NIST logo

Publications Portal

You searched on: Topic Area: Optical Metrology Sorted by: date

Displaying records 1 to 10 of 61 records.
Resort by: Date / Title

1. On-Chip Integrated Silicon Photonic Thermometers
Topic: Optical Metrology
Published: 9/1/2015
Authors: Nikolai Nikolayevich Klimov, Thomas P Purdy, Zeeshan Ahmed
Abstract: The fundamental limitations of resistance-based thermometry and the desire to reduce sensor ownership have produced considerable interest in the development of photonics-based temperature sensors as an alternative to resistance thermometers. Photonic ...

2. Integrated silicon optomechanical transducers and their application in atomic force microscopy
Topic: Optical Metrology
Published: 7/31/2015
Authors: Jie J. Zou, Marcelo Ishihara Davanco, Yuxiang Liu, Thomas Michels, Kartik A Srinivasan, Vladimir A Aksyuk

3. MEMS optomechanical accelerometry standards
Topic: Optical Metrology
Published: 7/8/2015
Authors: Felipe Guzman, Yiliang Bao, Jason John Gorman, John Russell Lawall, Jacob M Taylor, Thomas W LeBrun
Abstract: Current acceleration primary standards reach relative uncertainties of the order of 0.001 and consist of complex test facilities, typically operated at National Metrology Institutes. Our research focuses on the development of silicon mechanical os ...

4. Optomechanical Motion Sensors
Topic: Optical Metrology
Published: 7/8/2015
Authors: Felipe Guzman, Oliver Gerberding, John T. Melcher, Julian Stirling, Jon Robert Pratt, Gordon Allan Shaw, Jacob M Taylor
Abstract: Compact optical cavities can be combined with motion sensors to yield unprecedented resolution and SI-traceability in areas such as acceleration sensing and atomic force microscopy AFM, among others. We have incorporated Fabry-Perot fiber-optic m ...

5. Single-Photon Detector Calibration
Topic: Optical Metrology
Published: 7/7/2015
Author: Sergey V Polyakov
Abstract: In this chapter we introduce the set of detector properties, common to most contemporary detectors, that should be determined for a complete characterization. Then we introduce methods for detector characterization, and finally we present practical ...

6. Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-Atom Chain Using Photon-Momentum-Based Force Calibration
Topic: Optical Metrology
Published: 12/22/2014
Authors: Douglas T Smith, Jon Robert Pratt
Abstract: We present instrumentation and methodology for simultaneously measuring force and displacement at the atomic scale at 4 K. The technique, which uses a macroscopic cantilever as a force sensor and high-resolution, high-stability fiber-optic interfero ...

7. Experimental Bounds on Classical Random Field Theories
Topic: Optical Metrology
Published: 12/10/2014
Authors: Joffrey Kent Peters, Sergey V Polyakov, Jingyun Fan, Alan L Migdall
Abstract: Alternative theories to quantum mechanics motivate important fundamental tests of our understanding and description of the smallest physical systems. Here we place experimental limits on those classical field theories which result in power-depend ...

8. Progress toward Radiation-Pressure-Based Measurement of High-Power Laser Emission - Under Policy Review
Topic: Optical Metrology
Published: 10/6/2014
Authors: Paul A Williams, Joshua Aram Hadler, Daniel King, Robert Lee, Frank C. Maring, Gordon Allan Shaw, Nathan A Tomlin, John H Lehman, Marla L Dowell
Abstract: We present an overview of our efforts toward using optical radiation pressure as a means to measure optical power from high-power lasers. Early results with measurements ranging from tens of watts to 92 kW prove the concept, but validation uncertaint ...

9. Superconducting nanowire single photon detectors fabricated from an amorphous Mo0.75Ge0.25 thin-film
Topic: Optical Metrology
Published: 7/15/2014
Authors: Varun Boehm Verma, Adriana Eleni Lita, Michael R Vissers, Francesco Marsili, David P Pappas, Richard P Mirin, Sae Woo Nam
Abstract: We present the characteristics of superconducting nanowire single photon detectors (SNSPDs) fabricated from amorphous Mo0.75Ge0.25 thin -films. Fabricated devices show a saturation of the internal detection efficiency at temperatures below 1 K, w ...

10. An analysis of the nonlinear spectral mixing of didymium and soda-lime glass beads using hyperspectral imagery (HSI) microscopy
Topic: Optical Metrology
Published: 6/13/2014
Authors: Ronald Resmini, Robert S Rand, Christopher Deloye, David W Allen
Abstract: Nonlinear spectral mixing occurs when materials are intimately mixed. Intimate mixing is a common characteristic of granular materials such as soils. A linear spectral unmixing inversion applied to a nonlinear mixture will yield subpixel abundance es ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series