NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 921 to 930 of 1000 records.
Resort by: Date / Title


921. Optical Linewidth Models: Then and Now
Topic: Manufacturing
Published: 6/1/1999
Authors: Robert D. Larrabee, Richard M Silver, M P Davidson
Abstract: In the late 1970's, Dr. Diana Nyyssonen demonstrated that NIST could optically calibrate photomask linewidth standards that were narrower than the classical resolution limit of a conventional bright-field microscope. She equated the known position of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820934

922. Telepresence:  A New Paradigm for Industrial and Scientific Collaboration
Topic: Manufacturing
Published: 6/1/1999
Authors: Michael T Postek, Marylyn H. Bennett, N J Zaluzec
Abstract: A portion of the mission of the National Institute of Standards and Technology (NIST) Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. industry.  The successful development of a Collaboratory f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823114

923. Telepresence: A New Paradigm for Industrial and Scientific Collaboration
Topic: Manufacturing
Published: 6/1/1999
Authors: Michael T Postek, Marylyn H. Bennett, N J Zaluzec
Abstract: The successful development of a collaboratory for Telepresence Microscopy (TPM) provides an important new tool to promote technology transfer in the areas of measurement technology. NIST and Texas Instruments (TI), under the auspices of the National ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820945

924. Toward Nanometer Accuracy Measurements
Topic: Manufacturing
Published: 6/1/1999
Authors: John A Kramar, E Amatucci, David E. Gilsinn, Jay Shi Jun, William B. Penzes, Fredric Scire, E Clayton Teague, John S Villarrubia
Abstract: We at NIST are building a metrology instrument called the Molecular Measuring Machine (MMM) with the goal of performing 2D point-to-point measurements with one nanometer accuracy cover a 50 mm by 50 mm area. The instrument combines a scanning tunneli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820933

925. Two-Dimensional Calibration Artifact and Measurement Methodology
Topic: Manufacturing
Published: 6/1/1999
Authors: Richard M Silver, Theodore D Doiron, William B. Penzes, S Fox, Edward A Kornegay, S Rathjen, M Takac, D Owen
Abstract: In this paper, we describe our design and the manufacturing of a two-dimensional grid artifact of chrome on quartz on a 6 inch by 6 inch by .250 glass blank. The design has been agreed upon by a number of SEMI participants working on a two-dimensiona ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820948

926. High Accuracy High Speed Gaussian Filter in Surface Metrology
Topic: Manufacturing
Published: 5/31/1999
Authors: Y B Yuan, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Both (1+x^2)^(-n) and (sin x/x)^n functions are very close to the Gaussian distribution for large value of n. Based on these functions, two new algorithms are developed for designing high accuracy and high speed recursive type Gaussian digital filter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820955

927. Measurements and Predictions of Light Scattering by Coatings
Topic: Manufacturing
Published: 5/1/1999
Authors: Theodore Vincent Vorburger, Egon Marx, M E. McKnight, Maria E Nadal, P Y. Barnes, Alan K Thompson, Michael A Galler, Fern Y Hunt, Mark R VanLandingham
Abstract: We show comparisons between calculations and measurements of angle-resolved light scattering distributions from clear dielectric, isotropic coatings. The calculated distributions are derived from topography measurements performed with scanning white ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822523

928. The NIST Length Scale Interferometer
Topic: Manufacturing
Published: 5/1/1999
Authors: John S Beers, William B. Penzes
Abstract: The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820924

929. Improving Kinematic Touch Trigger Probe Performance
Topic: Manufacturing
Published: 4/1/1999
Authors: Steven David Phillips, William Tyler Estler
Abstract: Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class of probes.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820943

930. Noise Averaging and Measurement Resolution (or A Little Noise is a Good Thing)
Topic: Manufacturing
Published: 4/1/1999
Author: James Edward Potzick
Abstract: When a continuous quantity is measured with a digital instrument or digitized for further processing, a measurement uncertainty component is incurred from quantization of the continuous variable. This uncertainty can be reduced by oversampling and a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823107



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series