NIST logo

Publications Portal

You searched on:
Topic Area: Environment/Climate

Displaying records 71 to 80 of 444 records.
Resort by: Date / Title


71. Interlaboratory Analytical Comparison Study to Support Deepwater Horizon Natural Resource Damage Assessment: Description and Results for Marine Sediment QA10SED01
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7792
Topic: Environment/Climate
Published: 11/2/2011
Authors: Michele M Schantz, John Kucklick
Abstract: To support natural resource damage assessment (NRDA) in response to the Deep Water Horizon (DWH) oil spill in the Gulf of Mexico, a large number of coastal sediment and tissue samples (i.e., oysters) have been collected to define baseline environme ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907886

72. Strategies for Nanoscale Contour Metrology using Critical Dimension Atomic Force Microscopy
Topic: Environment/Climate
Published: 9/30/2011
Authors: Ndubuisi George Orji, Ronald G Dixson, Andras Vladar, Michael T Postek
Abstract: Contour metrology is one of the techniques used to verify optical proximity correction (OPC) in lithography models. The use of these methods, which are known as resolution enhancement techniques (RET), are necessitated by the continued decrease in f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909559

73. Service Life Prediction for Sealants
Topic: Environment/Climate
Published: 9/29/2011
Authors: Christopher C White, Donald Lee Hunston, Kar Tean Tan, James J Filliben
Abstract: Previous industry consensus postulated that four elements of the weather: Temperature, Humidity, Ultraviolet Radiation, and Mechanical loading were responsible for the majority of the changes observed in sealants exposed to outdoor weathering. The N ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908778

74. Linking Degree of Filler Dispersion to Photodegradation Rate in a NanoTiO2-Latex Coating: An Accelerated Weathering Study
Topic: Environment/Climate
Published: 9/4/2011
Authors: Li Piin Sung, Yongyan Pang, Stephanie S Watson
Abstract: The objective of this study is to investigate the influence of the filler dispersion of nano-TiO2 in polymeric coatings on the surface morphology evolution of the coatings under UV exposure. Two types of nano-TiO2 with different surface treatments we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908287

75. Process Intermittent Measurement for Powder-Bed Based Additive Manufacturing
Topic: Environment/Climate
Published: 8/31/2011
Authors: April Lynne Cooke, Shawn P Moylan
Abstract: Process intermittent measurements of parts fabricated by additive manufacturing (AM) can enable both in-process improvement and characterization of parts' internal geometries. The planar, layer-upon-layer nature of most AM processes allows simple two ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909381

76. Perpendicular ferromagnetic resonance measurements of damping and Landé g-factor in sputtered (Co^d2^Mn)^d1-x^Ge^dx^ thin films
Topic: Environment/Climate
Published: 8/8/2011
Authors: Thomas J Silva, Hans T. Nembach, Justin M Shaw, Michael Schneider, Matt Carey, Stefan Maat, Jeff Childress
Abstract: X-ray diffraction (XRD), magnetometry, and ferromagnetic resonance (FMR) measurements were performed on sputtered thin films of the nominal Heusler alloy (Co^d2^Mn)^d1-x^Ge^dx^ with varying Ge content and annealing temperature. XRD indicates some deg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906314

77. A Bayesian Statistical Model for Hybrid Metrology to Improve Measurement Accuracy
Topic: Environment/Climate
Published: 7/31/2011
Authors: Richard M Silver, Nien F Zhang, Bryan M Barnes, Jing Qin, Hui Zhou, Ronald G Dixson
Abstract: We present a method to combine measurements from different techniques that reduces uncertainties and can improve measurement throughput. The approach directly integrates the measurement analysis of multiple techniques that can include different conf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908377

78. Large-Area Overhead Manipulator for Access of Fields
Topic: Environment/Climate
Published: 7/22/2011
Authors: Jeffrey W White, Roger V Bostelman
Abstract: Multi-axis, cable-driven manipulators have evolved over many years providing large area suspended platform access, programmability, relatively rigid and flexibly- positioned platform control and full six degree of freedom (DOF) manipulation of sensor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905268

79. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Environment/Climate
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

80. Development of a multifilament PIT V3Ga conductor for fusion applications
Topic: Environment/Climate
Published: 6/12/2011
Authors: Najib Cheggour, Theodore C Stauffer, Loren Frederick Goodrich, L. R. Motowidlo, J Distin, P. J. Lee, David C. Larbalestier, A. K. Ghosh
Abstract: Previous studies on V3Ga assert its suitability for use in proposed fusion reactors. V3Ga may outperform Nb3Sn in a fusion reactor environment based on its relatively flat critical-current profile in the 15 T- 20 T range, resilience to applied strain ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907009



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series