NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 981 to 990 of 1000 records.
Resort by: Date / Title


981. Experiences in Initiating Baldridge-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823104

982. Experiences in Initiating Baldrige-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820915

983. Extinction Coefficients for Dielectric and Conducting Doublets of Spheres
Topic: Manufacturing
Published: 1/1/1998
Author: Egon Marx
Abstract: The extinction cross-sections of doublets of polystyrene and carbon spheres are determined using the optical theorem. The forward scattering amplitude is computed using the single integral equation method. The extinction cross-sections of the doublet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820900

984. Image Sharpness Measurement in Scanning Electron Microscopy - Part I
Topic: Manufacturing
Published: 1/1/1998
Authors: Michael T Postek, Andras Vladar
Abstract: This study introduces the idea of the sharpness concept in relationship to the determination of scanning electron microscope (SEM) perfomance. Scanning electron microscopes are routinely used in many manufacturing environments. Fully automated or sem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820906

985. Improving Step Height and Pitch Measurements Using the Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1998
Authors: R Koning, Ronald G Dixson, Joseph Fu, V W. Tsai, Theodore Vincent Vorburger
Abstract: The most important industrial application of Atomic Force Microscopy (AFM) is probably the accurate measurement of geometrical dimensions of small surface structures. In order to maintain the instrument''s performance and to achieve the high accuracy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820898

986. Learning to Set Up Numerical Optimizations of Engineering Designs
Topic: Manufacturing
Published: 1/1/1998
Authors: Mark Schwabacher, T Ellman, H Hirsh
Abstract: Gradient-based numerical optimization of complex engineering designs offers the promise of rapidly producing better designs. However, such methods generally assume that the objective function and constraint functions are continuous, smooth, and defin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822344

987. Measurement Traceability of NIST Standard Rockwell Diamond Indenters
Topic: Manufacturing
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, Walter S Liggett Jr, David J Pitchure, Theodore Vincent Vorburger
Abstract: A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and dimensional metrology with acceptably small measurement uncertainties. In 1994, NIST develope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823113

988. Measurements of Pitch, Height, and Width Artifacts with the NIST Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1998
Authors: Ronald G Dixson, V W. Tsai, Theodore Vincent Vorburger, Edwin Ross Williams, X Wang, Joseph Fu, R Koning
Abstract: The presence of the atomic force microscope (AFM) in the industrial metrology setting is rapidly increasing. Properties commonly measured in such applications are: feature spacing (pitch), feature height (or depth), feature width (critical dimension) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820838

989. NIST Microform Calibration - How It Benefits U.S. Industry
Topic: Manufacturing
Published: 1/1/1998
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: In microform metrology, complex 3-D surface features in the micrometer range must be quantified for their space and size including dimensions, curves, angles, profile deviations, and alignment errors, as well as surface roughness with measure uncerta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820912

990. Performing Measurements of Surface Structures With the Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1998
Authors: R Koning, Ronald G Dixson, Joseph Fu, V W. Tsai, Theodore Vincent Vorburger
Abstract: The use of the atomic force microscope (AFM) to characterize surface structures for industrial applications is rapidly increasing.  To compare the results obtained by different instruments and to achieve high accuracy, the scales of an AFM must ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823087



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series