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You searched on: Topic Area: Optical Metrology Sorted by: title

Displaying records 61 to 70 of 73 records.
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61. Single-Photon Detector Calibration
Topic: Optical Metrology
Published: 7/7/2015
Author: Sergey V Polyakov
Abstract: In this chapter we introduce the set of detector properties, common to most contemporary detectors, that should be determined for a complete characterization. Then we introduce methods for detector characterization, and finally we present practical ...

62. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Optical Metrology
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...

63. Standardization of Broadband UV Measurements
Topic: Optical Metrology
Published: 1/1/2013
Author: George P Eppeldauer
Abstract: The CIE standardized rectangular-shape UV response functions can be realized only with large spectral mismatch errors. The spectral power-distribution of UV sources is not standardized. Accordingly, the readings of different types of UV meters, even ...

64. Superconducting nanowire single photon detectors fabricated from an amorphous Mo0.75Ge0.25 thin-film
Topic: Optical Metrology
Published: 7/15/2014
Authors: Varun Boehm Verma, Adriana E Lita, Michael R Vissers, Francesco Marsili, David P Pappas, Richard P Mirin, Sae Woo Nam
Abstract: We present the characteristics of superconducting nanowire single photon detectors (SNSPDs) fabricated from amorphous Mo0.75Ge0.25 thin -films. Fabricated devices show a saturation of the internal detection efficiency at temperatures below 1 K, w ...

65. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Topic: Optical Metrology
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R. Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...

66. THz Spectroscopic Study of Iron Oxide Layers within Steel-Reinforced Structural Components
Topic: Optical Metrology
Published: 9/26/2011
Authors: Virgil Provenzano, Shin G. Chou
Abstract: In this study, we use THz-based spectroscopy as a non-destructive diagnostic tool to characterize the corrosion by-products (rust) on aged iron structural components. Even though previous Mossbauer spectroscopic findings suggested the presence of an ...

67. TSOM Method for Semiconductor Metrology
Topic: Optical Metrology
Published: 4/18/2011
Authors: Ravikiran Attota, Ronald G Dixson, John A Kramar, James Edward Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Abstract: Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM ...

68. Thermo-elastic induced phase noise in the LISA Pathfinder spacecraft
Topic: Optical Metrology
Published: 1/25/2015
Authors: Ferran Gibert, Miquel Nofrarias, Nico Karnesis, Lluis Gesa, Victor Martin, Ignacio Mateos, Alberto Lobo, Reinhold Flatscher, Domenico Gerardi, Johannes Burkhardt, Ruediger Gerndt, David I Robertson, Henry Ward, Paul McNamara, Felipe Guzman, Martin Hewitson, Ingo Diepholz, Jens Reiche, Gerhard Heinzel, Karsten Danzmann
Abstract: During the on-station thermal test campaign of the LISA Pathfinder, the diagnostics subsystem was tested in nearly space conditions for the first time after integration in the satellite. The results showed the compliance of the temperature measuremen ...

69. Time and Frequency-Domain Spectroscopy with Dual Frequency Combs
Topic: Optical Metrology
Published: 5/28/2009
Authors: Nathan Reynolds Newbury, Ian R Coddington, William C Swann
Abstract: High-resolution spectroscopic measurements of the amplitude and phase spectra from a gas sample can be acquired by use of dual frequency combs. Here we discuss the corresponding gas signature in the time domain.

70. Towards a FPGA-controlled deep phase modulation interferometer
Topic: Optical Metrology
Published: 5/11/2015
Authors: Marcelo Teran, Victor Martin, Lluis Gesa, Ignacio Mateos, Ferran Gibert, Nico Karnesis, Juan Ramos Castro, Thomas Schwarze, Oliver Gerberding, Gerhard Heinzel, Felipe Guzman, Miquel Nofrarias
Abstract: Deep phase modulation interferometry was proposed as a method to enhance homodyne interferometers to work over many fringes. In this scheme, a sinusoidal phase modulation is applied in one arm while the demodulation takes place as a post-processing s ...

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  • SP 250-XX: Calibration Services
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