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Topic Area: Manufacturing
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31. A Core Manufacturing Simulation Data Information Model for Manufacturing Applications
Topic: Manufacturing
Published: 8/1/2006
Authors: Swee Kong Leong, Yung-Tsun Tina Lee, Frank H Riddick
Abstract: Simulation technology has been demonstrated to be an effective tool for reducing costs, improving quality, and shortening the time-to-market for manufactured goods in the manufacturing industry. But, there are a number of technical and economic barri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822625

32. A Decade of Commitment from the NIST Manufacturing Engineering Laboratory to Nanomanufacturing and Nanometrology
Topic: Manufacturing
Published: 8/27/2009
Authors: Kevin W Lyons, Michael T Postek
Abstract: Advanced research in nanomanufacturing technologies and processes has continued at an accelerating rate over the past decade. Profitable niche applications such as the use of carbon nanotubes for improving battery performance and nanoparticle-enhance ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902648

33. A Detailed Discussion of Lessons Learned in Evaluating Emerging and Advanced Military Technologies
Topic: Manufacturing
Published: 6/3/2011
Authors: Craig I Schlenoff, Brian A Weiss, Michelle Potts Steves
Abstract: For the past six years, personnel from the National Institute of Standards and Technology (NIST) have served as the Independent Evaluation Team (IET) for two major DARPA programs. DARPA ASSIST (Advanced Soldier Sensor Information System and Technolog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907576

34. A Detailed Failure Analysis Examination of the Effect of Thermal Cycling on Cu TSV Reliability
Topic: Manufacturing
Published: 1/1/2014
Authors: Chukwudi Azubuike Okoro, June Waiyin Lau, Yaw S Obeng, Klaus Hummler
Abstract: In this work, a detailed failure analysis of the physical root cause for the increase in electrical resistance and radio-frequency (RF) transmission coefficient of through-silicon via (TSV) daisy chain was investigated. Six different failure modes we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913115

35. A Differential Wavelength Meter for Laser Tuning
Topic: Manufacturing
Published: 1/1/1997
Authors: Lowell P. Howard, Jack A Stone Jr
Abstract: A simple interferometer for matching the wavelengths of tunable lasers is described. Our interferometer uses the angular dispersion of a diffraction grating at the Littrow angle to produce a tilted wavefront with respect to a reference mirror in an o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820845

36. A Distribution-Independent Bound on the Level of Confidence in the Result of a Measurement
Topic: Manufacturing
Published: 9/1/1997
Author: William Tyler Estler
Abstract: The Bienaym?-Chebyshev Inequality provides a quantitative bound on the level of confidence of a measurement with known combined standard uncertainty and assumed coverage factor. The result is independent of the detailed nature of the probability dist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820841

37. A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis
Topic: Manufacturing
Published: 10/1/2008
Authors: Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, YaShian Li-Baboud, James Moyne
Abstract: Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33161

38. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Topic: Manufacturing
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

39. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Topic: Manufacturing
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

40. A Fiber Probe for CMM Measurements of Small Features
Topic: Manufacturing
Published: 8/1/2005
Authors: Jack A Stone Jr, Balasubramanian Muralikrishnan, John Richard Stoup
Abstract: We report on performance of a new form of fiber probe, which can be used in conjunction with a coordinate measuring machine (CMM) for microfeature measurement.  The probe stylus is a glass fiber with a small ball (?75 ?m diameter) glued to the e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823194



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