NIST logo

Publications Portal

You searched on: Topic Area: Environment/Climate Sorted by: title

Displaying records 371 to 380 of 453 records.
Resort by: Date / Title

371. Service Life Prediction for Sealants
Topic: Environment/Climate
Published: 9/29/2011
Authors: Christopher C White, Donald Lee Hunston, Kar T. Tan, James J Filliben
Abstract: Previous industry consensus postulated that four elements of the weather: Temperature, Humidity, Ultraviolet Radiation, and Mechanical loading were responsible for the majority of the changes observed in sealants exposed to outdoor weathering. The N ...

372. Shape Discrimination in Liquid Chromatography Using Charge Transfer Phases
Topic: Environment/Climate
Published: 11/1/1991
Authors: Lane C Sander, Reenie May Parris, Stephen A Wise, P. Garrigues

373. Shape Selectivity for Constrained Solutes in Reversed-Phase Liquid Chromatography
Topic: Environment/Climate
Published: 11/1/1999
Authors: Lane C Sander, M. Pursch, Stephen A Wise

374. Size Effect for Specific Energy in Grinding of Silicon Nitride
Topic: Environment/Climate
Published: 4/1/1999
Authors: T W. Hwang, Christopher J. Evans, S Malkin
Abstract: An investigation is reported of the ?size effect? for specific energy in grinding of silicon nitride. Experimental measurements over a wide range of operating parameters using two different grit size diamond wheels show an increase in specific energy ...

375. Smart Machining Systems: Robust Optimization and Adaptive Control Optimization for Turning Operations
Topic: Environment/Climate
Published: 5/22/2007
Authors: Robert W Ivester, Jarred C. Heigel
Abstract: A critical aspect of smart machining systems is the appropriate management of knowledge and information to support effective decision-making. Uncertainty associated with model-based predictions of machining performance plays an important role in deci ...

376. Spatially resolved height response of phase-shifting interferometers measured using a patterned mirror with varying spatial frequency
Topic: Environment/Climate
Published: 9/1/2010
Authors: JiYoung Chu, Quandou Wang, John Lehan, Ulf Griesmann
Abstract: In the performance evaluation of phase-shifting interferometers for figure metrology, the height response, or height transfer function, is rarely taken into consideration, because in most applications smooth surfaces are measured and only the lowest ...

377. Specimen Banking at the National Institute of Standards and Technology
Topic: Environment/Climate
Published: 6/1/1992
Authors: Rolf Louis Zeisler, B. J. Koster, Stephen A Wise

378. Spectrofluorometric Determination of Polycyclic Aromatic Hydrocarbons in Aqueous Effluents from Generator Columns
Topic: Environment/Climate
Published: 12/1/1983
Authors: R.A. Velapoldi, P.A. White, Willie E May, K Eberhardt

379. Spectroscopy and imaging of edge modes in Permalloy nanodisks
Topic: Environment/Climate
Published: 1/3/2013
Authors: Feng Guo, Lyubov Belova, Robert D McMichael
Abstract: This paper reports spectroscopy and imaging of spin wave modes using ferromagnetic resonance force microscopy (FMRFM) in Permalloy nano-disks with disk diameters that range from 100 nm to 750 nm. The ferromagnetic resonance spectra distinguish multip ...

380. Stability Analysis of 2-DOF End-Milling for a Range of Radial Immersions
Topic: Environment/Climate
Published: 1/1/2002
Authors: P V Bayly, Tony L Schmitz, D A Peters, B P Mann
Abstract: Low radial immersion end-milling involves intermittent cutting. If the tool is flexible, its motion in both the x- and y-directions affects the chip load and cutting forces, leading to chatter instability under certain conditions. Interrupted cutti ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series