Nanomanufacturing of Atom-Based Dimensional Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6023
Topic: Manufacturing
Published: 1/1/1997
Authors: J Land, Dennis A Swyt
Abstract: This report summarizes a workshop held on August 15, 1996, which provided an opportunity to U.S. industry in distributed and virtual manufacturing technologies to review and provide a critique of the Nanomanufacturing of Atom-Based Dimensional Standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820849

932. Report of Investigation: Reference Material 8090 - SEM Magnification Calibration Reference Material
Topic: Manufacturing
Published: 8/9/1995
Authors: Michael T Postek, R Gettings
Abstract: Reference Material (RM) 8090 is intended primarily for use in calibrating the magnification scale of a scanning electron microscope (SEM) over a wide range of magnifications, from less than 100X to greater than 300,000X. RM 8090 contains structures i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820806

933. Report of Investigation: Reference Material 8091 - Scanning Electron Microscope Sharpness Standard
Topic: Manufacturing
Published: 5/10/2001
Authors: Michael T Postek, Andras Vladar, Robert D. Larrabee
Abstract: Reference Material (RM 8091) is intended primarily for use in checking the sharpness performance of scanning electron microscopes. It is supplied as a small (2 rnrn x 2 rnm) diced semiconductor chip. This sample is capable of being mounted directly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821789

934. Representation of Heterogeneous Material Properties in the Core Product Model
Topic: Manufacturing
Published: 6/1/2006
Authors: Arpan Biswas, Steven J. Fenves, V Shapiro, Ram D Sriram
Abstract: The Core Product Model (CPM) was developed at NIST as a high level abstraction for representing product related information, to support data exchange, in a distributive and a collaborative environment. In this paper, we extend the CPM to components w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822612

935. Representation of functional networks in STEP AP210 with application to SPICE circuit simulation
Series: Grant/Contract Reports (NISTGCR)
Report Number: 11-949
Topic: Manufacturing
Published: 11/11/2011
Author: Jamie Stori
Abstract: STEP AP210 (ISO 10303-210) supports a comprehensive functional network model representation. SPICE (Simulation Program with Integrated Circuit Emphasis) is a general purpose, industry standard, analog electronic circuit simulation. Originally dev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910094

936. Representing Layout Information in the CMSD Specification
Topic: Manufacturing
Published: 8/26/2009
Authors: Frank H Riddick, Yung-Tsun Tina Lee
Abstract: Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem. For many areas of manufacturing, neither representations for the information nor mechanisms for exchanging the in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903460

937. Requirements and Conformance Test Assertions for ANSI/NIST-ITL 1-2011 Record Type 18 - DNA Record
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7933
Topic: Manufacturing
Published: 6/21/2013
Authors: Fernando L Podio, Dylan James Yaga, Christofer Justin McGinnis
Abstract: The Computer Security Division (CSD) of NIST/ITL develops conformance test architectures (CTAs) and test suites (CTSs) to support users that require conformance to selected biometric standards. Product developers as well as testing laboratories c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913465

938. Results of the NIST National Ball Plate Round Robin
Topic: Manufacturing
Published: 1/1/1997
Authors: Gregory W Caskey, Steven David Phillips, Bruce R. Borchardt
Abstract: This report examines the results of the ball plate round robin administered by NIST. The round robin was part of an effort to assess the current state of industry practices for measurements made using coordinate measuring machines. Measurements of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820994

939. Reverse Noise Measurement and Use in Device Characterization
Topic: Manufacturing
Published: 6/10/2006
Authors: James Paul Randa, Tom McKay, Susan L. Sweeney, David K Walker, Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
Abstract: We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32218

940. Review of Research on the Ground Truth Systems for Evaluating Part Identification Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7926
Topic: Manufacturing
Published: 4/23/2013
Authors: Afzal A Godil, Roger D. Eastman, Tsai Hong Hong
Abstract: In this report we discuss different types of potential ground-truth systems that could be used to test part identification systems for manufacturing assembly applications. We discuss four main ways of acquiring ground truth for evaluating part re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913579



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series