NIST logo

Publications Portal

You searched on:
Topic Area: Optical Physics
Sorted by: title

Displaying records 61 to 66.
Resort by: Date / Title


61. Uncooled, Millimeter-Scale Atomic Magnetometers with Femtotesla Sensitivity
Topic: Optical Physics
Published: 10/26/2009
Authors: John E Kitching, Svenja A Knappe, William C. Griffith, Jan Preusser, V Gerginov, Peter D. Schwindt, Vishal Shah, Ricardo Jimenez Martinez
Abstract: We summarize recent results at NIST to develop high-performance yet highly miniaturized magnetic sensors based on atomic vapors confined in microfabricated alkali vapor cells. These sensors currently achieve sensitivities in the range of a few tens o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903176

62. Uniform and enhanced field emission from chromium oxide coated carbon nanosheets
Topic: Optical Physics
Published: 4/2/2008
Authors: Uwe Arp, Kun Hou, Ronald Outlaw, Wang Sigen, Mingyao Zhu, Ronald Quinlan, Dennis Manos, Martin Kordesch, Brian Holloway
Abstract: Carbon nanosheets, a two-dimensional carbon nanostructure, are promising electron cathode materials for applications in vacuum microelectronic devices. This letter demonstrates a simple approach to improve the spatial emission uniformity of carbon na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903061

63. Using radiation pressure for measurement of high-power laser emission
Topic: Optical Physics
Published: 10/15/2013
Authors: Paul A Williams, Joshua Aram Hadler, Robert Lee, Frank Maring, John H Lehman
Abstract: We demonstrate a paradigm in absolute laser radiometry where a laser beam's power can be measured from its radiation pressure. Using an off-the-shelf high-accuracy mass scale and a 500 W Yb-doped fiber laser and a 92 kW CO2 laser, we show preliminary ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914101

64. Vector characterization of high-speed components using linear optical sampling with milliradian resolution
Topic: Optical Physics
Published: 12/1/2008
Authors: Paul A Williams, Tasshi Dennis, Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: We demonstrate linear optical sampling measurements optimized for characterization of the signals produced by optical components. By sampling the optical electric field before and after the component, we isolate the full vector field (phase and ampli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33127

65. Wavelength References for Optical Interferometry
Topic: Optical Physics
Published: 6/12/2005
Authors: Richard W Fox, Leo W. Hollberg
Abstract: We are exploring air wavelength references useful for interferometry. Femtosecond comb frequency measurements determine mode wavelengths of a stable optical cavity in vacuum, and subsequently a tunable laser is locked to the modes in air.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30063

66. Yb Optical Lattice Clock
Topic: Optical Physics
Published: 11/23/2008
Authors: Nathan D. Lemke, Andrew D Ludlow, Zeb Barber, N Poli, C.W. Hoyt, Long-Sheng Ma, Jason Stalnaker, Christopher W Oates, Leo Hollberg, James C Bergquist, A. Brusch, Tara Michele Fortier, Scott A Diddams, Thomas Patrick Heavner, Steven R Jefferts, Thomas Edward Parker
Abstract: We describe the development and latest results of an optical lattice clock based on neutral Yb atoms, including investigations based on both even and odd isotopes. We report a fractional frequency uncertainty below 10^u-15^ for ^u171^Yb.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901008



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series