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61. Development of a Methodology to Determine Risk of Counterfeit Use
Topic: Manufacturing
Published: 6/5/2013
Authors: Mark Schaffer, Yaw S Obeng
Abstract: Counterfeit components have become a multi-million dollar, yet undesirable, part of the electronics industry. The profitability of the counterfeit industry rests in large part on its ability to recognize supply constraints and quickly respond, effect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914105

62. Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals
Topic: Manufacturing
Published: 6/1/2013
Authors: Chukwudi Azubuike Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S Obeng
Abstract: In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV da ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912850

63. Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
Topic: Manufacturing
Published: 5/28/2013
Authors: Chukwudi Azubuike Okoro, Yaw S Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
Abstract: In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913332

64. Proposed ,NIST Ballistics Identification System (NBIS)Š Based on 3D Topography Measurements on Correlation Cells
Topic: Manufacturing
Published: 5/17/2013
Author: Jun-Feng Song
Abstract: The invented ,NIST Ballistics Identification System (NBIS)Š using three-dimensional (3D) topography measurements on correlation cells can promote high accuracy and fast ballistics identifications [1]. The use of paired correlation cells can identify ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910868

65. Guide to Industrial Control Systems (ICS) Security
Report Number: 800-82r1
Topic: Manufacturing
Published: 5/14/2013
Authors: Keith A Stouffer, Joseph A Falco, Karen Ann Scarfone
Abstract: This document provides guidance on how to secure Industrial Control Systems (ICS), including Supervisory Control and Data Acquisition (SCADA) systems, Distributed Control Systems (DCS), and other control system configurations such as Programmable ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913905

66. Writing Guidelines to Develop an Memorandum of Understanding for Interoperable Automated Fingerprint Identification Systems
Series: Special Publication (NIST SP)
Report Number: 1156
Topic: Manufacturing
Published: 5/14/2013
Authors: Susan M Ballou, Michael D Garris, Anthony Clay, Joi Dickerson, Peter T Higgins, Lisa Jackson, Joe Morrissey, Beth Owens, Joe Polski, Janet Hoin, Leo Norton, Melissa K Taylor
Abstract: This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913325

67. CMSD - A Manufacturing Simulation Integration Standard: Overview and Case Studies
Topic: Manufacturing
Published: 5/10/2013
Authors: Yung-Tsun Tina Lee, Frank H Riddick, Bjorn J. Johansson
Abstract: Standard representations for information entities common to manufacturing simulation could help reduce the costs associated with simulation model construction and data exchange between simulation and other manufacturing applications. This would make ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908209

68. Standardized Performance Testing Metrics for Optical Coordinate Measurement Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7883
Topic: Manufacturing
Published: 5/9/2013
Author: Steven David Phillips
Abstract: Optical probing technology on coordinate measuring machines (CMMs) operates significantly differently from discrete point probing associated with tactile probing CMMs hence manufacturers of this technology seek to use different testing artifacts for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912341

69. Development of Standard Test Methods for Unmanned and Manned Industrial Vehicles Used Near Humans
Topic: Manufacturing
Published: 5/3/2013
Authors: Roger V Bostelman, Richard J Norcross, Joseph A Falco, Jeremy A Marvel
Abstract: The National Institute of Standards and Technology (NIST) has been researching human-robot/vehicle collaborative environments for automated guided vehicles (AGVs) and manned forklifts. Safety of AGVs and manned vehicles with automated functions (e.g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913625

70. Writing Guidelines for Requests for Proposals for Automated Fingerprint Identification Systems
Series: Special Publication (NIST SP)
Report Number: 1155
Topic: Manufacturing
Published: 4/25/2013
Authors: Susan M Ballou, Michael D Garris, Anthony Clay, Joi Dickerson, Peter T Higgins, Janet Hoin, Lisa Jackson, Mike Lesko, Joe Morrissey, Leo Norton, Beth Owens, Joe Polski, Melissa K Taylor
Abstract: This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913324



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