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Topic Area: Optical Metrology

Displaying records 81 to 90 of 117 records.
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81. Polarization-sensitive linear optical sampling for characterization of polarization-multiplexed QPSK
Topic: Optical Metrology
Published: 3/20/2009
Authors: Paul A Williams, Tasshi Dennis, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We describe polarization-sensitive phase-referenced linear optical sampling for measuring polarization, amplitude, and phase of a high speed optical waveform. With a single measurement, we simultaneously measure both orthogonal polarization channels ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900133

82. High-performance, vibration-immune, fiber-laser frequency comb
Topic: Optical Metrology
Published: 3/1/2009
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We demonstrate an environmentally robust optical frequency comb based on a polarization-maintaining, allfiber, figure-eight laser. The comb is phase locked to a cavity-stabilized cw laser by use of an intracavity electro-optic phase modulator yieldin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900877

83. Choosing the right detector for laser power and energy measurements
Topic: Optical Metrology
Published: 10/1/2008
Author: Marla L Dowell
Abstract: You may not realize the importance of good laser metrology and its many pitfalls until you realize how much of today‰s commonplace conveniences ‹ from long distance communications to LASIK (laser-assisted in situ keratomileusis) to state-of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33180

84. Infrared Absolute Calibrations Down to 10 fW in Low-Temperature Environments at NIST
Topic: Optical Metrology
Published: 7/22/2008
Authors: Adriaan Carl Linus Carter, Raju Vsnu Datla, Timothy Jung, Solomon Woods
Abstract: The Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology (NIST) is responsible for absolute IR radiometric calibrations (SI traceable) in low-background temperature (below 80 K) environments. IR radiometric te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842510

85. NEW PRACTICAL METHOD FOR MEASUREMENT OF HIGH-POWER LEDS
Topic: Optical Metrology
Published: 7/11/2008
Authors: Yuqin Zong, Yoshihiro Ohno
Abstract: The measurement of high-power light emitting diodes (LEDs) has been difficult because they are highly sensitive to thermal operating conditions, and there has been a lack of common methods that can be used by both LED manufactures and users to acquir ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842561

86. NIST Goniospectrometer for Surface Color Measurements
Topic: Optical Metrology
Published: 7/7/2008
Authors: Maria E Nadal, Gael Obein
Abstract: The goniospectrometer at the National Institute of Standards and Technology (NIST) can measure the spectral reflectance of colored samples over a wide range of illumination and viewing angles. This capability is important for the colorimetric charact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842549

87. Bilateral optical power meter comparison between NIST and CENAM
Topic: Optical Metrology
Published: 7/1/2008
Authors: Igor Vayshenker, J. Bermudez, J. Molina, Z. Ruiz, David J Livigni, Xiaoyu X. Li, John H Lehman
Abstract: We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33044

88. Dual-CGH Interferometry Test for X-Ray Mirror Mandrels
Topic: Optical Metrology
Published: 6/15/2008
Authors: Guangjun Gao, John Lehan, Ulf Griesmann
Abstract: We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902515

89. Extraction of trench geometry and linewidth of nanoscale grating targets in (110)-oriented silicon using angle-resolved scatterometry
Topic: Optical Metrology
Published: 6/9/2008
Authors: Heather J Patrick, Thomas Avery Germer, Michael W Cresswell, Bin Li, Huai Huang, Paul S. Ho
Abstract: The extraction of nanoscale dimensions and feature geometry of grating targets using signature-based optical techniques is an area of continued interest in semiconductor manufacturing. In the current work, we have performed angle-resolved scatterome ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842548

90. Characterization of an Optical Time Domain Reflectometer Calibrator
Topic: Optical Metrology
Published: 3/1/2007
Authors: Donald R Larson, Nicholas G Paulter Jr, Kenneth C Blaney
Abstract: We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers. This instrument implements the Telecommunications Industry Association standard TIA/EIA-455- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32449



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