NIST logo

Publications Portal

You searched on:
Topic Area: Optical Metrology
Sorted by: title

Displaying records 61 to 70 of 139 records.
Resort by: Date / Title


61. Imaging of Impact Damage in Composites Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 2/1/2000
Authors: Joy P Dunkers, D P Sanders, Donald Lee Hunston, M J Everett
Abstract: Resistance to impact damage is extremely important for most composites. Such damage can initiate delamination, one of the most common failure modes in composites.. Because this is such an important failure mode, many studies have tried to develop ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851666

62. Imaging of Multi-Fiber, Micro-Mechanical Testing Specimens Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 2/1/2001
Authors: Joy P Dunkers, Gale Antrus Holmes, Walter G McDonough
Abstract: In this initial work, we interfaced a micro-mechanical testing stage with the optical coherence tomography (OCT) instrument. We then demonstrated the feasibility of this approach by comparing OCT images of single and multi-fiber sample to optical mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851846

63. Increased responsivity pyroelectric radiometer with dome input and temperature control
Topic: Optical Metrology
Published: 7/18/2011
Authors: George P Eppeldauer, Jinan Zeng, Leonard M Hanssen
Abstract: Pyroelectric radiometers with noise-equivalent-power (NEP) close to 1 nW/Hz¿ have been developed to measure less than 1 microwatt radiant power levels at room temperature to 25 micrometer. The radiometers will be used as transfer standards for routin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908993

64. Infrared Absolute Calibrations Down to 10 fW in Low-Temperature Environments at NIST
Topic: Optical Metrology
Published: 7/22/2008
Authors: Adriaan Carl Linus Carter, Raju Vsnu Datla, Timothy Jung, Solomon Woods
Abstract: The Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology (NIST) is responsible for absolute IR radiometric calibrations (SI traceable) in low-background temperature (below 80 K) environments. IR radiometric te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842510

65. Infrared detector calibrations
Topic: Optical Metrology
Published: 3/22/2012
Authors: George P Eppeldauer, Vyacheslav B Podobedov
Abstract: An InSb working standard radiometer, first calibrated at NIST in 1999 against a cryogenic bolometer, was recently calibrated against a newly developed low-NEP pyroelectric transfer standard detector. The pyroelectric transfer standard, which can oper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910831

66. Intercomparison between optical and x-ray scatterometry measurements of FinFET structures
Topic: Optical Metrology
Published: 4/8/2013
Authors: Paul Lemaillet, Thomas Avery Germer, Regis J Kline, Daniel Franklin Sunday, Chengqing C. Wang, Wen-Li Wu
Abstract: In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD) metrology and critical dimension small angle X-ray scattering (CD-SAXS) metrology. Spectroscopi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913230

67. Internal quantum efficiency modeling of silicon photodiodes
Topic: Optical Metrology
Published: 4/1/2010
Authors: Thomas R. Gentile, Steven W Brown, Keith R Lykke, Ping-Shine Shaw, John Taylor Woodward IV
Abstract: Results are presented for modeling of the internal quantum efficiency (IQE) of silicon photodiodes in the 400 nm to 900 nm wavelength range. The IQE data are based on measurements of the external quantum efficiencies of three transmission trap detec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904680

68. Introduction to Journal of Modern Optics Special Issue on Single Photon: Sources, Detectors, Applications and Measurement Methods
Topic: Optical Metrology
Published: 1/20/2007
Authors: J Cheung, Alan L Migdall, Stefania Castelletto
Abstract: In October 2005, a 2-day follow up workshop, Single photon: sources, detectors, applications and measurement methods, was held at the NPL (National Physical Laboratory, UK). The focus for this workshop was to report on the key developments since the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841035

69. Introduction to special issue on single-photon technologies
Topic: Optical Metrology
Published: 3/10/2011
Authors: Alan L Migdall, Sergey V Polyakov, Jingyun Fan, Ivo Pietro Degiovanni, Jessica Cheung
Abstract: This special issue accompanies the 4th international conference on single-photon technologies held at the National Institute of Standards and Technology (NIST) Boulder in November 2009. This community has met every two years at national metrology ins ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907536

70. Iron Optical Constants and Reflectance Spectroscopy of Planetary Surfacers
Topic: Optical Metrology
Published: 3/1/2010
Authors: David Blewett, Nhan V Nguyen, Oleg A Kirillov, Samuel Lawrence
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907161



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series