NIST logo

Publications Portal

You searched on:
Topic Area: Optical Metrology
Sorted by: title

Displaying records 81 to 90 of 112 records.
Resort by: Date / Title


81. Photomask metrology using a 193 nm scatterfield microscope
Topic: Optical Metrology
Published: 9/30/2009
Authors: Richard Quintanilha, Bryan M Barnes, Martin Y Sohn, Lowell P. Howard, Richard M Silver, James Edward Potzick, Michael T. Stocker
Abstract: The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. The calibration of this mask has been ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903929

82. Physica B&Cl Parameters in High-Accuracy Spectrophotometry
Topic: Optical Metrology
Published: 5/31/1972
Author: Klaus Mielenz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620036

83. Polarization-sensitive linear optical sampling for characterization of polarization-multiplexed QPSK
Topic: Optical Metrology
Published: 3/20/2009
Authors: Paul A Williams, Tasshi Dennis, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We describe polarization-sensitive phase-referenced linear optical sampling for measuring polarization, amplitude, and phase of a high speed optical waveform. With a single measurement, we simultaneously measure both orthogonal polarization channels ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900133

84. Power Spectral Density: Is it right?
Topic: Optical Metrology
Published: 6/13/2010
Authors: Ulf Griesmann, John Lehan, Jiyoung Chu
Abstract: We concentrate on the instrumental issues surrounding power spectral density (PSD) determination, using as an example, the most common optical shop QA tool, the Fizeau interferometer. We briefly discuss the properties of an ideal calibration method ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905045

85. Precise Measurement of Lunar Spectral Irradiance at Visible Wavelengths
Series: Journal of Research (NIST JRES)
Report Number: 118.020
Topic: Optical Metrology
Published: 11/12/2013
Authors: Keith R Lykke, John Taylor Woodward IV, Allan W. Smith
Abstract: We report a measurement of lunar spectral irradiance with an uncertainty below 1 % from 420 nm to 1000 nm. This measurement uncertainty meets the stability requirement for many climate data records derived from satellite images, including those f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913841

86. Prediction of Permeability Using Optical Coherence Tomographic Imaging of an Epoxy and Unidirectional E-Glass Composite
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, Frederick R Phelan Jr, C G Zimba, R Prasankumar, J G Fujimoto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853691

87. Progress toward redetermining the Boltzmann constant with a fixed-path-length cylindrical resonator
Topic: Optical Metrology
Published: 5/21/2011
Authors: Jintao Zhang, H. Lin, X.J. Feng, J.P. Sun, Keith A Gillis, Michael R Moldover, Y.Y. Duan
Abstract: We used a single, fixed-path-length cylindrical-cavity resonator to measure {I}c{/I}^d0^ = (307.8252 {+ or -} 0.0012) m{bullet}s^u−1^, the zero-density limit of the speed of sound in pure argon at the temperature of the triple point of water. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907610

88. Quantum radiometry
Topic: Optical Metrology
Published: 5/2/2009
Authors: Sergey V Polyakov, Alan L Migdall
Abstract: We review radiometric techniques that take advantage of photon counting and stem from the quantum laws of nature. We present a brief history of metrological experiments and review the current state of experimental quantum radiometry.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902273

89. Rapid and precise absolute distance measurements at long range
Topic: Optical Metrology
Published: 6/1/2009
Authors: Ian R Coddington, William C Swann, Ljerka Nenadovic, Nathan Reynolds Newbury
Abstract: The ability to determine absolute distance to an object is one of the most basic measurements of remote sensing. High precision ranging has important applications in both large-scale manufacturing and in future tight formation-flying satellite missio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901111

90. Report on the Extension of the Real-Time Testing System to Microscope Systems
Topic: Optical Metrology
Published: 11/1/1972
Author: D Nyyssonan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620030



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series