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You searched on: Topic Area: Optical Metrology

Displaying records 51 to 60 of 70 records.
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51. High precision, broadband optical measurements with fiber laser frequency combs
Topic: Optical Metrology
Published: 11/2/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Optical frequency combs have been used extensively, and with remarkable success, to measure the absolute frequency of cw lasers. The use of frequency combs has also expanded to include applications such as precision ranging, component metrology, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907200

52. Fast high-resolution frequency agile spectroscopy of laser sources
Topic: Optical Metrology
Published: 10/24/2010
Authors: Fabrizio Raphael Giorgetta, Ian R Coddington, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Time-resolved, high-accuracy and high-resolution spectroscopy of frequency-agile cw lasers is critical to realizing their full potential for sensing, but is not possible with conventional spectroscopy methods. We demonstrate a dual comb-based spectro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905724

53. Monitoring Photothermally Excited Nanoparticles via Multimodal Microscopy
Topic: Optical Metrology
Published: 5/19/2010
Authors: Matthew Lawrence Clarke, Shin G. Chou, Jeeseong Hwang
Abstract: Generation of heat using optically excited nanoparticles can be beneficial or detrimental depending on the application. Therefore, clinically applicable studies are being pursued in an effort to achieve safe practices of nanoparticle-induced hyperth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905276

54. Dual frequency combs at 3.4 µm with subhertz residual linewidths
Topic: Optical Metrology
Published: 5/1/2010
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: Two coherent 1.5-µm frequency combs are transferred to 3.4 µm by difference frequency generation with a 1064 nm cw laser. From a multi-heterodyne measurement, the residual linewidth between the comb teeth is resolution-limited at 200 mHz.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904566

55. Enhancing Image Contrast Using Coherent States and Photon Number Resolving Detectors
Topic: Optical Metrology
Published: 3/15/2010
Authors: Aaron Pearlman, Alexander E. Ling, Elizabeth A. Goldschmidt, Jingyun Fan, Christoph Wildfeuer, Alan L Migdall
Abstract: We experimentally map the transverse profile of diffraction-limited beams using photon number resolving detectors. We observe strong compression of diffracted beam profiles for high detected photon number. This effect leads to higher contrast than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904224

56. Iron Optical Constants and Reflectance Spectroscopy of Planetary Surfacers
Topic: Optical Metrology
Published: 3/1/2010
Authors: David Blewett, Nhan V Nguyen, Oleg A Kirillov, Samuel Lawrence
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907161

57. Low-Cost, High-Throughput, Automated Counting of Bacterial Colonies
Topic: Optical Metrology
Published: 1/5/2010
Authors: Matthew Lawrence Clarke, Robert L Burton, A. Nayo Hill, Maritoni Abatayo Litorja, Moon H. Nahm, Jeeseong Hwang
Abstract: Research involving bacterial pathogens often requires enumeration of bacteria colonies. Here we present a low-cost, high-throughput colony counting system consisting of colony counting software and a consumer-grade digital camera or document scanner ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904106

58. Scalable multiplexed detector system for high-rate telecom-bandsingle-photon detection
Topic: Optical Metrology
Published: 11/25/2009
Authors: Sergey V Polyakov, Alan L Migdall, Giorgio Brida, Ivo P Degiovanni, Fabrizio Piacentini, V Schettini
Abstract: We present a photon-counting detection system at telecom wavelengths that overcomes the difficulties of photon-counting at high rates. Our detection system uses active multiplexing, an array of N detectors, and a 1-by-N optical switch with a control ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902508

59. Photomask metrology using a 193 nm scatterfield microscope
Topic: Optical Metrology
Published: 9/30/2009
Authors: Richard Quintanilha, Bryan M Barnes, Martin Y Sohn, Lowell P. Howard, Richard M Silver, James Edward Potzick, Michael T. Stocker
Abstract: The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. The calibration of this mask has been ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903929

60. CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm
Topic: Optical Metrology
Published: 6/2/2009
Authors: Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E Gibson, Howard W Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
Abstract: In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Fi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900253



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