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Topic Area: Environment/Climate
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Displaying records 431 to 440 of 444 records.
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431. Ultrasonic Detection of Unstable Plastic Flow in Hard Metal Cutting
Topic: Environment/Climate
Published: 1/1/1998
Authors: Matthew A. Davies, Gerald V. Blessing, Christopher J. Evans, Steven Earl Fick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820062

432. Uncertainty of temperature measurements by infrared thermography for metal cutting applications
Topic: Environment/Climate
Published: 12/31/2013
Authors: Brandon M Lane, Eric Paul Whitenton, Viswanathan Madhavan, M Alkan Donmez
Abstract: This paper presents the methodology and results of a comprehensive measurement uncertainty analysis for infrared thermography of a cutting tool during the metal cutting process. The analysis is based on a commercial off-the-shelf (COTS) camera, ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913632

433. Update on DMIS Certification
Topic: Environment/Climate
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903180

434. Updating a Turning Center Error Model by Singular Value Decomposition
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: IR 7489
Topic: Environment/Climate
Published: 3/1/2001
Authors: David E. Gilsinn, Herbert T Bandy, Alice V. Ling
Abstract: The precision of manufacturing using machine tools depends on the accuracy of the relative position of the cutting tool with respect to the workpiece. Kinematic modeling of machine tools is used to describe this relative position. This motion can be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821906

435. VCI Simulation with Semiconductor Device Models: Test Report
Topic: Environment/Climate
Published: 2/29/2012
Author: John S Villarrubia
Abstract: JMONSEL, an electron beam imaging simulator, has been modified to permit conducting regions of a sample to be designated as unconnected to an external source or sink of charge (floating) or, alternatively, to be connected with a user-specified relaxa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910799

436. Variability in the Geometric Accuracy of Additively Manufactured Test Parts
Topic: Environment/Climate
Published: 8/9/2010
Authors: April Lynne Cooke, Johannes A Soons
Abstract: Results of a study on the variability in the geometric accuracy of a metal test part manufactured by several service providers using either electron beam or laser based powder bed thermal fusion processes are described. The part was a circle-diamond- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906639

437. Very high laser-damage threshold of polymer-derived Si(B)CN-carbon nanotube composite coatings
Topic: Environment/Climate
Published: 3/19/2013
Authors: Romil Bhandavat, Ari D Feldman, Christopher L Cromer, John H Lehman, Gurpreet Singh
Abstract: We study the laser irradiance behavior and resulting structural evolution of polymer-derived silicon −boron−carbonitride (Si(B)CN) functionalized multiwall carbon nanotube (MWCNT) composite spray coatings on copper substrate. We report ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911376

438. Visualization of Grit Interaction During the Ductile to Brittle Polishing Transition
Topic: Environment/Climate
Published: 5/1/2001
Authors: Richard B. Mindek, Christopher J. Evans, Eric Paul Whitenton
Abstract: Dual strobe and single strobe once per revolution imaging techniques are employed on the Rapidly Renewable Lap (RRL) to study the ductile to brittle transition observed during the polishing of silicon and calcium flouride. Analysis of video images d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821877

439. WS-Biometric Devices
Topic: Environment/Climate
Published: 12/17/2013
Authors: Kevin C Mangold, Ross J Micheals
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914479

440. WSQ Problem with Two-Thumb Captures from Large Platen Live-Scan Devices
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7746
Topic: Environment/Climate
Published: 11/18/2010
Author: Craig I Watson
Abstract: This paper investigates an issue with the Wavelet Scalar Quantization (WSQ) compression algorithm which causes severe degradation of the compressed image. The problem was first noticed when compressing the two-thumb images from live-scan identificati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907341



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