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Topic Area: Information Technology
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821. Starting and Operating a Microcomputer Support Center
Series: Special Publication (NIST SP)
Report Number: 500-128
Topic: Information Technology
Published: 10/1/1985
Authors: T Landberg, Stanley Winkler

822. State Occupancy Information for Performance Comparisons
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4418
Topic: Information Technology
Published: 10/1/1990
Author: Gordon E Lyon

823. State of Security Readiness
Topic: Information Technology
Published: 6/10/2010
Authors: Ramaswamy Chandramouli, Peter M Mell
Abstract: Cloud computing is a model for enabling convenient, on-demand network access to a shared pool of configurable computing resources that can be rapidly provisioned and released with minimal management effort or service provider interaction. However, th ...

824. Static Analyzers in Software Engineering
Topic: Information Technology
Published: 3/2/2009
Author: Paul E Black
Abstract: Static analyzers can report possible problems in code and help reinforce good practices of developers. We contrast the strengths of static analyzers with testing and indicate the current state of the art.

825. Statistical Analysis of Information Content for Training Pattern Recognition Networks
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5149
Topic: Information Technology
Published: 3/1/1993
Author: Charles L. Wilson

826. Statistical Testing of Random Number Generators
Topic: Information Technology
Published: 10/19/1999
Author: D L. Banks
Abstract: Random Number Generators (RNGs) are an important building block for algorithms and protocols in cryptography. They are paramount in the construction of encryption keys and other cryptographic algorithm parameters. In practice, statistical testing i ...

827. Status of PDES-Related Activities (Standards & Testing)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4432
Topic: Information Technology
Published: 10/1/1990
Authors: Cita Marie Furlani, J Wellington, S Kemmerer

828. Structure and Properties of Small Molecule-Polymer Blend Semiconductors for Organic Thin Film Transistors
Topic: Information Technology
Published: 6/4/2008
Authors: Vivek M Prabhu, Jihoon Kang, Nayool Shin, Do Y. Yoon, Do Young Jang
Abstract: A comprehensive structural and electrical characterization of solution-processed blend films of 6,13-bis(triisopropylsilylethynyl)pentacene (TIPS-pentacene) and poly(alpha-methylstyrene) (PaMS) was performed to understand and optimize the blend semic ...

829. Structured Testing: A Testing Methodology Using the Cyclomatic Complexity Metric
Series: Special Publication (NIST SP)
Report Number: 500-235
Topic: Information Technology
Published: 8/1/1996
Authors: D Wallace, A H Watson, T J Mccabe

830. Study of Accuracy of Parts Produced Using Additive Manufacturing
Topic: Information Technology
Published: 4/16/2014
Authors: Marcin Bauza, Shawn P Moylan, Robert Panas, Stephen Burke, Harry Martz, John S Taylor, Paul Alexander, Richard Knebel
Abstract: The purpose of this presentation is to focus discussion onto the issue of accuracy and uncertainty of parts made with additive manufacturing processes.

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Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series