NIST logo

Publications Portal

You searched on:
Topic Area: Optics

Displaying records 31 to 40 of 79 records.
Resort by: Date / Title

31. Feedback Control of Optically Trapped Particles
Topic: Optics
Published: 12/17/2011
Authors: Jason John Gorman, Arvind Kumar Balijepalli, Thomas W LeBrun
Abstract: Optical trapping is a method for manipulating micro- and nanoscale particles that is widely used in biophysics and colloid science, among other areas. This method uses optical forces to confine the position of a particle to a localized region, which ...

32. A synchrotron beamline for extreme-ultraviolet photoresist testing
Topic: Optics
Published: 9/30/2011
Authors: Charles S Tarrio, Steven E Grantham, Shannon Bradley Hill, Nadir S. Faradzhev, Lee J Richter, Chester Knurek, Thomas B Lucatorto
Abstract: Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be evaluated for sensitivity and tested to ensure that they will not contaminate the scanner optics. The new NIST facility described here provides data on the contami ...

33. Enhanced coupling between light and surface plasmons by nanostructured Fabry-Pérot resonator
Topic: Optics
Published: 9/26/2011
Authors: Brian S. Dennis, Vladimir A Aksyuk, Michael Haftel, Stefan T. Koev, Girsh Blumberg
Abstract: It is recognized that surface plasmons (SPs),which can be present on particulate, smooth, or corrugated metallic surfaces, have enormous potential in the fields of novel nano-optical and opto-electronic devices, as well as in spectroscopic, biologic ...

34. Efficient quantum dot single photon extraction into an optical fiber using a nanophotonic directional coupler
Topic: Optics
Published: 9/19/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, W. Wegscheider, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a spectrally broadband and efficient technique for collecting photoluminescence from a single InAs quantum dot directly into a standard single mode optical fiber. In this approach, an optical fiber taper waveguide is placed in contact ...

35. Sub-micron absolute distance measurements in sub-millisecond times with dual free-running femtosecond Er fiber-lasers
Topic: Optics
Published: 9/12/2011
Authors: Tze-An Lui, Nathan Reynolds Newbury, Ian R Coddington
Abstract: We demonstrate a simplified dual-comb lidar setup for precision absolute ranging that can achieve a ranging precision at a meter of 2 {mu}m in 140 {mu}s acquisition time. With averaging, the precision drops below 1 micron at 0.8 msec and below 200 nm ...

36. A circular dielectric grating for vertical extraction of single quantum dot emission
Topic: Optics
Published: 7/25/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a suspended circular grating composed of partially etched annular trenches in a thin GaAs membrane, designed for e±cient and moderately broadband ( approx. 5 nm) extraction of emission from single InAs quantum dots. Simulations indic ...

37. Electromagnetic Energy Density in Dispersive and Dissipative Media
Topic: Optics
Published: 6/1/2011
Authors: Frederico D. Nunes, Thiago Vasconcelos, Marcel Bezerra, John Weiner
Abstract: The description of the energy density associated with an electromagnetic field propagating through matter must treat two different phenomena: dispersion, the variation of the refractive index with frequency, and dissipation, the loss of field energy ...

38. Effects of Roughness on Scatterometry Signatures
Topic: Optics
Published: 5/26/2011
Authors: Martin Foldyna, Thomas Avery Germer, Brent Bergner
Abstract: We used azimuthally-resolved spectroscopic Mueller matrix ellipsometry to study a periodic silicon line structure with and without artificially-generated line edge roughness (LER). Grating profiles were determined from multiple azimuthal configuratio ...

39. Dual-comb based measurement of frequency agile lasers.
Topic: Optics
Published: 5/1/2011
Authors: Ian R Coddington, Fabrizio Raphael Giorgetta, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Properly stabilized, frequency combs form high accuracy references across much of the optical spectrum. Here we employ dual frequency combs to harness this accuracy for fast and high resolution measurements of swept CW sources.

40. Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards
Topic: Optics
Published: 4/20/2011
Authors: Thomas Avery Germer, Heather J Patrick
Abstract: We measure the Mueller matrix bidirectional reflectance distribution function (BRDF) of pressed and sintered powdered polytetrafluoroethylene (PTFE) reflectance standards for an incident angle of 75°. Rotationally averaged Mueller matrices from the m ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series