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Topic Area: Environment/Climate

Displaying records 91 to 100 of 420 records.
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91. Integrating Omic Technologies into Aquatic Ecological Risk Assessment and Environmental Monitoring: Hurdles, Achievements and Future Outlook
Topic: Environment/Climate
Published: 1/1/2010
Authors: Daniel W Bearden, Kevin Chipman, Mark Viant, Gerald Ankley, Nancy Denslow
Abstract: Background: In this commentary we present the findings from an international consortium on fish toxicogenomics sponsored by the UK Natural Environment Research Council (NERC) with a remit of moving omic technologies into chemical risk assessment an ...

92. Interoperability and the DMIS experience
Topic: Environment/Climate
Published: 10/30/2009
Author: John A Horst
Abstract: Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and su ...

93. The Dimensional Markup Language Specification for Inspection Results Data
Topic: Environment/Climate
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results file ...

94. Update on DMIS Certification
Topic: Environment/Climate
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. Th ...

95. Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment
Topic: Environment/Climate
Published: 9/25/2009
Authors: Ndubuisi George Orji, Ronald G Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
Abstract: A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimen ...

96. Reduce Costs and Increase Quality with Information Exchange Standards for Manufacturing Quality
Topic: Environment/Climate
Published: 9/4/2009
Author: John A Horst
Abstract: With the proliferation of computers to process, store, and transfer information, manufacturers are suffering increasing costs due to information incompatibilities. The information incompatibility problem in manufacturing quality is costly to everyo ...

97. Magneto-resistance based first order reversal curve analysis of magnetic tunnel junctions
Topic: Environment/Climate
Published: 7/13/2009
Authors: Joshua M Pomeroy, John Read, Theodore White, Holger Grube, Joseph E. Davies
Abstract: First order reversal curve (FORC) analysis is successfully applied to magnetic tunnel junctions (MTJs) by using the junction magneto-resistance (MR) instead of the magnetization field (M). FORC analysis is conventionally applied to magnetization vs. ...

98. Atmospheric Retention of Man-made CO^d2^ Emissions
Topic: Environment/Climate
Published: 6/8/2009
Author: Bert W Rust
Abstract: Rust and Thijsse have shown that global annual average temperature anomalies T(t^di^) vary linearly with atmospheric CO^d2^ concentrations c(t^di^). The c(t^di^) can be related to man-made CO^d2^ emissions F(t^di^) by a linear regression model whose ...

99. MINEX II Performance of Fingerprint Match-on-Card Algorithms - Phase II/III Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7477 R 1
Topic: Environment/Climate
Published: 6/5/2009
Authors: Patrick J Grother, Wayne J Salamon
Abstract: The MINEX II trial was conducted to evaluate the accuracy and speed of Match-on-Card verification algorithms. These run on ISO/IEC 7816 smart cards. They compare conformant reference and verification instances of the ISO/IEC 19794-2 COMPACT CARD fing ...

100. Characterization of Uncertainties When Measuring Metal Cutting Temperatures Using Infrared Radiation Thermography
Topic: Environment/Climate
Published: 6/1/2009
Author: Eric Paul Whitenton
Abstract: There are many error sources when using infrared radiation thermography to measure the temperature distribution of the tool, workpiece, and chip during metal cutting. It is important to understand how these error sources affect the measurement uncer ...

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