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Topic Area: Optical Metrology

Displaying records 51 to 60 of 118 records.
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51. High precision, broadband optical measurements with fiber laser frequency combs
Topic: Optical Metrology
Published: 11/2/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Optical frequency combs have been used extensively, and with remarkable success, to measure the absolute frequency of cw lasers. The use of frequency combs has also expanded to include applications such as precision ranging, component metrology, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907200

52. Fast high-resolution frequency agile spectroscopy of laser sources
Topic: Optical Metrology
Published: 10/24/2010
Authors: Fabrizio Raphael Giorgetta, Ian R Coddington, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Time-resolved, high-accuracy and high-resolution spectroscopy of frequency-agile cw lasers is critical to realizing their full potential for sensing, but is not possible with conventional spectroscopy methods. We demonstrate a dual comb-based spectro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905724

53. Broadband coherent spectroscopy in the near infrared using dual coherent frequency combs
Topic: Optical Metrology
Published: 8/15/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Fiber-based frequency combs can provide broadband coherent light that enables new possibilities for high-accuracy, high-resolution broadband spectroscopy. We use a configuration with two coherently phase-locked combs; the output of one comb passes th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906584

54. Supercontinuum fiber laser source for reflectance calibrations in remote sensing
Topic: Optical Metrology
Published: 8/1/2010
Authors: Clarence Joseph Zarobila, Heather J Patrick
Abstract: The Optical Technology Division of the NIST provides reference measurements of specular and diffuse reflectance of materials, including measurements that provide traceability for diffuser plaques that are used as onboard calibration standards in remo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906175

55. Flatness measurements of thin, plane-parallel optics floated on a heavy liquid
Topic: Optical Metrology
Published: 6/23/2010
Authors: Ulf Griesmann, Quandou Wang, Eric C Benck, Jiyoung Chu, Jaewoong Sohn
Abstract: no abstract
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905895

56. A Simple Method to Improve Etching Uniformity when Making Phase Type CGHs on a Thick Glass Substrate
Topic: Optical Metrology
Published: 6/13/2010
Author: Quandou Wang
Abstract: A simple method to optimize the etching uniformity when making a Computer generated halogram on a thick optical glass substrate is described, which uses a Teflon ring to enclose the substrate during reactive-ion etching (RIE).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905044

57. A Toolbox for Designing and Analyzing Phase-Shifting Interferometry Algorithms with Characteristic Polynomials
Topic: Optical Metrology
Published: 6/13/2010
Author: Ulf Griesmann
Abstract: Many of the recent advances in understanding of phase-shifting algorithms have yet to be incorporated into the software for commercial phase shifting interferometers. A toolbox, for the open-source computer algebra system Maxima, simplifies analysis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905043

58. Power Spectral Density: Is it right?
Topic: Optical Metrology
Published: 6/13/2010
Authors: Ulf Griesmann, John Lehan, Jiyoung Chu
Abstract: We concentrate on the instrumental issues surrounding power spectral density (PSD) determination, using as an example, the most common optical shop QA tool, the Fizeau interferometer. We briefly discuss the properties of an ideal calibration method ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905045

59. Monitoring Photothermally Excited Nanoparticles via Multimodal Microscopy
Topic: Optical Metrology
Published: 5/19/2010
Authors: Matthew Lawrence Clarke, Shin G. Chou, Jeeseong Hwang
Abstract: Generation of heat using optically excited nanoparticles can be beneficial or detrimental depending on the application. Therefore, clinically applicable studies are being pursued in an effort to achieve safe practices of nanoparticle-induced hyperth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905276

60. Dual frequency combs at 3.4 µm with subhertz residual linewidths
Topic: Optical Metrology
Published: 5/1/2010
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: Two coherent 1.5-µm frequency combs are transferred to 3.4 µm by difference frequency generation with a 1064 nm cw laser. From a multi-heterodyne measurement, the residual linewidth between the comb teeth is resolution-limited at 200 mHz.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904566



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