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31. A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis
Topic: Manufacturing
Published: 10/1/2008
Authors: Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, YaShian Li-Baboud, James Moyne
Abstract: Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33161

32. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Topic: Manufacturing
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

33. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Topic: Manufacturing
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

34. A Fiber Probe for CMM Measurements of Small Features
Topic: Manufacturing
Published: 8/1/2005
Authors: Jack A Stone Jr., Balasubramanian Muralikrishnan, John Richard Stoup
Abstract: We report on performance of a new form of fiber probe, which can be used in conjunction with a coordinate measuring machine (CMM) for microfeature measurement.  The probe stylus is a glass fiber with a small ball (?75 ?m diameter) glued to the e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823194

35. A First Step Toward Photorealistic Rendering of Coated Surfaces and Computer-Based Standards of Appearance
Topic: Manufacturing
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821772

36. A First Step Towards Photorealistic Rendering of Coated Surfaces and Computer Based Standards of Appearance
Topic: Manufacturing
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
Abstract: We seek to explore the feasibility of producing computer graphic images to visualize the color and gloss of surfaces using optical and surface topographical data.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822453

37. A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers
Topic: Manufacturing
Published: 1/1/2006
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Satyandra K. Gupta
Abstract: The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software architecture is needed to run the optical tweezers hardware, provide an effective user inter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823209

38. A Flexure Balance With Adjustable Restoring Torque for Nanonewton Force Measurement
Topic: Manufacturing
Published: 1/1/2002
Authors: Jon Robert Pratt, David B Newell, John A Kramar
Abstract: The NIST electrostatic force balance compares mechanical probe forces to an SI realization of force derived from measurements of the capacitance gradient and voltage in an electronic null balance. As we approach the nanonewton regime, the finite stif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822422

39. A Frequency Stabilized Laser Array for Use in Displacement Metrology
Topic: Manufacturing
Published: 2/17/2000
Authors: J Pedulla, R Deslattes, John Russell Lawall
Abstract: We have developed a frequency stabilized laser system to supply light to measure atomic-scale displacements of a stage moved in real time. Each laser in the array provides enough power (~1 mW) for four Michelson interferometers whose accuracy require ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822455

40. A General Quantitative Method to Validate Instrument Calibration Techniques
Topic: Manufacturing
Published: 11/1/1999
Author: Steven David Phillips
Abstract: In this paper a method to validate proposed calibration procedures for coordinate measuring machines (CMMs) is presented. Conceptually, the validation procedure is based on a computer generated population of CMMs assumed to include any real CMM that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820940



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