NIST logo

Publications Portal

You searched on:
Topic Area: Optical Metrology
Sorted by: title

Displaying records 91 to 100 of 139 records.
Resort by: Date / Title

91. Non-Destructive Characterization of the Morphology of a Polymer Co-Extruded Scaffold Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 12/19/2001
Authors: Joy P Dunkers, N Washburn, Carl George Simon Jr, Alamgir Karim, Eric J. Amis
Abstract: It is generally understood that a complex interaction of many variables controls the success of cell infiltration, proliferation, and differentiation within a tissue scaffold. One parameter that has a large influence on the development of functionin ...

92. Optical Coherence Tomography of Glass Reinforced Polymer Composites
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, Richard~undefined~undefined~undefined~undefined~undefined Parnas, C G Zimba, R C Peterson, Kathleen M. Flynn, J G Fujimoto, B E Bouma
Abstract: Optical coherence tomography (OCT) is a non-destructive and non-contact technique to image microstructure within scattering media. The application of OCT to highly scattering materials such as polymer composites is especially challenging. In this w ...

93. Optical Measurements of OLED Panels for Lighting Applications
Topic: Optical Metrology
Published: 7/22/2013
Authors: Tokihisa Kawabata, Yoshihiro Ohno
Abstract: Optical characteristics of OLED panels have been investigated for the purpose of developing a test method for OLED panels for lighting applications. The electrical characteristics, total luminous flux and chromaticity (x, y), and their dependence ...

94. Optical constants and spatial uniformity of thermally grown oxide layer of custom, induced-junction, silicon photodiodes for a predictable quantum efficient detector
Topic: Optical Metrology
Published: 6/28/2013
Author: Malcolm Graham White
Abstract: We have investigated the optical properties of self-induced inversion-layer silicon photodiodes using spectroscopic ellipsometric measurement techniques. We report a self-consistent data set and dispersion relation for the optical constants of th ...

95. Photomask metrology using a 193 nm scatterfield microscope
Topic: Optical Metrology
Published: 9/30/2009
Authors: Richard Quintanilha, Bryan M Barnes, Martin Y Sohn, Lowell P. Howard, Richard M Silver, James Edward Potzick, Michael T. Stocker
Abstract: The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. The calibration of this mask has been ...

96. Physica B&Cl Parameters in High-Accuracy Spectrophotometry
Topic: Optical Metrology
Published: 5/31/1972
Author: Klaus Mielenz

97. Polarization-sensitive linear optical sampling for characterization of polarization-multiplexed QPSK
Topic: Optical Metrology
Published: 3/20/2009
Authors: Paul A Williams, Tasshi Dennis, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We describe polarization-sensitive phase-referenced linear optical sampling for measuring polarization, amplitude, and phase of a high speed optical waveform. With a single measurement, we simultaneously measure both orthogonal polarization channels ...

98. Power Spectral Density: Is it right?
Topic: Optical Metrology
Published: 6/13/2010
Authors: Ulf Griesmann, John Lehan, Jiyoung Chu
Abstract: We concentrate on the instrumental issues surrounding power spectral density (PSD) determination, using as an example, the most common optical shop QA tool, the Fizeau interferometer. We briefly discuss the properties of an ideal calibration method ...

99. Practical Use and Calculation of CCT and Duv
Topic: Optical Metrology
Published: 10/18/2013
Author: Yoshihiro Ohno
Abstract: The Correlated Color Temperature (CCT) is often used to represent chromaticity of white light sources, but chromaticity is two-dimensional, and another dimension, the distance from the Planckian locus, is often missing. Duv is defined in ANSI C78.377 ...

100. Precise Measurement of Lunar Spectral Irradiance at Visible Wavelengths
Series: Journal of Research (NIST JRES)
Report Number: 118.020
Topic: Optical Metrology
Published: 11/12/2013
Authors: Keith R Lykke, John Taylor Woodward IV, Allan W. Smith
Abstract: We report a measurement of lunar spectral irradiance with an uncertainty below 1 % from 420 nm to 1000 nm. This measurement uncertainty meets the stability requirement for many climate data records derived from satellite images, including those f ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series