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You searched on: Topic Area: Manufacturing Sorted by: title

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Displaying records 931 to 940 of 1000 records.
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931. Stylus-Laser Surface Calibration System
Topic: Manufacturing
Published: 10/1/1996
Authors: Theodore Vincent Vorburger, Jun-Feng Song, T Giauque, Thomas B Renegar, Eric Paul Whitenton, M Croarkin
Abstract: A stylus-laser surface calibration system was developed to calibrate the NIST sinusoidal roughness Standard Reference Materials (SRM) 2071-2075. Step height standards are used to calibrate the stylus instrument in the vertical direction, and a laser ...

932. Submicrometer Linewidth Metrology
Series: Technical Note (NIST TN)
Report Number: 958
Topic: Manufacturing
Published: 1/1/2001
Authors: Michael T Postek, Robert D. Larrabee

933. Subnanometer Wavelength Metrology of Lithographically Prepared structures: A Comparison of Neutron and X-Ray Scattering
Topic: Manufacturing
Published: 5/1/2003
Authors: D Casa, R Jones, Theodore Vincent Vorburger, Ndubuisi George Orji, G Barclay, P Bolton, W Wu, E Lin, T Hu
Abstract: The challenges facing current metrologies based on SEM, AFM, and light scatterometry for technology nodes of 157 nm imaging and beyond suggest that the development of new metrologies capable of routine measurement in this regime are required. We prov ...

934. Summary Report of NIST/MSC Workshop on Traceability in Length
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6149
Topic: Manufacturing
Published: 4/1/1998
Author: Dennis A Swyt
Abstract: The National Institute of Standards and Technology, in conjunction with the Measurement Science Conference, conducted an industry-needs workshop on February 4, 1998, on issues with U.S. manufacturing companies, particularly smaller ones, may have in ...

935. Summary Report: Second Workshop in Industrial Applications of Scanned Probe Microscopy
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5752
Topic: Manufacturing
Published: 1/1/1995
Authors: John A Dagata, A Diebold, C Shih, R Colton
Abstract: The Second Workshop on Industrial Applications of Scanned Probe Microscopy (IASPM) was held at the National Institute of Standards and Technology (NIST) Gaithersburg on May 2-3, 1995. The meeting, co-sponsored by NIST, SEMATECH, the American Society ...

936. Surface Finish and Sub-Surface Metrology
Topic: Manufacturing
Published: 1/1/2003
Authors: Theodore Vincent Vorburger, Ndubuisi George Orji, Li Piin Sung, T Rodriguez
Abstract: Surface finsih affects the performance of a wide variety of manufactured products ranging from road surfaces and ships to mechanical parts, microelectronics, and optics. Accordingly roughness values can vary over many orders of magnitude. A variety o ...

937. Surface Metrology Algorithm Testing System
Topic: Manufacturing
Published: 1/1/2007
Authors: Son H. Bui, Theodore Vincent Vorburger
Abstract: This paper presents the development of a Web-based surface metrology algorithm testing system. The system includes surface analysis tools and a surface texture specimen database for parameter evaluation and algorithm verification. The system runs fro ...

938. Surface Metrology Software Variability in Two-Dimensional Measurements
Topic: Manufacturing
Published: 1/1/2003
Authors: Ndubuisi George Orji, Theodore Vincent Vorburger, Xiaohong Gu, Jayaraman Raja
Abstract: A range of surface texture measurement instruments is available in the market place. Most of the measurement instruments are microcomputer-based systems that contain their own surface analysis software to evaluate measured roughness profiles. After a ...

939. Surface Metrology of Soft X-ray Optics
Topic: Manufacturing
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, T. McWade, Joseph Fu, Christopher J. Evans, William Tyler Estler, R Parks
Abstract: Abstract not available.

940. Surface Topography Analysis for a Feasibility Assessment of a National Ballistics Imaging Database
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7362
Topic: Manufacturing
Published: 5/1/2007
Authors: Theodore Vincent Vorburger, James H Yen, B Bachrach, Thomas B Renegar, Li Ma, Hyug-Gyo Rhee, Xiaoyu A Zheng, Jun-Feng Song, Charles Dewey Foreman
Abstract: This document reports on a study to determine the feasibility and utility of a national ballistics database of casing and bullet images. The purpose of such a proposed database would be to provide a reference collection of ballistic images against ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series