NIST logo

Publications Portal

You searched on: Topic Area: Environment/Climate

Displaying records 51 to 60 of 229 records.
Resort by: Date / Title

51. Directed 2D-to-3D pattern transfer method for controlled fabrication of topologically complex three- dimensional nanostructures in silicon
Topic: Environment/Climate
Published: 2/1/2011
Authors: Konrad Rykaczewski, Owen J. Hildreth, Ching P. Wong, Andrei G. Fedorov, John Henry j Scott
Abstract: A process allowing for control over the 3D motion of catalyst nanostructures during Metal-assisted Chemical Etching by their local pinning prior to etching is developed. Topologically complex 3D structures that are partially located within the et ...

52. A Mathematical Model of Atmospheric Retention of Man-made CO_2 Emissions
Topic: Environment/Climate
Published: 12/21/2010
Author: Bert W Rust
Abstract: Rust and Thijsse [Proc. CSC'07 (2007) pp. 10-16], [CiSE, Vol. 10 (2008) pp. 49-59] have shown that global annual average temperature anomalies T(t) vary linearly with atmospheric CO_2 concentrations c(t). The c(t) can be related to man-made CO_2 emi ...

53. Thermochemistry of Ammonium Nitrate, NH4NO3, in the Gas Phase
Topic: Environment/Climate
Published: 10/7/2010
Author: Karl K Irikura
Abstract: Hildenbrand and coworkers have shown recently that the vapor above solid ammonium nitrate includes molecules of NH4NO3, not only NH3 and HNO3 as previously believed. Their measurements led to thermochemical values that imply an enthalpy change of D2 ...

54. Variability in the Geometric Accuracy of Additively Manufactured Test Parts
Topic: Environment/Climate
Published: 8/9/2010
Authors: April Lynne Cooke, Johannes A Soons
Abstract: Results of a study on the variability in the geometric accuracy of a metal test part manufactured by several service providers using either electron beam or laser based powder bed thermal fusion processes are described. The part was a circle-diamond- ...

55. Metrology of Microstructured Waveguides for Spintronic Applications
Topic: Environment/Climate
Published: 7/30/2010
Authors: SangHyun Lim, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Thomas M Wallis
Abstract: Patterned permallay films as a part of a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures was investigated as fundamental building blocks for magnetic spintronic devices. Anisotropic magneto-resistance (AMR ...

56. SEABIRD TISSUE ARCHIVAL AND MONITORING PROJECT: Project Overview, and Updated Protocols for Collecting and Banking Seabird Eggs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7678
Topic: Environment/Climate
Published: 7/29/2010
Authors: Lauren B. Rust, Rebecca S Pugh, Amanda J Moors, Stacy S Vander-Pol, David G Roseneau, Paul R. (Paul) Becker
Abstract: The Seabird Tissue and Archival Monitoring Project (STAMP) is a collaborative effort by the U.S. Fish and Wildlife Service (USFWS), the Alaska Maritime National Wildlife Refuge (AMNWR), and the National Institute of Standards and Technology (NIST) to ...

57. Propensity of Nanoparticles to Release from Residential Soft Furnishings
Topic: Environment/Climate
Published: 6/21/2010
Authors: Rick D Davis, Yeon Seok Kim, Marc R. Nyden, Richard H. Harris Jr.

58. Microstructural Evolution of Pd-doped Nanoscale Zero-valent Iron (nZVI) Particles in Aqueous Media and Implications for Particle Reactivity
Topic: Environment/Climate
Published: 5/6/2010
Authors: Andrew A Herzing, Weile Yan, Christopher J. Kiely, Wei-xian Zhang
Abstract: Palladized zero-valent iron nanoparticles have been frequently employed to achieve enhanced treatment of halogenated organic compounds. However no detailed study has been published on their structures, especially the distribution of palladium within ...

59. Metrology of Molecular Devices made by Flip Chip Lamination
Topic: Environment/Climate
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...

60. The Limits and Extensibility of Optical Patterned Defect Inspection
Topic: Environment/Climate
Published: 4/1/2010
Authors: Richard M Silver, Bryan M Barnes, Martin Y Sohn, Richard Quintanilha, Hui Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
Abstract: New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this app ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series