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You searched on: Topic Area: Optics

Displaying records 31 to 40 of 58 records.
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31. Probing coherence in microcavity frequency combs via optical pulse shaping
Topic: Optics
Published: 8/29/2012
Authors: Fahmida Ferdous, Houxun H. Miao, Pei-Hsun Wang, Daniel E. Leaird, Kartik A Srinivasan, Lei Chen, Vladimir A Aksyuk, Andrew M Weiner
Abstract: Recent investigations of microcavity frequency combs based on cascaded four-wave mixing have revealed a link between the evolution of the optical spectrum and the observed temporal coherence. Here we study a silicon nitride microresonator for which ...

32. A compact and robust method for full Stokes spectropolarimetry
Topic: Optics
Published: 8/1/2012
Authors: William Sparks, Thomas Avery Germer, John MacKenty, Frans Snik
Abstract: We present an approach to spectropolarimetry which requires neither moving parts nor time dependent modulation, and which o ers the prospect of achieving high sensitivity. The concept, which is one of those generically known as channeled polarimetry, ...

33. An algorithm for finding clusters with a known distribution and its application to photon-number resolution using a superconducting transition-edge sensor
Topic: Optics
Published: 7/20/2012
Authors: Zachary H Levine, Thomas Gerrits, Alan L Migdall, Daniel Victor Samarov, Brice R. Calkins, Adriana Eleni Lita, Sae Woo Nam
Abstract: Improving photon-number resolution of single-photon sensitive detectors is important for many applications, as is extending the range of such detectors. Here we seek improved resolution for a particular Superconducting Transition-Edge Sensor (TES) t ...

34. Phase sensitive parametric optical metrology: Exploring the limits of 3-dimensional optical metrology
Topic: Optics
Published: 4/4/2012
Authors: Richard M Silver, Jing Qin, Bryan M Barnes, Hui Zhou, Ronald G Dixson, Francois R. Goasmat
Abstract: There has been much recent work in developing advanced optical metrology applications that use imaging optics for critical dimension measurements, defect detection and for potential use with in-die metrology applications. Sensitivity to nanometer sca ...

35. Differential matrices for depolarizing media
Topic: Optics
Published: 3/1/2012
Author: Thomas Avery Germer
Abstract: The evolution of a Stokes vector through depolarizing media is considered. A general form for the differential matrix is derived that is appropriate in the presence of depolarization, and is parameterized in a manner that ensures that it yields, upon ...

36. Feedback Control of Optically Trapped Particles
Topic: Optics
Published: 12/17/2011
Authors: Jason John Gorman, Arvind Kumar Balijepalli, Thomas W LeBrun
Abstract: Optical trapping is a method for manipulating micro- and nanoscale particles that is widely used in biophysics and colloid science, among other areas. This method uses optical forces to confine the position of a particle to a localized region, which ...

37. Efficient quantum dot single photon extraction into an optical fiber using a nanophotonic directional coupler
Topic: Optics
Published: 9/19/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, W. Wegscheider, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a spectrally broadband and efficient technique for collecting photoluminescence from a single InAs quantum dot directly into a standard single mode optical fiber. In this approach, an optical fiber taper waveguide is placed in contact ...

38. A circular dielectric grating for vertical extraction of single quantum dot emission
Topic: Optics
Published: 7/25/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a suspended circular grating composed of partially etched annular trenches in a thin GaAs membrane, designed for e±cient and moderately broadband ( approx. 5 nm) extraction of emission from single InAs quantum dots. Simulations indic ...

39. Effects of Roughness on Scatterometry Signatures
Topic: Optics
Published: 5/26/2011
Authors: Martin Foldyna, Thomas Avery Germer, Brent Bergner
Abstract: We used azimuthally-resolved spectroscopic Mueller matrix ellipsometry to study a periodic silicon line structure with and without artificially-generated line edge roughness (LER). Grating profiles were determined from multiple azimuthal configuratio ...

40. Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards
Topic: Optics
Published: 4/20/2011
Authors: Thomas Avery Germer, Heather J Patrick
Abstract: We measure the Mueller matrix bidirectional reflectance distribution function (BRDF) of pressed and sintered powdered polytetrafluoroethylene (PTFE) reflectance standards for an incident angle of 75°. Rotationally averaged Mueller matrices from the m ...

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