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171. Volatile Data Stream (VDS) for the Smart Manufacturing Systems (SMS) Test Bed using MTConnect
Thomas D Hedberg, Moneer M Helu, Allison Barnard Feeney, Mark E Luce
Data is collected from the Manufacturing Lab using the MTConnect standard. That data is aggregated and published internally and externally of NIST via web services. Three channels of data dissemination are available or becoming available from the SMS ...
172. X-Ray Scattering Study on the Damage in Fibers Used in Soft Body Armor After Folding
Haruki Kobayashi, Walter G McDonough, Joy P Dunkers, Scott A Wight, Hae-Jeong Lee, Jae Hyun Kim, Amanda Lattam Forster, Kirk D Rice, Gale Antrus Holmes