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Displaying records 41 to 44.
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41. High Accuracy Dual Lens Transmittance Measurements
J Cheung, James Gardner, Alan L Migdall, Sergey V Polyakov, Michael Ware
We show how to determine the transmittance of short focal length lenses (f ~ 19 mm, in this case) with an uncertainty of 1 part in 103 or better by measuring transmittances of lens pairs of a set of three or more lenses with the same nominal focal le ...
42. Alignment of Fiducial Marks in a Tomographic Tilt Series with an Unknown Rotation Axis
Zachary H Levine, Peter Volkovitsky, Howard Hung
Alignment for tomography using a transmission electron microscopy frequently uses colloidal gold particles as fiducial reference marks. Typically, there is an implicit assumption that the tilt axis of the tomographic series is orthogonal to the beam ...
43. Tests of a Two-Photon Technique for Measuring Polarization Mode Dispersion With Subfemtosecond Precision
Eric Dauler, Gregg Jaeger, A Muller, Alan L Migdall
An investigation is made of a recently introduced
quantum interferometric method
capable of measuring polarization mode
dispersion (PMD) on sub-femtosecond
scales, without the usual interferometric
stability problems associated with such
44. Filter Transmittance Measurements in the Infrared
Alan L Migdall, A Frenkel, Daniel E. Kelleher