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You searched on: Topic Area: Optical Metrology Sorted by: date

Displaying records 31 to 40 of 48 records.
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31. Monitoring Photothermally Excited Nanoparticles via Multimodal Microscopy
Topic: Optical Metrology
Published: 5/19/2010
Authors: Matthew Lawrence Clarke, Shin G. Chou, Jeeseong Hwang
Abstract: Generation of heat using optically excited nanoparticles can be beneficial or detrimental depending on the application. Therefore, clinically applicable studies are being pursued in an effort to achieve safe practices of nanoparticle-induced hyperth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905276

32. Dual frequency combs at 3.4 µm with subhertz residual linewidths
Topic: Optical Metrology
Published: 5/1/2010
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: Two coherent 1.5-µm frequency combs are transferred to 3.4 µm by difference frequency generation with a 1064 nm cw laser. From a multi-heterodyne measurement, the residual linewidth between the comb teeth is resolution-limited at 200 mHz.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904566

33. Enhancing Image Contrast Using Coherent States and Photon Number Resolving Detectors
Topic: Optical Metrology
Published: 3/15/2010
Authors: Aaron Pearlman, Alexander E. Ling, Elizabeth A Goldschmidt, Jingyun Fan, Christoph Wildfeuer, Alan L Migdall
Abstract: We experimentally map the transverse profile of diffraction-limited beams using photon number resolving detectors. We observe strong compression of diffracted beam profiles for high detected photon number. This effect leads to higher contrast than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904224

34. Iron Optical Constants and Reflectance Spectroscopy of Planetary Surfacers
Topic: Optical Metrology
Published: 3/1/2010
Authors: David Blewett, Nhan V Nguyen, Oleg A Kirillov, Samuel Lawrence
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907161

35. Low-Cost, High-Throughput, Automated Counting of Bacterial Colonies
Topic: Optical Metrology
Published: 1/5/2010
Authors: Matthew Lawrence Clarke, Robert L Burton, A. Nayo Hill, Maritoni Abatayo Litorja, Moon H. Nahm, Jeeseong Hwang
Abstract: Research involving bacterial pathogens often requires enumeration of bacteria colonies. Here we present a low-cost, high-throughput colony counting system consisting of colony counting software and a consumer-grade digital camera or document scanner ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904106

36. Scalable multiplexed detector system for high-rate telecom-bandsingle-photon detection
Topic: Optical Metrology
Published: 11/25/2009
Authors: Sergey V Polyakov, Alan L Migdall, Giorgio Brida, Ivo P Degiovanni, Fabrizio Piacentini, V Schettini
Abstract: We present a photon-counting detection system at telecom wavelengths that overcomes the difficulties of photon-counting at high rates. Our detection system uses active multiplexing, an array of N detectors, and a 1-by-N optical switch with a control ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902508

37. Photomask metrology using a 193 nm scatterfield microscope
Topic: Optical Metrology
Published: 9/30/2009
Authors: Richard Quintanilha, Bryan M Barnes, Martin Y Sohn, Lowell P. Howard, Richard M Silver, James Edward Potzick, Michael T. Stocker
Abstract: The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. The calibration of this mask has been ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903929

38. CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm
Topic: Optical Metrology
Published: 6/2/2009
Authors: Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E Gibson, Howard W Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
Abstract: In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Fi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900253

39. Rapid and precise absolute distance measurements at long range
Topic: Optical Metrology
Published: 6/1/2009
Authors: Ian R Coddington, William C Swann, Ljerka Nenadovic, Nathan Reynolds Newbury
Abstract: The ability to determine absolute distance to an object is one of the most basic measurements of remote sensing. High precision ranging has important applications in both large-scale manufacturing and in future tight formation-flying satellite missio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901111

40. Illuminance responsivity calibration of reference photometers at the NIST SIRCUS and SCF facilities
Topic: Optical Metrology
Published: 5/29/2009
Authors: George P Eppeldauer, Carl C Miller, Thomas C Larason, Yoshihiro Ohno
Abstract: The illuminance responsivities of two transfer standard photometers have been directly determined from their spectral responsivity calibrations at two different calibration facilities of NIST. The main characteristics of the two photometers, and thei ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902807



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