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Topic Area: Optical Metrology
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Displaying records 11 to 20 of 138 records.
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11. Accurate, inexpensive testing of handheld lasers for safe use and operation
Topic: Optical Metrology
Published: 3/7/2013
Authors: Marla L Dowell, Joshua Aram Hadler
Abstract: An accurate, inexpensive test bed for measurements of optical power emitted from handheld lasers is described. Our test bed consists of a thermopile detector, bandpass optical filters, an adjustable iris, and self-centering holders for mounting of th ...

12. An algorithm for finding clusters with a known distribution and its application to photon-number resolution using a superconducting transition-edge sensor
Topic: Optical Metrology
Published: 7/20/2012
Authors: Zachary H Levine, Thomas Gerrits, Alan L Migdall, Daniel Victor Samarov, Brice R. Calkins, Adriana Eleni Lita, Sae Woo Nam
Abstract: Improving photon-number resolution of single-photon sensitive detectors is important for many applications, as is extending the range of such detectors. Here we seek improved resolution for a particular Superconducting Transition-Edge Sensor (TES) t ...

13. An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures
Topic: Optical Metrology
Published: 9/15/2008
Authors: Leonard M Hanssen, Jinan Zeng
Abstract: An instrument, the Complete Hemispherical Infrared Laser-based Reflectometer (CHILR), has been designed and built for the accurate characterization of the total reflectance of highly absorbing samples and cavity structures down to the level of 10-5 ...

14. Applications of Optical Coherence Tomography to the Study of Polymer Matrix Composites
Topic: Optical Metrology
Published: 1/1/2002
Author: Joy P Dunkers
Abstract: The use of optical coherence tomography (OCT) to study polymer matrix composites (PMCS) is very recent. So recent, in fact, that the full potential and limitations of this technique have yet to be studied completely since PMCS are a large and varied ...

15. Assessing consistency of a Mueller matrix measurement by rotation of the sample under test
Topic: Optical Metrology
Published: 9/27/2013
Author: Thomas Avery Germer
Abstract: We present a method for checking the consistency of a Mueller matrix measurement. The method is based upon the rotational properties of a Mueller matrix. The sample is placed in the polarimeter in a precision rotation stage. The Mueller matrix is th ...

16. Basic Considerations of Densitometer Adjustment and Calibration
Topic: Optical Metrology
Published: 12/20/1972
Author: R E Swing

17. Bilateral optical power meter comparison between NIST and CENAM
Topic: Optical Metrology
Published: 7/1/2008
Authors: Igor Vayshenker, J. Bermudez, J. Molina, Z. Ruiz, David J Livigni, Xiaoyu X. Li, John H Lehman
Abstract: We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wave ...

18. Binary amplitude holograms made from dyed photoresist
Topic: Optical Metrology
Published: 5/13/2011
Authors: Quandou Wang, Ulf Griesmann, John H Burnett
Abstract: A method for fabricating binary amplitude holograms from a dyed photoresist is described. It is of particular interest for holograms that are used as null lenses in the form metrology of aspheric surfaces and wavefronts. A pigment that stron ...

19. Broadband coherent spectroscopy in the near infrared using dual coherent frequency combs
Topic: Optical Metrology
Published: 8/15/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Fiber-based frequency combs can provide broadband coherent light that enables new possibilities for high-accuracy, high-resolution broadband spectroscopy. We use a configuration with two coherently phase-locked combs; the output of one comb passes th ...

20. CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm
Topic: Optical Metrology
Published: 6/2/2009
Authors: Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E Gibson, Howard W Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
Abstract: In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Fi ...

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