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Topic Area: Optical Metrology
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Displaying records 11 to 20 of 100 records.
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11. Basic Considerations of Densitometer Adjustment and Calibration
Topic: Optical Metrology
Published: 12/20/1972
Author: R E Swing
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620032

12. Bilateral optical power meter comparison between NIST and CENAM
Topic: Optical Metrology
Published: 7/1/2008
Authors: Igor Vayshenker, J. Bermudez, J. Molina, Z. Ruiz, David J Livigni, Xiaoyu X. Li, John H Lehman
Abstract: We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33044

13. Broadband coherent spectroscopy in the near infrared using dual coherent frequency combs
Topic: Optical Metrology
Published: 8/15/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Fiber-based frequency combs can provide broadband coherent light that enables new possibilities for high-accuracy, high-resolution broadband spectroscopy. We use a configuration with two coherently phase-locked combs; the output of one comb passes th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906584

14. CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm
Topic: Optical Metrology
Published: 6/2/2009
Authors: Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E Gibson, Howard W Yoon, Arnold Gaertner, Dieter Taubert, Juergen Hartmann
Abstract: In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Fi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900253

15. Characterization and Calibration of an Optical Time Domain Reflectometer Calibrator
Topic: Optical Metrology
Published: 8/23/2006
Authors: Donald R Larson, Nicholas G Paulter Jr, Kenneth C Blaney
Abstract: We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers. This instrument implements the Telecommunications Industry Association standard TIA/EIA-455- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32309

16. Characterization of Composite Microstructure and Damage Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, C G Zimba, Kathleen M. Flynn, Donald Lee Hunston, R Prasankumar, X Li, J G Fujimoto
Abstract: Optical coherence tomography (OCT) is a non-destructive and non-contact technique that images microstructure within scattering media. In this work, the versatility of OCT for non-destructive evaluation is demonstrated through imaging of composite mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851542

17. Characterization of Metal-Oxide Nanofilm Morphologies and Composition by Terahertz Transmission Spectroscopy
Topic: Optical Metrology
Published: 3/30/2009
Authors: Edwin J Heilweil, James E Maslar, William Andrew Kimes, Nabil Bassim, Peter K. Schenck
Abstract: An all-optical terahertz absorption technique for non-destructive characterization of nanometer-scale metal-oxide thin films grown on silicon substrates is described. Example measurements of laser and atomic layer-deposited films of HfO2, TiO3, Al2O ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842590

18. Characterization of an Optical Time Domain Reflectometer Calibrator
Topic: Optical Metrology
Published: 3/1/2007
Authors: Donald R Larson, Nicholas G Paulter Jr, Kenneth C Blaney
Abstract: We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers. This instrument implements the Telecommunications Industry Association standard TIA/EIA-455- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32449

19. Choosing the right detector for laser power and energy measurements
Topic: Optical Metrology
Published: 10/1/2008
Author: Marla L Dowell
Abstract: You may not realize the importance of good laser metrology and its many pitfalls until you realize how much of today’s commonplace conveniences – from long distance communications to LASIK (laser-assisted in situ keratomileusis) to state-of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33180

20. Collinear Optical Coherence Microscopy and Confocal Fluorescence Microscopies for Tissue Engineering
Topic: Optical Metrology
Published: 11/1/2003
Authors: Joy P Dunkers, Marcus T Cicerone, N Washburn
Abstract: Tissue engineered medical products (TEMPs) often consist of a three-dimensional synthetic scaffold that provides form and foundation for the cells as they produce the tissue of interest. Successful TEMPs will allow cell infiltration, and foster prol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852133