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You searched on: Topic Area: Manufacturing

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Displaying records 91 to 100 of 1000 records.
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91. Preface to the Edited Book "Performance Evaluation and Benchmarking of Intelligent Systems"
Topic: Manufacturing
Published: 12/31/2013
Authors: Rajmohan Madhavan, Elena R Messina, Edward Tunstel
Abstract: To design and develop capable, dependable, and affordable intelligent systems, their performance must be measurable. Scientific methodologies for standardization and benchmarking are crucial for quantitatively evaluating the performance of emerging r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902748

92. Uncertainty of temperature measurements by infrared thermography for metal cutting applications
Topic: Manufacturing
Published: 12/31/2013
Authors: Brandon M Lane, Eric Paul Whitenton, Viswanathan Madhavan, M Alkan Donmez
Abstract: This paper presents the methodology and results of a comprehensive measurement uncertainty analysis for infrared thermography of a cutting tool during the metal cutting process. The analysis is based on a commercial off-the-shelf (COTS) camera, ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913632

93. Forensic Analysis Methodology for Thermal and Chemical Characterization of Homemade Explosives
Topic: Manufacturing
Published: 11/24/2013
Authors: Ashot Nazarian, Cary Presser
Abstract: Forensic identification of homemade explosives is critical for determining the origin of the explosive materials and precursors, and formulation procedures. Normally, the forensic examination of the pre- and post-blast physical evidence lacks specif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913871

94. Componentization in the Systems Modeling Language
Topic: Manufacturing
Published: 11/20/2013
Author: Conrad E Bock
Abstract: This paper describes new capabilities in the Systems Modeling Language that reduce the complexity of specifying systems through componentization, and increase the range of systems that can be specified. Modelers can identify portions of component ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911921

95. Toward the Ideal of Automating Production Optimization
Topic: Manufacturing
Published: 11/15/2013
Authors: John L Michaloski, Frederick M Proctor, Jorge Arinez, Jonatan Berglund
Abstract: The advent of improved factory data collection offers a prime opportunity to continuously study and optimize factory operations. Although manufacturing optimization tools can be considered mainstream technology, most U.S. manufacturers do not take fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914707

96. Proposed E57.02 Range Measurement Performance Standard for Medium Range 3D Imaging Systems
Topic: Manufacturing
Published: 11/11/2013
Authors: David MacKinnon, Luc Cournoyer, Kamel S Saidi, Geraldine S Cheok, Robert Bridges, Darin Ingimarson
Abstract: We present the proposed standard ASTM E57.02 "Test Method to Evaluate the Range Measurement Performance of 3D Imaging Systems in the Medium Range" (Work Item ASTM WK12373). The stated purpose of the standard is to provide metrics and procedures to e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914811

97. Dielectrophoretic Trapping of P19 Cells on Indium Tin Oxide based Microelectrode Arrays
Topic: Manufacturing
Published: 11/8/2013
Authors: Aveek Gangopadhyay, Saugandhika Minnikanti, Darwin R Reyes-Hernandez, Mulpuri V. Rao, Nathalia Peixoto
Abstract: A microfabricated device comprised of a microelectrode array (MEA) and a microfluidic channel is presented here for the purpose of trapping cells using positive dielectrophoresis (DEP). Transparent indium tin oxide (ITO) electrodes are patterned in a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914569

98. Nanomanufacturing Concerns about Measurements made in the SEM II: Specimen Contamination
Topic: Manufacturing
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The improvements that have been made have significantly improved the overall SEM per ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914028

99. Nanomanufacturing concerns about Measurements made in the SEM I: Imaging and its Measurement
Topic: Manufacturing
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The high resolution of the SEM is especially useful for qualitative and quantitative applications for both nanotechnology and nanomanufacturing. But, should users be concerned about the imaging and measurements made with this instrument? Perhaps one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914029

100. Multi-Walled Carbon Nanotube Layer-by-Layer Coatings With a Novel Trilayer Structure to Reduce Foam Flammability
Topic: Manufacturing
Published: 10/29/2013
Authors: Rick D Davis, Yeon Seok Kim, Amanda A Cain, Jaime C. Grunlan
Abstract: The research presented here is the first report of fabricating multi-walled carbon nanotube (MWCNT) based thin coatings on polyurethane foam (PUF) using Layer-by-Layer assembly, and using MWCNTs to reduce the flammability of PUF. The (440.6 ± 47.1) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907032



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