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Topic Area: Optical Metrology
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Displaying records 71 to 80 of 138 records.
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71. A Toolbox for Designing and Analyzing Phase-Shifting Interferometry Algorithms with Characteristic Polynomials
Topic: Optical Metrology
Published: 6/13/2010
Author: Ulf Griesmann
Abstract: Many of the recent advances in understanding of phase-shifting algorithms have yet to be incorporated into the software for commercial phase shifting interferometers. A toolbox, for the open-source computer algebra system Maxima, simplifies analysis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905043

72. Power Spectral Density: Is it right?
Topic: Optical Metrology
Published: 6/13/2010
Authors: Ulf Griesmann, John Lehan, Jiyoung Chu
Abstract: We concentrate on the instrumental issues surrounding power spectral density (PSD) determination, using as an example, the most common optical shop QA tool, the Fizeau interferometer. We briefly discuss the properties of an ideal calibration method ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905045

73. Rationale of Color Quality Scale
Topic: Optical Metrology
Published: 6/10/2010
Authors: Yoshihiro Ohno, Wendy L Davis
Abstract: The color quality of solid state lighting (SSL) products is critical and is the subject of increasing attention. The CIE Color Rendering Index (CRI) [1] has been widely used for many years. However, the CRI is 35 years old and various problems of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905946

74. Monitoring Photothermally Excited Nanoparticles via Multimodal Microscopy
Topic: Optical Metrology
Published: 5/19/2010
Authors: Matthew Lawrence Clarke, Shin G. Chou, Jeeseong Hwang
Abstract: Generation of heat using optically excited nanoparticles can be beneficial or detrimental depending on the application. Therefore, clinically applicable studies are being pursued in an effort to achieve safe practices of nanoparticle-induced hyperth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905276

75. Dual frequency combs at 3.4 µm with subhertz residual linewidths
Topic: Optical Metrology
Published: 5/1/2010
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: Two coherent 1.5-µm frequency combs are transferred to 3.4 µm by difference frequency generation with a 1064 nm cw laser. From a multi-heterodyne measurement, the residual linewidth between the comb teeth is resolution-limited at 200 mHz.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904566

76. Time-domain spectroscopy of the optical free-induction decay from vibrating molecules
Topic: Optical Metrology
Published: 4/26/2010
Authors: Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: Time-domain spectroscopy using dual, coherent frequency combs is used to measure free-induction decay from a molecular gas sample in the near-IR with a time-domain signal-to-noise ratio of ~10^u6^ over a ~6 ns window at 55 fs time resolution (corresp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903774

77. Deformation-Free Form Error Measurements of Thin, Plane-Parallel Optics Floated on a Heavy Liquid
Topic: Optical Metrology
Published: 4/1/2010
Authors: JiYoung Chu, Ulf Griesmann, Quandou Wang, Johannes A Soons, Eric C Benck
Abstract: We describe a novel method for measuring the unconstrained flatness error of thin, plane parallel precision optics by floating them on high-density aqueous metatungstate solutions while measuring the flatness error with an interferometer. The supp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904728

78. Internal quantum efficiency modeling of silicon photodiodes
Topic: Optical Metrology
Published: 4/1/2010
Authors: Thomas R. Gentile, Steven W Brown, Keith R Lykke, Ping-Shine Shaw, John Taylor Woodward IV
Abstract: Results are presented for modeling of the internal quantum efficiency (IQE) of silicon photodiodes in the 400 nm to 900 nm wavelength range. The IQE data are based on measurements of the external quantum efficiencies of three transmission trap detec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904680

79. Enhancing Image Contrast Using Coherent States and Photon Number Resolving Detectors
Topic: Optical Metrology
Published: 3/15/2010
Authors: Aaron Pearlman, Alexander E. Ling, Elizabeth A Goldschmidt, Jingyun Fan, Christoph Wildfeuer, Alan L Migdall
Abstract: We experimentally map the transverse profile of diffraction-limited beams using photon number resolving detectors. We observe strong compression of diffracted beam profiles for high detected photon number. This effect leads to higher contrast than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904224

80. Iron Optical Constants and Reflectance Spectroscopy of Planetary Surfacers
Topic: Optical Metrology
Published: 3/1/2010
Authors: David Blewett, Nhan V Nguyen, Oleg A Kirillov, Samuel Lawrence
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907161



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