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Topic Area: Optical Metrology

Displaying records 41 to 50 of 138 records.
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41. A statistical study of de-embedding applied to eye diagram analysis
Topic: Optical Metrology
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585

42. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Optical Metrology
Published: 12/21/2011
Authors: Ravikiran (Ravikiran) Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395

43. TSOM Method for Nanoelectronics Dimensional Metrology
Topic: Optical Metrology
Published: 11/18/2011
Author: Ravikiran (Ravikiran) Attota
Abstract: Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquirin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908623

44. Microwave generation with low residual phase noise from a femtosecond fiber laser with an intracavity electro-optic modulator
Topic: Optical Metrology
Published: 11/14/2011
Authors: William C Swann, Esther Baumann, Fabrizio Raphael Giorgetta, Nathan Reynolds Newbury
Abstract: Low phase-noise microwave generation has previously been demonstrated using self-referenced frequency combs to divide down a low noise optical reference. We demonstrate an approach based on a fs Er-fiber laser that avoids the complexity of self-r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907443

45. Microwave generation with low residual phase noise from a femtosecond fiber laser with an intracavity electro-optic modulator
Topic: Optical Metrology
Published: 11/14/2011
Authors: William C Swann, Esther Baumann, Fabrizio Raphael Giorgetta, Nathan Reynolds Newbury
Abstract: Low phase-noise microwave generation has previously been demonstrated using self-referenced frequency combs to divide down a low noise optical reference. We demonstrate an approach based on a fs Er-fiber laser that avoids the complexity of self-refer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909568

46. Dual-comb-based characterization of rapidly tuned lasers
Topic: Optical Metrology
Published: 10/10/2011
Authors: Fabrizio Raphael Giorgetta, Esther Baumann, Ian R Coddington, William C Swann, Nathan Reynolds Newbury, Zeb W Barber, Peter Roos
Abstract: We demonstrate a technique to calibrate the instantaneous frequency versus time from a rapidly tuned cw laser. Our dual-comb-based spectrometer can measure optical waveforms tuned at 1500-THz/s rates over 5-THz bandwidths at high precision.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908712

47. THz Spectroscopic Study of Rust Layer on Aged Steel-Reinforced Structural Components
Topic: Optical Metrology
Published: 9/26/2011
Authors: David F Plusquellic, Virgil Provenzano, Shin G. Chou
Abstract: In this study, we use THz-based spectroscopy as a non-destructive diagnostic tool to characterize the corrosion by-products (rust) on aged iron structural components. Even though previous Mossbauer spectroscopic findings suggested the presence of an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907023

48. Fully lithographic fiber-coupled cryogenic radiometer for picowatt powers
Topic: Optical Metrology
Published: 9/19/2011
Authors: Nathan A Tomlin, John H Lehman, Sae Woo Nam
Abstract: A new type of absolute cryogenic radiometer has been fabricated at the microscale level for direct substitution optical fiber power measurements. It consists of three parts: an absorber, electrical heater, and thermometer all on a single micro-machin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908339

49. Increased responsivity pyroelectric radiometer with dome input and temperature control
Topic: Optical Metrology
Published: 7/18/2011
Authors: George P Eppeldauer, Jinan Zeng, Leonard M Hanssen
Abstract: Pyroelectric radiometers with noise-equivalent-power (NEP) close to 1 nW/Hz¿ have been developed to measure less than 1 microwatt radiant power levels at room temperature to 25 micrometer. The radiometers will be used as transfer standards for routin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908993

50. Dimensional Analysis of Through Silicon Vias Using the TSOM Method
Topic: Optical Metrology
Published: 7/12/2011
Authors: Ravikiran (Ravikiran) Attota, Andrew Rudack
Abstract: There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909226



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