NIST logo

Publications Portal

You searched on:
Topic Area: Optical Metrology
Sorted by: date

Displaying records 1 to 10 of 138 records.
Resort by: Date / Title


1. Validation of Spectral Radiance Assignments to Integrating Sphere Radiance Standards for the Advanced Baseline Imager
Topic: Optical Metrology
Published: 9/22/2014
Authors: Bettye C Johnson, Stephen E Maxwell, Eric L Shirley, Kim Slack, Gary Graham
Abstract: The Advanced Baseline Imager (ABI) is the next generation imaging sensor for NOAA‰s operational meteorological satellites in geostationary orbit. One pathway for traceability of the visible and near infrared radiometric response for ABI is to a 1.65 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916420

2. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Optical Metrology
Published: 7/29/2014
Authors: Ravikiran (Ravikiran) Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

3. Holographic radius test plates for spherical surfaces with large radius of curvature
Topic: Optical Metrology
Published: 7/9/2014
Authors: Quandou Wang, Ulf Griesmann, Johannes A Soons
Abstract: We describe a novel interferometric method, based on nested Fresnel zone lenses or photon sieves, for testing and measuring the radius of curvature of precision spherical surfaces that have radii in a range between several meters to few hundred meter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913959

4. Figure metrology for x-ray focusing mirrors with Fresnel holograms and photon sieves
Topic: Optical Metrology
Published: 6/20/2014
Authors: Ulf Griesmann, Johannes A Soons, Quandou Wang, Lahsen Assoufid
Abstract: We report on interferometric measurements of the figure error of an ultra-precise mirror with the shape of an elliptical toroid for the diffraction limited focusing of hard x-rays from an undulator x-ray source. We describe measurement configuratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914758

5. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Optical Metrology
Published: 5/15/2014
Authors: Bonghwan Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381

6. NIST traceable measurements of radiance and luminance levels of night-vision-goggle test-instruments
Topic: Optical Metrology
Published: 5/7/2014
Authors: George P Eppeldauer, Vyacheslav B Podobedov
Abstract: In order to perform radiance and luminance level measurements of night-vision-goggle (NVG) test instruments, NIST developed new-generation transfer-standard radiometers (TR). The new TRs can perform low-level radiance and luminance measurements with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916064

7. Precise Measurement of Lunar Spectral Irradiance at Visible Wavelengths
Series: Journal of Research (NIST JRES)
Report Number: 118.020
Topic: Optical Metrology
Published: 11/12/2013
Authors: Keith R Lykke, John Taylor Woodward IV, Allan W. Smith
Abstract: We report a measurement of lunar spectral irradiance with an uncertainty below 1 % from 420 nm to 1000 nm. This measurement uncertainty meets the stability requirement for many climate data records derived from satellite images, including those f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913841

8. Practical Use and Calculation of CCT and Duv
Topic: Optical Metrology
Published: 10/18/2013
Author: Yoshihiro Ohno
Abstract: The Correlated Color Temperature (CCT) is often used to represent chromaticity of white light sources, but chromaticity is two-dimensional, and another dimension, the distance from the Planckian locus, is often missing. Duv is defined in ANSI C78.377 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912622

9. Report of the Key Comparison CCPR-K5 Spectral Diffuse Reflectance
Topic: Optical Metrology
Published: 10/2/2013
Authors: Yoshihiro Ohno, Maria E Nadal, Kenneth L Eckerle, E. A. Early
Abstract: This is an official report from Consultative Committee of Photometry and Radiometry (CCPR) on the Key Comparison CCPR-K5 spectral diffuse reflectance, conducted in the framework of CIPM Mutual Recognition Arrangement (MRA). 13 national laboratories ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913968

10. Assessing consistency of a Mueller matrix measurement by rotation of the sample under test
Topic: Optical Metrology
Published: 9/27/2013
Author: Thomas Avery Germer
Abstract: We present a method for checking the consistency of a Mueller matrix measurement. The method is based upon the rotational properties of a Mueller matrix. The sample is placed in the polarimeter in a precision rotation stage. The Mueller matrix is th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914354



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series