NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 31 to 40 of 1000 records.
Resort by: Date / Title


31. A Simulated Sensor-based Approach for Kit Building Applications
Topic: Manufacturing
Published: 12/20/2013
Authors: Zeid Kootbally, Craig I Schlenoff, Theodore J Weisman, Stephen B. Balakirsky, Thomas Rollin Kramer, Anthony Pietromartire
Abstract: Kit building or kitting is a process in which individually separate but related items are grouped, packaged, and supplied together as one unit (kit). This paper describes advances in developing sensing/control and parts detection technologies enablin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914962

32. Back-End-of-Line Test Structure Design and Simulation for Subsurface Metrology with Scanning Probe Microscopy
Topic: Manufacturing
Published: 12/13/2013
Authors: Lin You, Emily Hitz, Jungjoon Ahn, Yaw S Obeng, Joseph J Kopanski
Abstract: As demands in the semiconductor industry call for further miniaturization and performance enhancement of electronic systems, the traditional planar (2D) electronic interconnection and packaging technologies show their difficulties in meeting the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915013

33. Additive Manufacturing Technical Workshop Summary Report
Series: Technical Note (NIST TN)
Report Number: 1823
Topic: Manufacturing
Published: 12/4/2013
Authors: Christopher U Brown, Joshua Lubell, Robert R Lipman
Abstract: This report summarizes the presentations, discussions, and recommendations from the Additive Manufacturing Technical Workshop held during the PDES, Inc. offsite meeting in Gaithersburg, Maryland in March of 2013. The purpose of the workshop was to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914642

34. Componentization in the Systems Modeling Language
Topic: Manufacturing
Published: 11/20/2013
Author: Conrad E Bock
Abstract: This paper describes new capabilities in the Systems Modeling Language that reduce the complexity of specifying systems through componentization, and increase the range of systems that can be specified. Modelers can identify portions of component ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911921

35. Toward the Ideal of Automating Production Optimization
Topic: Manufacturing
Published: 11/15/2013
Authors: John L Michaloski, Frederick M Proctor, Jorge Arinez, Jonatan Berglund
Abstract: The advent of improved factory data collection offers a prime opportunity to continuously study and optimize factory operations. Although manufacturing optimization tools can be considered mainstream technology, most U.S. manufacturers do not take fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914707

36. Proposed E57.02 Range Measurement Performance Standard for Medium Range 3D Imaging Systems
Topic: Manufacturing
Published: 11/11/2013
Authors: David MacKinnon, Luc Cournoyer, Kamel Shawki Saidi, Geraldine S Cheok, Robert Bridges, Darin Ingimarson
Abstract: We present the proposed standard ASTM E57.02 "Test Method to Evaluate the Range Measurement Performance of 3D Imaging Systems in the Medium Range" (Work Item ASTM WK12373). The stated purpose of the standard is to provide metrics and procedures to e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914811

37. Dielectrophoretic Trapping of P19 Cells on Indium Tin Oxide based Microelectrode Arrays
Topic: Manufacturing
Published: 11/8/2013
Authors: Aveek Gangopadhyay, Saugandhika Minnikanti, Darwin R Reyes-Hernandez, Mulpuri V. Rao, Nathalia Peixoto
Abstract: A microfabricated device comprised of a microelectrode array (MEA) and a microfluidic channel is presented here for the purpose of trapping cells using positive dielectrophoresis (DEP). Transparent indium tin oxide (ITO) electrodes are patterned in a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914569

38. Nanomanufacturing Concerns about Measurements made in the SEM II: Specimen Contamination
Topic: Manufacturing
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The improvements that have been made have significantly improved the overall SEM per ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914028

39. Nanomanufacturing concerns about Measurements made in the SEM I: Imaging and its Measurement
Topic: Manufacturing
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The high resolution of the SEM is especially useful for qualitative and quantitative applications for both nanotechnology and nanomanufacturing. But, should users be concerned about the imaging and measurements made with this instrument? Perhaps one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914029

40. Multi-Walled Carbon Nanotube Layer-by-Layer Coatings With a Novel Trilayer Structure to Reduce Foam Flammability
Topic: Manufacturing
Published: 10/29/2013
Authors: Rick D. Davis, Yeon Seok Kim, Amanda A Cain, Jaime C. Grunlan
Abstract: The research presented here is the first report of fabricating multi-walled carbon nanotube (MWCNT) based thin coatings on polyurethane foam (PUF) using Layer-by-Layer assembly, and using MWCNTs to reduce the flammability of PUF. The (440.6 ± 47.1) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907032



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series