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Topic Area: Optical Metrology
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Displaying records 91 to 100 of 118 records.
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91. Quantum radiometry
Topic: Optical Metrology
Published: 5/2/2009
Authors: Sergey V Polyakov, Alan L Migdall
Abstract: We review radiometric techniques that take advantage of photon counting and stem from the quantum laws of nature. We present a brief history of metrological experiments and review the current state of experimental quantum radiometry.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902273

92. Rapid and precise absolute distance measurements at long range
Topic: Optical Metrology
Published: 6/1/2009
Authors: Ian R Coddington, William C Swann, Ljerka Nenadovic, Nathan Reynolds Newbury
Abstract: The ability to determine absolute distance to an object is one of the most basic measurements of remote sensing. High precision ranging has important applications in both large-scale manufacturing and in future tight formation-flying satellite missio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901111

93. Realisation of an accurate and repeatable wavelength scale for double subtractive monochromators
Topic: Optical Metrology
Published: 10/30/2012
Author: Malcolm Graham White
Abstract: We present the results and discussion of two methods for achieving a higher degree of wavelength accuracy of double grating monochromators. In particular, we assessed the benefits of using differential evolution curve fitting techniques to minimi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911386

94. Report on the Extension of the Real-Time Testing System to Microscope Systems
Topic: Optical Metrology
Published: 11/1/1972
Author: D Nyyssonan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620030

95. Report on the Linear Microdensitometer Study
Topic: Optical Metrology
Published: 11/1/1972
Author: D Nyyssonan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620031

96. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Optical Metrology
Published: 7/29/2014
Authors: Ravikiran Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

97. SCATTERFIELD MICROSCOPY, REVIEW OF TECHNIQUES THAT PUSH THE FUNDAMENTAL LIMITS OF OPTICAL DEFECT METROLOGY
Topic: Optical Metrology
Published: 3/25/2013
Authors: Richard M Silver, Bryan M Barnes, Francois R. Goasmat, Hui Zhou, Martin Y Sohn
Abstract: The semiconductor manufacturing industry is now facing serious challenges in achieving defect detection rates with acceptable throughput and accuracy. With conventional bright-field and dark- field inspection methods now at their limits, it has b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913246

98. Scalable multiplexed detector system for high-rate telecom-bandsingle-photon detection
Topic: Optical Metrology
Published: 11/25/2009
Authors: Sergey V Polyakov, Alan L Migdall, Giorgio Brida, Ivo P Degiovanni, Fabrizio Piacentini, V Schettini
Abstract: We present a photon-counting detection system at telecom wavelengths that overcomes the difficulties of photon-counting at high rates. Our detection system uses active multiplexing, an array of N detectors, and a 1-by-N optical switch with a control ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902508

99. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Optical Metrology
Published: 5/15/2014
Authors: Bonghwan Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381

100. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Optical Metrology
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913528



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