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You searched on: Topic Area: Environment/Climate

Displaying records 51 to 60 of 223 records.
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51. Propensity of Nanoparticles to Release from Residential Soft Furnishings
Topic: Environment/Climate
Published: 6/21/2010
Authors: Rick D Davis, Yeon Seok Kim, Marc R. Nyden, Richard H. Harris Jr.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904598

52. Microstructural Evolution of Pd-doped Nanoscale Zero-valent Iron (nZVI) Particles in Aqueous Media and Implications for Particle Reactivity
Topic: Environment/Climate
Published: 5/6/2010
Authors: Andrew A Herzing, Weile Yan, Christopher J. Kiely, Wei-xian Zhang
Abstract: Palladized zero-valent iron nanoparticles have been frequently employed to achieve enhanced treatment of halogenated organic compounds. However no detailed study has been published on their structures, especially the distribution of palladium within ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904152

53. Metrology of Molecular Devices made by Flip Chip Lamination
Topic: Environment/Climate
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904896

54. The Limits and Extensibility of Optical Patterned Defect Inspection
Topic: Environment/Climate
Published: 4/1/2010
Authors: Richard M Silver, Bryan M Barnes, Martin Y Sohn, Richard Quintanilha, Hui H. Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
Abstract: New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905318

55. Organic Electronics: Challenges and Opportunities
Topic: Environment/Climate
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

56. Little Things Mean a Lot: Water and the Adhesive Bond
Topic: Environment/Climate
Published: 2/21/2010
Authors: Donald Lee Hunston, Kar T. Tan, Bryan D. Vogt, Sushil K. Satija, Cyril Clerici, David E. White
Abstract: The ability of water to dramatically weaken many types of adhesive bonds has been widely studied. One surprising result is the existence of a critical moisture level in the bond. Above this level the strength drops to very low values. Numerous stu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904887

57. Integrating Omic Technologies into Aquatic Ecological Risk Assessment and Environmental Monitoring: Hurdles, Achievements and Future Outlook
Topic: Environment/Climate
Published: 1/1/2010
Authors: Daniel W Bearden, Kevin Chipman, Mark Viant, Gerald Ankley, Nancy Denslow
Abstract: Background: In this commentary we present the findings from an international consortium on fish toxicogenomics sponsored by the UK Natural Environment Research Council (NERC) with a remit of moving omic technologies into chemical risk assessment an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903503

58. Interoperability and the DMIS experience
Topic: Environment/Climate
Published: 10/30/2009
Author: John A Horst
Abstract: Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903532

59. Reduce Costs and Increase Quality with Information Exchange Standards for Manufacturing Quality
Topic: Environment/Climate
Published: 9/4/2009
Author: John A Horst
Abstract: With the proliferation of computers to process, store, and transfer information, manufacturers are suffering increasing costs due to information incompatibilities. The information incompatibility problem in manufacturing quality is costly to everyo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903668

60. Measurement Challenges to Innovation in the Biosciences: Critical Roles for NIST
Series: OTHER
Report Number: 903034
Topic: Environment/Climate
Published: 6/1/2009
Authors: Willie E May, Michael D. Amos, Joan Pellegrino
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902138



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