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Topic Area: Optics
Displaying records 11 to 20 of 55 records.
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11.
Standards for the Optical Detection of Protein Particulates
Topic: Optics
Published: 1/23/2012
Authors: Dean C Ripple, Michael J Carrier, Joshua R. Wayment
Abstract: Particulates in protein therapeutics, composed of agglomerated protein monomers, may cause an immunogenic response in patients. Consequently, industry and the FDA desire more accurate methods for counting and characterizing particulates. Unlike lik
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908731
12.
A synchrotron beamline for extreme-ultraviolet photoresist testing
Topic: Optics
Published: 9/30/2011
Authors: Charles S. Tarrio, Steven Grantham, Shannon Bradley Hill, Nadir Sabirovich Faradzhev, Lee J Richter, Chester Knurek, Thomas B Lucatorto
Abstract: Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be evaluated for sensitivity and tested to ensure that they will not contaminate the scanner optics. The new NIST facility described here provides data on the contami
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908231
13.
Enhanced coupling between light and surface plasmons by nanostructured Fabry-Pérot resonator
Topic: Optics
Published: 9/26/2011
Authors: Brian S. Dennis, Vladimir A Aksyuk, Michael Haftel, Stefan T. Koev, Girsh Blumberg
Abstract: It is recognized that surface plasmons (SPs),which can be present on particulate, smooth, or
corrugated metallic surfaces, have enormous potential in the fields of novel nano-optical and opto-electronic devices, as well as in spectroscopic, biologic
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907837
14.
Efficient quantum dot single photon extraction into an optical fiber using a nanophotonic directional coupler
Topic: Optics
Published: 9/19/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, W. Wegscheider, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a spectrally broadband and efficient technique for collecting photoluminescence from a single InAs quantum dot directly into a standard single mode optical fiber. In this approach, an optical fiber taper waveguide is placed in contact
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907755
15.
Sub-micron absolute distance measurements in sub-millisecond times with dual free-running femtosecond Er fiber-lasers
Topic: Optics
Published: 9/12/2011
Authors: Tze-An Lui, Nathan Reynolds Newbury, Ian R Coddington
Abstract: We demonstrate a simplified dual-comb lidar setup for precision absolute ranging that can achieve a ranging precision at a meter of 2 {mu}m in 140 {mu}s acquisition time. With averaging, the precision drops below 1 micron at 0.8 msec and below 200 nm
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908892
16.
A circular dielectric grating for vertical extraction of single quantum dot emission
Topic: Optics
Published: 7/25/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a suspended circular grating composed of partially etched annular trenches in a thin
GaAs membrane, designed for e±cient and moderately broadband ( approx. 5 nm) extraction of emission
from single InAs quantum dots. Simulations indic
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908236
17.
Electromagnetic Energy Density in Dispersive and Dissipative Media
Topic: Optics
Published: 6/1/2011
Authors: Frederico D. Nunes, Thiago Vasconcelos, Marcel Bezerra, John Weiner
Abstract: The description of the energy density associated with an electromagnetic field propagating through matter must treat two different phenomena: dispersion, the variation of the refractive index with frequency, and dissipation, the loss of field energy
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906602
18.
Effects of Roughness on Scatterometry Signatures
Topic: Optics
Published: 5/26/2011
Authors: Martin Foldyna, Thomas Avery Germer, Brent Bergner
Abstract: We used azimuthally-resolved spectroscopic Mueller matrix ellipsometry to study a periodic silicon line structure with and without artificially-generated line edge roughness (LER). Grating profiles were determined from multiple azimuthal configuratio
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908805
19.
Dual-comb based measurement of frequency agile lasers.
Topic: Optics
Published: 5/1/2011
Authors: Ian R Coddington, Fabrizio Raphael Giorgetta, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Properly stabilized, frequency combs form high accuracy references across much of the optical spectrum. Here we employ dual frequency combs to harness this accuracy for fast and high resolution measurements of swept CW sources.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907442
20.
Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards
Topic: Optics
Published: 4/20/2011
Authors: Thomas Avery Germer, Heather J Patrick
Abstract: We measure the Mueller matrix bidirectional reflectance distribution function (BRDF) of pressed and sintered powdered polytetrafluoroethylene (PTFE) reflectance standards for an incident angle of 75°. Rotationally averaged Mueller matrices from the m
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909321