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Topic Area: Environment/Climate
Date range: to 12/01/2007

Displaying records 11 to 20 of 306 records.
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11. An approach for Optimization of Machining Parameters Under Uncertainties Using Intervals and Evolutionary Algorithms
Topic: Environment/Climate
Published: 5/1/2007
Authors: Jean-Louis Vigouroux, Laurent Deshayes, Sebti Foufou, Lawrence A Welsch
Abstract: Uncertainty analysis with intervals is an alternative to stochastic optimization for machining optimization problems with uncertainties. This paper presents a study of the coupling interval analysis and evolutionary algorithms for solving optimizati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822646

12. Development of a House Dust Standard Reference Material for the Determination of Organic Contaminants
Topic: Environment/Climate
Published: 4/15/2007
Authors: Dianne L Poster, John R Kucklick, Michele M Schantz, Stacy S Vander Pol, Stefan D Leigh, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902824

13. Determination of Polybrominated Diphenyl Ethers (PBDEs) in Environmental Standard Reference Materials
Topic: Environment/Climate
Published: 4/1/2007
Authors: H M. Stapleton, Jennifer M Keller, Michele M Schantz, John R Kucklick, Stefan D Leigh, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902827

14. Development and Application of an Ultratrace Method for the Speciation of Organotin Compounds in Natural Cryogenic Homogenized Biological Materials
Topic: Environment/Climate
Published: 4/1/2007
Authors: David Point, William C Davis, Steven J Christopher, Michael B. Ellisor, Rebecca S. (Rebecca) Pugh, Olivier F. X. Donard, Paul R Becker, Barbara J. Porter, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902826

15. A Novel Peak Detection Algorithm for Use in the Study of Machining Chip Segmentation
Report Number: 824628
Topic: Environment/Climate
Published: 3/1/2007
Author: Eric Paul Whitenton
Abstract: The study of how metal is deformed (how it flows) as parts are machined yields important insights into the metal cutting process. Recent improvements in both high-speed digital imaging and image processing software promise to improve our understandin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824628

16. Marine Environmental Specimen Bank: Clean Room and Specimen Bank Protocols
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7389
Topic: Environment/Climate
Published: 1/1/2007
Authors: Rebecca S. (Rebecca) Pugh, Michael B. Ellisor, Amanda J Moors, Barbara J. Porter, Paul R Becker
Abstract: The National Biomonitoring Specimen Bank (NBSB) was established in 1979 from the pilot Environmental Specimen Bank Program and is maintained at the National Institute of Standards and Technology. Numerous research projects and programs have been dev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832165

17. New Developments in Standard Reference Materials (SRMs) for Environmental Forensics
Topic: Environment/Climate
Published: 1/1/2007
Authors: Dianne L Poster, John R Kucklick, Michele M Schantz, Barbara J. Porter, Lane C Sander, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902870

18. Advances in Analytical Techniques for Environmental Analysis
Topic: Environment/Climate
Published: 10/1/2006
Authors: Stephen A Wise, D. Barcelo, P. Garrigues, R. Turle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902820

19. Analysis of Polycyclic Aromatic Hydrocarbons (PAHs) in Environmental Samples: A Critical Review of Gas Chromatographic (GC) Methods
Topic: Environment/Climate
Published: 10/1/2006
Authors: Dianne L Poster, Michele M Schantz, Lane C Sander, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902823

20. Standard Reference Materials (SRMs) for Determination of Organic Contaminants in Environmental Samples
Topic: Environment/Climate
Published: 10/1/2006
Authors: Stephen A Wise, Dianne L Poster, John R Kucklick, Jennifer M Keller, Stacy S Vander Pol, Lane C Sander, Michele M Schantz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902819



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