NIST logo

Publications Portal

You searched on:
Topic Area: Surface Physics

Displaying records 81 to 90 of 139 records.
Resort by: Date / Title


81. Many-body Effects in Photoemission
Topic: Surface Physics
Published: 1/1/1978
Author: John William Gadzuk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620160

82. Polarization of electrons emitted from ferromagnets, Transition Metals, 1977
Topic: Surface Physics
Published: 1/1/1978
Authors: H Siegmann, M Campagna, W Eib, David R. Penn, R E Watson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620170

83. Polarized LEED Using a GaAs Spin Polarized Electron Source
Topic: Surface Physics
Published: 1/1/1978
Authors: W Unertl, Robert Celotta, Daniel Thornton Pierce
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620158

84. Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy
Topic: Surface Physics
Published: 1/1/1978
Author: Cedric John Powell
Abstract: Measurements have been made of the relative intensities of the principal features in X-ray photoelectron spectra of indium, lead, and aluminum oxide and compared with those expected from a simple model for the photoemission process. Systematic effect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620152

85. Surface Characterization: Present Status and the Need for Standards
Topic: Surface Physics
Published: 1/1/1978
Author: Cedric John Powell
Abstract: A summary is given of the present status and use of surface-characterization measurements in the United States. Attention is primarily devoted to those properties needed to characterize a solid surface, specifically the determination of surface compo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620151

86. The Physica B&Cl Basis for Quantitative Surface Analysis by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Topic: Surface Physics
Published: 1/1/1978
Author: Cedric John Powell
Abstract: A review is given of the physical basis for quantitative surface analysis by Auger electron spectroscopy (AES) and by X-ray photoelectron spectroscopy (XPS) or electron spectroscopy for chemical analysis (ESCA). The principal topics discussed are: ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620154

87. Surface Relaxation Energies in Core Level Spectroscopies of Adsorbed Atoms and Molecules
Topic: Surface Physics
Published: 10/1/1977
Author: John William Gadzuk
Abstract: Core level holes which are created in electron emission spectroscopies of atoms and molecules adsorbed or condensed onto metal surfaces induce a screening charge at the surface. The Coulomb interaction between the induced and the hole charge, called ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620143

88. Relative Yields of KLL and LVV Auger Electrons from Aluminum
Topic: Surface Physics
Published: 9/1/1977
Author: Cedric John Powell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620149

89. Surface Studies Using Spin Polarized Electrons
Topic: Surface Physics
Published: 9/1/1977
Authors: Daniel Thornton Pierce, Robert Celotta, W Unertl
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620148

90. X-Ray Photoemission Spectra from Adsorbed Layers on Metal Substrates
Topic: Surface Physics
Published: 9/1/1977
Author: John William Gadzuk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620147



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series