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Displaying records 11 to 20 of 68 records.
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11. Spectral homogenization techniques for the hyperspectral image projector
Topic: Optics
Published: 5/15/2015
Authors: Joseph Paul Rice, Logan E. Hillberry
Abstract: In an effort to improve technology for performance testing and calibration of multispectral and hyperspectral imagers, the National Institute of Standards and Technology (NIST) has been developing a Hyperspectral Image Projector (HIP) capable of proj ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918476

12. Quantitative scheme for full-field polarization rotating fluorescence microscopy (PROM) using a liquid crystal variable retarder
Topic: Optics
Published: 5/14/2015
Authors: John F. Lesoine, Ji Y. Lee, Hyeong G. Kang, Matthew Lawrence Clarke, Robert C. Chang, Ralph Nossal, Jeeseong Hwang
Abstract: We introduce real-time, full-field, polarization rotating fluorescence microscopy (PROM) to monitor the absorption dipole orientations of fluorescent molecules. A quarter-wave plate, in combination with a liquid crystal variable retarder (LCVR ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908548

13. On-Fiber Plasmonic Interferometer for Multi-Parameter Sensing
Topic: Optics
Published: 4/20/2015
Authors: Zhijian Zhang, Yongyao Chen, Haijun H. Liu, Hyungdae Bae, Douglas A Olson, Miao Yu
Abstract: We demonstrate a novel miniature multi-parameter sensing device based on a plasmonic interferometer fabricated on a fiber facet in the optical communication wavelength range. This device enables the coupling between surface plasmon resonance and plas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917457

14. Dimensional Metrology of Lab on a Chip Internal Structures: a Comparison of Optical Coherence Tomography with Coherence Fluorescence Microscopy
Topic: Optics
Published: 4/8/2015
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: The characterization of internal structures in a polymeric device, specifically of a final product, will require a different set of metrology techniques than those traditionally use in the characterization of microelectronic devices. OCT is relati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912533

15. Measurement of the optical properties of solid biomedical phantoms at the National Institute of Standards and Technology
Topic: Optics
Published: 3/6/2015
Authors: Paul Lemaillet, David W Allen, Jeeseong Hwang
Abstract: Solid phantoms that serve as a proxy for human tissue and provide a convenient test subject for optical medical imaging devices. In order to determine quantitative performance of a given system, the absolute optical properties of the subject mus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917965

16. SCATMECH: Polarized Light Scattering C++ Class Library and the Modeled Integrated Scattering Tool (MIST)
Topic: Optics
Published: 1/15/2015
Author: Thomas Avery Germer
Abstract: SCATMECH is an object-oriented C++ class library developed to distribute models for light scattering applications. Included in the library are models for diffuse surface scattering that predict the bidirectional reflectance distribution function (BRD ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917435

17. Experimental Bounds on Classical Random Field Theories
Topic: Optics
Published: 12/10/2014
Authors: Joffrey Kent Peters, Sergey V Polyakov, Jingyun Fan, Alan L Migdall
Abstract: Alternative theories to quantum mechanics motivate important fundamental tests of our understanding and description of the smallest physical systems. Here we place experimental limits on those classical field theories which result in power-depend ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917261

18. Generation of bright phase-matched circularly-polarized extreme ultraviolet high harmonics
Topic: Optics
Published: 12/8/2014
Authors: Justin M Shaw, Patrik Grychtol, Dmitriy Zusin, Ronny J. Knut, Tenio Popmintchev, Hans Toya Nembach, Avner Fleischer, Henry Kapteyn, Margaret Murnane, Ofer Kfir, Oren Cohen
Abstract: Circularly-polarized extreme UV and X-ray radiation provides valuable access to the structural, electronic and magnetic properties of materials. To date, this capability was available only at large-scale X-ray free-electron lasers or synchrotrons. He ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915723

19. Flat lens criterion by small-angle phase
Topic: Optics
Published: 12/1/2014
Authors: Peter Ott, Mohammed H. Al Shakhs, Henri J Lezec, Kenneth John Chau
Abstract: It is sometimes possible to image using a flat lens consisting of planar, uniform media. There is conceptual division between theoretical flat lens proposals, which require exotic properties such as negative index or counter-intuitive behavior such ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915969

20. Nanoscale Imaging of Photocurrent and Efficiency in CdTe Solar Cells
Topic: Optics
Published: 10/15/2014
Authors: Leite Marina, maxim abashin, Henri J Lezec, anthony gianfrancesco, Talin Alec, Nikolai B Zhitenev
Abstract: The local collection characteristics of grain interiors and grain boundaries in thin film CdTe polycrystalline solar cells are investigated using scanning photocurrent microscopy. The carriers are locally generated by light injected through a small ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916527



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