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31. A Detailed Discussion of Lessons Learned in Evaluating Emerging and Advanced Military Technologies
Topic: Manufacturing
Published: 6/3/2011
Authors: Craig I Schlenoff, Brian A Weiss, Michelle Potts Steves
Abstract: For the past six years, personnel from the National Institute of Standards and Technology (NIST) have served as the Independent Evaluation Team (IET) for two major DARPA programs. DARPA ASSIST (Advanced Soldier Sensor Information System and Technolog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907576

32. A Differential Wavelength Meter for Laser Tuning
Topic: Manufacturing
Published: 1/1/1997
Authors: Lowell P. Howard, Jack A Stone Jr
Abstract: A simple interferometer for matching the wavelengths of tunable lasers is described. Our interferometer uses the angular dispersion of a diffraction grating at the Littrow angle to produce a tilted wavefront with respect to a reference mirror in an o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820845

33. A Distribution-Independent Bound on the Level of Confidence in the Result of a Measurement
Topic: Manufacturing
Published: 9/1/1997
Author: William Tyler Estler
Abstract: The Bienaym?-Chebyshev Inequality provides a quantitative bound on the level of confidence of a measurement with known combined standard uncertainty and assumed coverage factor. The result is independent of the detailed nature of the probability dist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820841

34. A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis
Topic: Manufacturing
Published: 10/1/2008
Authors: Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, YaShian Li-Baboud, James Moyne
Abstract: Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33161

35. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Topic: Manufacturing
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

36. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Topic: Manufacturing
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

37. A Fiber Probe for CMM Measurements of Small Features
Topic: Manufacturing
Published: 8/1/2005
Authors: Jack A Stone Jr, Balasubramanian Muralikrishnan, John Richard Stoup
Abstract: We report on performance of a new form of fiber probe, which can be used in conjunction with a coordinate measuring machine (CMM) for microfeature measurement.  The probe stylus is a glass fiber with a small ball (?75 ?m diameter) glued to the e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823194

38. A First Step Toward Photorealistic Rendering of Coated Surfaces and Computer-Based Standards of Appearance
Topic: Manufacturing
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821772

39. A First Step Towards Photorealistic Rendering of Coated Surfaces and Computer Based Standards of Appearance
Topic: Manufacturing
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
Abstract: We seek to explore the feasibility of producing computer graphic images to visualize the color and gloss of surfaces using optical and surface topographical data.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822453

40. A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers
Topic: Manufacturing
Published: 1/1/2006
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Satyandra K. Gupta
Abstract: The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software architecture is needed to run the optical tweezers hardware, provide an effective user inter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823209