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Topic Area: Environment/Climate
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Displaying records 51 to 60 of 445 records.
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51. Application of physical and chemical characterization techniques to metallic powders
Topic: Environment/Climate
Published: 8/28/2013
Authors: Edward Joseph Garboczi, John A Slotwinski, Max A Peltz, Chiara F Ferraris, Stephanie S Watson, Paul E Stutzman
Abstract: Systematic studies have been done on two different powder materials used for additive manufacturing: stainless steel and cobalt-chrome. The characterization of these powders is important in NIST efforts to develop appropriate measurements and standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914555

52. Assessment of Guidelines for Conducting Round Robin Studies in Additive Manufacturing
Topic: Environment/Climate
Published: 4/16/2014
Authors: Shawn P Moylan, John A Slotwinski
Abstract: The uniqueness of AM makes it necessary to develop specific guidance on conducting round robin studies. The existing standards on round robin studies for measurement methods provide an excellent starting point for guidance on conducting AM round rob ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915720

53. Assessment of Machining Models: Progress Report
Topic: Environment/Climate
Published: 1/1/2000
Authors: Robert W Ivester, Michael Kennedy, Matthew A. Davies, R Stevenson, J Thiele, R Furness, S M Athavale
Abstract: Machining involves extremely localized and nonlinear physical phenomena that occur over a wide range of temperatures, pressures, and strains. This has hindered progress in predictive modeling of machining processes. Many different types of models ran ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821915

54. Associations between Organochlorine Contaminant Concentrations and Clinical Health Parameters in Loggerhead Sea Turtles from North Carolina, USA
Topic: Environment/Climate
Published: 7/1/2004
Authors: Jennifer M Keller, John R Kucklick, M.A. Stamper, Craig A. Harms, P.D. McClellan-Green
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902464

55. Bioassay-Directed Fractionation and Chemical Characterization of One Organic Extract of Indoor Air Fine Particles from Xuan Wei, China with High Lung Cancer Mortality Rate
Topic: Environment/Climate
Published: 5/1/1992
Authors: J. C. Chuang, Stephen A Wise, S. Cao, J. L. Mumford
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902478

56. Biological Specimen Banking in Arctic Research: An Alaska Perspective
Topic: Environment/Climate
Published: 11/1/1993
Authors: Paul R Becker, B. J. Koster, Stephen A Wise, Rolf Louis Zeisler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902489

57. Biometrics in a Networked World
Topic: Environment/Climate
Published: 12/2/2012
Author: Kevin C Mangold
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911889

58. Blubber Development in Bottlenose Dolphins (Tursiops truncatus)
Topic: Environment/Climate
Published: 10/1/2003
Authors: W D J Struntz, W A McLellan, R M Dillaman, J E Blum, John R Kucklick, D A Pabst
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903404

59. Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
Topic: Environment/Climate
Published: 4/1/2000
Authors: Michael Kennedy, Matthew A. Davies, Howard W Yoon, Timothy J Burns
Abstract: A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821922

60. Calibrated thermal microscopy of the tool-chp interface in machining
Topic: Environment/Climate
Published: 1/1/2003
Authors: Matthew A. Davies, Howard W Yoon, Tony L Schmitz, Timothy J Burns, Michael Kennedy
Abstract: This paper presents the results of calibrated, microscopic measurement of the temperature fields at the tool-chip interface during the steady-state, orthogonal machining of AISI 1045 steel. The measurement system consists of a nearly diffraction lim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821886



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