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Topic Area: Manufacturing
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Displaying records 961 to 970 of 1000 records.
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961. Performing Measurement of Surface Structures With the Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 2/1/1998
Author: R Koning
Abstract: The use of the atomic force microscope (AFM) to characterize surface structures for industrial applications is rapidly increasing. To compare the results obtained by different instruments and to achieve high accuracy, the scales of an AFM must be cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820897

962. Metal-based Room-temperature Operating Single Electron Devices Using Scanning Probe Oxidation
Topic: Manufacturing
Published: 1/30/1998
Authors: K Matsumoto, Y Gotoh, T Maeda, John A. Dagata, J S Harris
Abstract: Coulomb oscillation was clearly observed at room temperature in the single electron transistor fabricated by atomic force microscopy (AFM) nano-oxidation process. In order to obtain a clear Coulomb oscillation at room temperature, new and improved fa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821784

963. Advances in NIST Standard Rockwell Diamond Indenters
Topic: Manufacturing
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, Theodore Vincent Vorburger
Abstract: Recent developments in standard hardness machines and microform calibration techniques have made it possible to establish a worldwide unified Rockwell hardness scale with metrological traceability. This includes the establishments of the reference st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820911

964. An Integrated Approach to Optimal Three Dimensional Layout and Routing
Topic: Manufacturing
Published: 1/1/1998
Authors: Simon Szykman, J Cagan, P Weisser
Abstract: This paper describes the combination of previously-developed component placement and routing algorithms into an integrated computational approach to product layout optimization. Previous work introduced simulated annealing-based algorithms for opt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821540

965. Characterization of Surface Topography
Topic: Manufacturing
Published: 1/1/1998
Authors: Theodore Vincent Vorburger, John A. Dagata, G. Wilkening, K Iizuka
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901983

966. Combining Interactive Exploration and Optimization for Assembly Design
Topic: Manufacturing
Published: 1/1/1998
Authors: Simon Szykman, Gerard Kim
Abstract: This paper presents an integrated framework for assembly design. The framework will allow the designer to represent knowledge about the design process and constraints as well as information about the artifact being designed, design history and ration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821542

967. Electronic Properties of GaAs Surfaces Etched in an Electron Cyclotron Resonance Source and Chemically Passivated Using P2S5
Topic: Manufacturing
Published: 1/1/1998
Authors: O Glembocki, J Tuchman, John A. Dagata, K Ko, S Pang, C Stutz
Abstract: Photoreflectance has been used to study the electronic properties of (100) GaAs surfaces exposed to a Cl2/Ar plasma generated by an electron cyclotron resonance source and subsequently passivated by P2S5. The plasma etch shifts the Fermi level of p-G ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821782

968. Experiences in Initiating Baldridge-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823104

969. Experiences in Initiating Baldrige-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820915

970. Extinction Coefficients for Dielectric and Conducting Doublets of Spheres
Topic: Manufacturing
Published: 1/1/1998
Author: Egon Marx
Abstract: The extinction cross-sections of doublets of polystyrene and carbon spheres are determined using the optical theorem. The forward scattering amplitude is computed using the single integral equation method. The extinction cross-sections of the doublet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820900



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