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961. New NIST-Certified Small Scale Pitch Standard
Topic: Manufacturing
Published: 1/1/1997
Author: James Edward Potzick
Abstract: The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 ?m to 10 mm, intended for the calibration of microscope magnification and dimensional metrology instrument scales. While NIST has long ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820869

962. On Chip Morphology, Tool Wear and Cutting Mechanics in Finish Hard Turning
Topic: Manufacturing
Published: 1/1/1997
Authors: Matthew A. Davies, Y K Chou, Christopher J. Evans
Abstract: Topography of surfaces produced in finish hard turning using cubic boron nitride (CBN) tools is affected by a large number of factors including tool wear and the mechanics of the chip formation process. This paper shows first that tool wear rates are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820786

963. On the Dynamics of Chip Formation in Machining Hard Metals
Topic: Manufacturing
Published: 1/1/1997
Authors: Matthew A. Davies, Timothy J Burns, Christopher J. Evans
Abstract: The results of orthogonal cutting tests on electroplated Nickel-Phosphorus (15% phosphorus) and AISI 52100 bearing steel are presented and compared. For both materials, chips become segmented at relatively low cutting speeds (0.3 m/s to 2 m/s) due to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820837

964. Photogrammetric Reconstruction of Petroglyphs
Topic: Manufacturing
Published: 1/1/1997
Author: Russell A. Kirsch
Abstract: Viewing rock art is a complex experience, just as is viewing any ohter art form. This experience may include knowledge of the site location, its time of creation, co-occurence with other rock art, stylistic correspondences (Kirsch 1996), and many ot ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821700

965. Pitch and Step Height Measurements Using NIST
Topic: Manufacturing
Published: 1/1/1997
Authors: R Koning, Ronald G Dixson, Joseph Fu, V W. Tsai, Theodore Vincent Vorburger, Edwin Ross Williams, X Wang
Abstract: The use of the atomic force microscope (AFM) for step height and pitch measurements in industrial applications is rapidly increasing. To compare the results obtained by different instruments and to achieve high accuracy, the scales of an AFM must be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820847

966. Report of External Review of NIST NAMT Project on Nanomanufacturing of Atom-Based Dimensional Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6023
Topic: Manufacturing
Published: 1/1/1997
Authors: J Land, Dennis A Swyt
Abstract: This report summarizes a workshop held on August 15, 1996, which provided an opportunity to U.S. industry in distributed and virtual manufacturing technologies to review and provide a critique of the Nanomanufacturing of Atom-Based Dimensional Standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820849

967. Results of the NIST National Ball Plate Round Robin
Topic: Manufacturing
Published: 1/1/1997
Authors: Gregory W Caskey, Steven David Phillips, Bruce R. Borchardt
Abstract: This report examines the results of the ball plate round robin administered by NIST. The round robin was part of an effort to assess the current state of industry practices for measurements made using coordinate measuring machines. Measurements of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820994

968. The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints
Topic: Manufacturing
Published: 1/1/1997
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, David E Ward, K Eberhardt, M. Levenson, Marjorie A McClain, B Melvin, Ted Hopp, Y Shen
Abstract: The calculation of task specific measurement uncertainty when using coordinate measuring machines is an important and challenging task. Current methods to address this issue use simulation techniques (e.g., the virtual CMM) where the propagation of k ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820857

969. The Guidelines for Expressing Measurement Uncertainties and the 4:1 Test Uncertainty Ratio
Topic: Manufacturing
Published: 1/1/1997
Author: Jun-Feng Song
Abstract: In 1988, MIL-STD-45662A adopted the 4:1 Test Uncertainty Ratio (TUR); this was later incorporated into the ANSI/NCSL Z540-1 standard in 1994. However, in 1992, the National Institute of Standards and Technology (NIST) began to adopt a new method for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820875

970. The Scanning Electron Microscope
Topic: Manufacturing
Published: 1/1/1997
Author: Michael T Postek
Abstract: The scanning electron microscope (SEM) is an important research and production tool extensively used in many phases of industry throughout the world. The popularity of the instrument results from the need to inspect and obtain information about sampl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820862