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Displaying records 11 to 20 of 48 records.
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11. Fast high-resolution frequency agile spectroscopy of laser sources
Topic: Optical Metrology
Published: 10/24/2010
Authors: Fabrizio Raphael Giorgetta, Ian R Coddington, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Time-resolved, high-accuracy and high-resolution spectroscopy of frequency-agile cw lasers is critical to realizing their full potential for sensing, but is not possible with conventional spectroscopy methods. We demonstrate a dual comb-based spectro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905724

12. Filter Transmittance Measurements in the Infrared
Topic: Optical Metrology
Published: 1/1/1993
Authors: Alan L Migdall, A Frenkel, Daniel E. Kelleher
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104043

13. Fourier Domain Optical Tool Normalization for Quantitative Parametric Image Reconstruction
Topic: Optical Metrology
Published: 9/5/2013
Authors: Jing Qin, Richard M Silver, Bryan M Barnes, Hui H. Zhou, Francois R. Goasmat
Abstract: There has been much recent work in developing advanced optical metrology methods that use imaging optics for critical dimension measurements and defect detection. Sensitivity to nanometer scale changes has been observed when measuring critical dimens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913587

14. High precision, broadband optical measurements with fiber laser frequency combs
Topic: Optical Metrology
Published: 11/2/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Optical frequency combs have been used extensively, and with remarkable success, to measure the absolute frequency of cw lasers. The use of frequency combs has also expanded to include applications such as precision ranging, component metrology, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907200

15. Illuminance responsivity calibration of reference photometers at the NIST SIRCUS and SCF facilities
Topic: Optical Metrology
Published: 5/29/2009
Authors: George P Eppeldauer, Carl C Miller, Thomas C Larason, Yoshihiro Ohno
Abstract: The illuminance responsivities of two transfer standard photometers have been directly determined from their spectral responsivity calibrations at two different calibration facilities of NIST. The main characteristics of the two photometers, and thei ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902807

16. Imaging of Multi-Fiber, Micro-Mechanical Testing Specimens Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 2/1/2001
Authors: Joy P Dunkers, Gale Antrus Holmes, Walter G McDonough
Abstract: In this initial work, we interfaced a micro-mechanical testing stage with the optical coherence tomography (OCT) instrument. We then demonstrated the feasibility of this approach by comparing OCT images of single and multi-fiber sample to optical mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851846

17. Infrared detector calibrations
Topic: Optical Metrology
Published: 3/22/2012
Authors: George P Eppeldauer, Vyacheslav B Podobedov
Abstract: An InSb working standard radiometer, first calibrated at NIST in 1999 against a cryogenic bolometer, was recently calibrated against a newly developed low-NEP pyroelectric transfer standard detector. The pyroelectric transfer standard, which can oper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910831

18. Intercomparison between optical and x-ray scatterometry measurements of FinFET structures
Topic: Optical Metrology
Published: 4/8/2013
Authors: Paul Lemaillet, Thomas Avery Germer, Regis J Kline, Daniel Franklin Sunday, Chengqing C. Wang, Wen-Li Wu
Abstract: In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD) metrology and critical dimension small angle X-ray scattering (CD-SAXS) metrology. Spectroscopi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913230

19. Introduction to Journal of Modern Optics Special Issue on Single Photon: Sources, Detectors, Applications and Measurement Methods
Topic: Optical Metrology
Published: 1/20/2007
Authors: J Cheung, Alan L Migdall, Stefania Castelletto
Abstract: In October 2005, a 2-day follow up workshop, Single photon: sources, detectors, applications and measurement methods, was held at the NPL (National Physical Laboratory, UK). The focus for this workshop was to report on the key developments since the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841035

20. Introduction to special issue on single-photon technologies
Topic: Optical Metrology
Published: 3/10/2011
Authors: Alan L Migdall, Sergey V Polyakov, Jingyun Fan, Ivo Pietro Degiovanni, Jessica Cheung
Abstract: This special issue accompanies the 4th international conference on single-photon technologies held at the National Institute of Standards and Technology (NIST) Boulder in November 2009. This community has met every two years at national metrology ins ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907536



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