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Displaying records 931 to 940 of 1000 records.
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931. Refractometry Using a Helium Standard
Topic: Manufacturing
Published: 7/1/2004
Authors: Jack A Stone Jr., Alois Stejskal
Abstract: The refractive index of helium at atmospheric pressure can be calculated from first principles with a very low uncertainty, on the order of 10^-10. Furthermore, the low refractive index of helium puts minimal demands on the pressure and temperature m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822160

932. Refractometry Using a Helium Standard
Topic: Manufacturing
Published: 4/1/2005
Authors: Jack A Stone Jr., Alois Stejskal
Abstract: The refractive index of helium at atmospheric pressure can be calculated from first principles with a very low uncertainty, on the order of 10^-10. Furthermore, the low refractive index of helium puts minimal demands on the pressure and temperature m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824598

933. Regimes of Surface Roughness Measurable with Light Scattering
Topic: Manufacturing
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, Egon Marx, T Lettieri
Abstract: In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821000

934. Relativistic Covariance and the Interpretation of Quantum Mechanics
Topic: Manufacturing
Published: 1/1/1996
Author: Egon Marx
Abstract: The standard interpretation of quantum mechanics is revised to conform to the relativistic theory based on the many-amplitudes formalism for the N-particle system. The wave function acquires a significance closer to that of the electromagnetic field, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820797

935. Relaxation Effects in Small Critical Nozzles
Topic: Manufacturing
Published: 1/1/2006
Authors: Aaron N Johnson, C L Merkle, Michael R Moldover, John D Wright
Abstract: We computed the flow of four gases (He, N^d2^, CO^d2^, and SF^d^6) through a critical nozzle by augmenting traditional computational fluid dynamics (CFD) with a rate equation that accounts for {tau}^drelax^, a species-dependent relaxation time that c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830846

936. Report from a 2013 ASME Panel on Geometric Interoperability for Advanced Manufacturing
Topic: Manufacturing
Published: 5/19/2014
Authors: Vijay Srinivasan, Vadim Shapiro
Abstract: During the Summer of 2013 in a conference organized by the American Society of Mechanical Engineers (ASME) at Madison, Wisconsin, a panel of academic, industrial, and government researchers engaged in a spirited discussion on the issue of geometric i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914694

937. Report of External Review of NIST NAMT Project on Nanomanufacturing of Atom-Based Dimensional Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6023
Topic: Manufacturing
Published: 1/1/1997
Authors: J Land, Dennis A Swyt
Abstract: This report summarizes a workshop held on August 15, 1996, which provided an opportunity to U.S. industry in distributed and virtual manufacturing technologies to review and provide a critique of the Nanomanufacturing of Atom-Based Dimensional Standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820849

938. Report of Investigation: Reference Material 8090 - SEM Magnification Calibration Reference Material
Topic: Manufacturing
Published: 8/9/1995
Authors: Michael T Postek, R Gettings
Abstract: Reference Material (RM) 8090 is intended primarily for use in calibrating the magnification scale of a scanning electron microscope (SEM) over a wide range of magnifications, from less than 100X to greater than 300,000X. RM 8090 contains structures i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820806

939. Report of Investigation: Reference Material 8091 - Scanning Electron Microscope Sharpness Standard
Topic: Manufacturing
Published: 5/10/2001
Authors: Michael T Postek, Andras Vladar, Robert D. Larrabee
Abstract: Reference Material (RM 8091) is intended primarily for use in checking the sharpness performance of scanning electron microscopes. It is supplied as a small (2 rnrn x 2 rnm) diced semiconductor chip. This sample is capable of being mounted directly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821789

940. Representation of Heterogeneous Material Properties in the Core Product Model
Topic: Manufacturing
Published: 6/1/2006
Authors: Arpan Biswas, Steven J. Fenves, V Shapiro, Ram D Sriram
Abstract: The Core Product Model (CPM) was developed at NIST as a high level abstraction for representing product related information, to support data exchange, in a distributive and a collaborative environment. In this paper, we extend the CPM to components w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822612



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