NIST logo

Publications Portal

You searched on: Topic Area: Optics Sorted by: date

Displaying records 11 to 20 of 69 records.
Resort by: Date / Title

11. Fiber Bragg Gratings Embedded in 3D-Printed Scaffolds
Topic: Optics
Published: 6/1/2015
Authors: Peter Liacouras, Khazar Choudhry, Grant Grant, Gregory F Strouse, Zeeshan Ahmed
Abstract: In recent years there has been considerable interest in utilizing fiber optic based sensors as embedded sensor for fabricating smart materials. One of the primary motivations is to provide real-time information on the structural health of the materia ...

12. Spectral homogenization techniques for the hyperspectral image projector
Topic: Optics
Published: 5/15/2015
Authors: Joseph Paul Rice, Logan E. Hillberry
Abstract: In an effort to improve technology for performance testing and calibration of multispectral and hyperspectral imagers, the National Institute of Standards and Technology (NIST) has been developing a Hyperspectral Image Projector (HIP) capable of proj ...

13. Quantitative scheme for full-field polarization rotating fluorescence microscopy (PROM) using a liquid crystal variable retarder
Topic: Optics
Published: 5/14/2015
Authors: John F. Lesoine, Ji Y. Lee, Hyeong G. Kang, Matthew Lawrence Clarke, Robert C. Chang, Ralph Nossal, Jeeseong Hwang
Abstract: We introduce real-time, full-field, polarization rotating fluorescence microscopy (PROM) to monitor the absorption dipole orientations of fluorescent molecules. A quarter-wave plate, in combination with a liquid crystal variable retarder (LCVR ...

14. On-Fiber Plasmonic Interferometer for Multi-Parameter Sensing
Topic: Optics
Published: 4/20/2015
Authors: Zhijian Zhang, Yongyao Chen, Haijun H. Liu, Hyungdae Bae, Douglas A Olson, Miao Yu
Abstract: We demonstrate a novel miniature multi-parameter sensing device based on a plasmonic interferometer fabricated on a fiber facet in the optical communication wavelength range. This device enables the coupling between surface plasmon resonance and plas ...

15. Dimensional Metrology of Lab on a Chip Internal Structures: a Comparison of Optical Coherence Tomography with Coherence Fluorescence Microscopy
Topic: Optics
Published: 4/8/2015
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: The characterization of internal structures in a polymeric device, specifically of a final product, will require a different set of metrology techniques than those traditionally use in the characterization of microelectronic devices. OCT is relati ...

16. Measurement of the optical properties of solid biomedical phantoms at the National Institute of Standards and Technology
Topic: Optics
Published: 3/6/2015
Authors: Paul Lemaillet, David W Allen, Jeeseong Hwang
Abstract: Solid phantoms that serve as a proxy for human tissue and provide a convenient test subject for optical medical imaging devices. In order to determine quantitative performance of a given system, the absolute optical properties of the subject mus ...

17. SCATMECH: Polarized Light Scattering C++ Class Library and the Modeled Integrated Scattering Tool (MIST)
Topic: Optics
Published: 1/15/2015
Author: Thomas Avery Germer
Abstract: SCATMECH is an object-oriented C++ class library developed to distribute models for light scattering applications. Included in the library are models for diffuse surface scattering that predict the bidirectional reflectance distribution function (BRD ...

18. Experimental Bounds on Classical Random Field Theories
Topic: Optics
Published: 12/10/2014
Authors: Joffrey Kent Peters, Sergey V Polyakov, Jingyun Fan, Alan L Migdall
Abstract: Alternative theories to quantum mechanics motivate important fundamental tests of our understanding and description of the smallest physical systems. Here we place experimental limits on those classical field theories which result in power-depend ...

19. Generation of bright phase-matched circularly-polarized extreme ultraviolet high harmonics
Topic: Optics
Published: 12/8/2014
Authors: Justin M Shaw, Patrik Grychtol, Dmitriy Zusin, Ronny J. Knut, Tenio Popmintchev, Hans Toya Nembach, Avner Fleischer, Henry Kapteyn, Margaret Murnane, Ofer Kfir, Oren Cohen
Abstract: Circularly-polarized extreme UV and X-ray radiation provides valuable access to the structural, electronic and magnetic properties of materials. To date, this capability was available only at large-scale X-ray free-electron lasers or synchrotrons. He ...

20. Flat lens criterion by small-angle phase
Topic: Optics
Published: 12/1/2014
Authors: Peter Ott, Mohammed H. Al Shakhs, Henri J Lezec, Kenneth John Chau
Abstract: It is sometimes possible to image using a flat lens consisting of planar, uniform media. There is conceptual division between theoretical flat lens proposals, which require exotic properties such as negative index or counter-intuitive behavior such ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series