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Displaying records 931 to 940 of 1000 records.
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931. Scanned Probe Microscope Tip Characterization Without Calibrated Tip Characterizers
Topic: Manufacturing
Published: 3/1/1996
Author: John S Villarrubia
Abstract: In scanned probe microscopy the image is a combination of information from the sample and the tip. In order to reconstruct the true surface geometry, it is necessary to know the actual tip shape. It has been proposed that this shape may be reconstruc ...

932. Test Optics Error Removal
Topic: Manufacturing
Published: 3/1/1996
Authors: Christopher J. Evans, R Kestner
Abstract: Wave-front or surface errors may be divided into rotationally symmetric and nonrotationally symmetric terms. It is shown that if either the test part or the reference surface in an interferometric test is rotated to N equally spaced positions about t ...

933. Chemical Aspects of Tool Wear in Single Point Diamond Turning
Topic: Manufacturing
Published: 1/1/1996
Authors: E W Paul, Christopher J. Evans, A Mangamelli, Michael L McGlauflin, Robert S. Polvani
Abstract: A hypothesis is proposed that ascribes chemical wear of diamond tools to the presence of unpaired d electrons in the sample being machined. This hypothesis is used to explain a range of results for metals, alloys, and other materials including electr ...

934. Digital Imaging for Scanning Electron Microscopy
Topic: Manufacturing
Published: 1/1/1996
Authors: Michael T Postek, Andras Vladar
Abstract: The development and application of digital imaging technology has been one of the major advancements in scanning electron microscopy (SEM) during the past several years. This digital revolution has been brought about by significant progress in semico ...

935. Dynamic Measurement of Shear Band Formation in Precision Hard-Turning
Topic: Manufacturing
Published: 1/1/1996
Authors: Matthew A. Davies, Steven Earl Fick, Christopher J. Evans
Abstract: Abstract not available.

936. Fabry-Perot Interferometers for Small Displacement Measurements
Topic: Manufacturing
Published: 1/1/1996
Authors: Lowell P. Howard, Fredric Scire, Jack A Stone Jr.
Abstract: A description of a Fabry-Perot interferometer for measuring small displacements is given. The instruments consists of a fiber-optic-coupled actuator and mirror guiding mechanisms, a tunable diode laser for tracking the changes in cavity length and a ...

937. Height Calibration of Atomic Force Microscopes Using Silicon Atomic Step Artifacts
Topic: Manufacturing
Published: 1/1/1996
Authors: V W. Tsai, Theodore Vincent Vorburger, P Sullivan, Ronald G Dixson, Richard M Silver, Edwin Ross Williams, J Schneir
Abstract: The decreasing feature dimensions required in the semiconductor manufacturing industry are placing ever increasing demands upon metrology instruments. Atomic force microscopes (AFMs), which can have ~1 nm lateral resolution and sub-angstrom vertical ...

938. Integral Equation for Scattering by a Rough Surface
Topic: Manufacturing
Published: 1/1/1996
Author: Egon Marx
Abstract: An equation for an unknown surface field that represents scattering by a rough patch on a flat dielectric surface is presented. The geometrical considerations for this particular problem are discussed, especially in relation to a surface divergence f ...

939. Laser Trackers: Traceability, Uncertainty and Standardization - A Report to the CMSC
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6061
Topic: Manufacturing
Published: 1/1/1996
Author: Gregory W Caskey
Abstract: During the 1996 CMSC conference, undoubtedly one of the hottest topics was how to achieve traceability for the laser tracker. This paper reviews the concepts of traceability and measurement uncertainty from NIST''s perspective, and explain ho ...

940. New NIST-Certified Length Microscale
Topic: Manufacturing
Published: 1/1/1996
Author: James Edward Potzick
Abstract: The National Institute of Standards and Technology is developing a simple one-dimension certified pitch standard (or scale) covering the range 1 um to 10 mm, intended for the calibration of microscope magnification and dimensional metrology instrumen ...

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