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Topic Area: Optical Metrology
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Displaying records 81 to 90 of 118 records.
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81. Non-Destructive Characterization of the Morphology of a Polymer Co-Extruded Scaffold Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 12/19/2001
Authors: Joy P Dunkers, N Washburn, Carl George Simon Jr, Alamgir Karim, Eric J. Amis
Abstract: It is generally understood that a complex interaction of many variables controls the success of cell infiltration, proliferation, and differentiation within a tissue scaffold. One parameter that has a large influence on the development of functionin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851812

82. Optical Coherence Tomography of Glass Reinforced Polymer Composites
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, Richard~undefined~undefined~undefined~undefined~undefined Parnas, C G Zimba, R C Peterson, Kathleen M. Flynn, J G Fujimoto, B E Bouma
Abstract: Optical coherence tomography (OCT) is a non-destructive and non-contact technique to image microstructure within scattering media. The application of OCT to highly scattering materials such as polymer composites is especially challenging. In this w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851443

83. Optical Microscope: Resolving Three-dimensions at Sub-nanometer Scale
Topic: Optical Metrology
Published: 7/29/2014
Authors: Ravikiran Attota, Ronald G Dixson
Abstract: Ability to meaningfully resolve samples at nanoscale and in three-dimensions (3D) is extremely beneficial. Optics based super-resolution methods have made tremendous progress in this respect 1-16 surpassing way beyond the Abbe‰s diffraction limit, bu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

84. Optical constants and spatial uniformity of thermally grown oxide layer of custom, induced-junction, silicon photodiodes for a predictable quantum efficient detector
Topic: Optical Metrology
Published: 6/28/2013
Author: Malcolm Graham White
Abstract: We have investigated the optical properties of self-induced inversion-layer silicon photodiodes using spectroscopic ellipsometric measurement techniques. We report a self-consistent data set and dispersion relation for the optical constants of th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911553

85. Photomask metrology using a 193 nm scatterfield microscope
Topic: Optical Metrology
Published: 9/30/2009
Authors: Richard Quintanilha, Bryan M Barnes, Martin Y Sohn, Lowell P. Howard, Richard M Silver, James Edward Potzick, Michael T. Stocker
Abstract: The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. The calibration of this mask has been ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903929

86. Physica B&Cl Parameters in High-Accuracy Spectrophotometry
Topic: Optical Metrology
Published: 5/31/1972
Author: Klaus Mielenz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620036

87. Polarization-sensitive linear optical sampling for characterization of polarization-multiplexed QPSK
Topic: Optical Metrology
Published: 3/20/2009
Authors: Paul A Williams, Tasshi Dennis, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We describe polarization-sensitive phase-referenced linear optical sampling for measuring polarization, amplitude, and phase of a high speed optical waveform. With a single measurement, we simultaneously measure both orthogonal polarization channels ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900133

88. Power Spectral Density: Is it right?
Topic: Optical Metrology
Published: 6/13/2010
Authors: Ulf Griesmann, John Lehan, Jiyoung Chu
Abstract: We concentrate on the instrumental issues surrounding power spectral density (PSD) determination, using as an example, the most common optical shop QA tool, the Fizeau interferometer. We briefly discuss the properties of an ideal calibration method ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905045

89. Precise Measurement of Lunar Spectral Irradiance at Visible Wavelengths
Series: Journal of Research (NIST JRES)
Report Number: 118.020
Topic: Optical Metrology
Published: 11/12/2013
Authors: Keith R Lykke, John Taylor Woodward IV, Allan W. Smith
Abstract: We report a measurement of lunar spectral irradiance with an uncertainty below 1 % from 420 nm to 1000 nm. This measurement uncertainty meets the stability requirement for many climate data records derived from satellite images, including those f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913841

90. Prediction of Permeability Using Optical Coherence Tomographic Imaging of an Epoxy and Unidirectional E-Glass Composite
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, Frederick R Phelan Jr, C G Zimba, R Prasankumar, J G Fujimoto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853691



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