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Topic Area: Optical Metrology

Displaying records 31 to 40 of 101 records.
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31. TSOM Method for Semiconductor Metrology
Topic: Optical Metrology
Published: 4/18/2011
Authors: Ravikiran Attota, Ronald G Dixson, John A Kramar, James Edward Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Abstract: Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908177

32. Introduction to special issue on single-photon technologies
Topic: Optical Metrology
Published: 3/10/2011
Authors: Alan L Migdall, Sergey V Polyakov, Jingyun Fan, Ivo Pietro Degiovanni, Jessica Cheung
Abstract: This special issue accompanies the 4th international conference on single-photon technologies held at the National Institute of Standards and Technology (NIST) Boulder in November 2009. This community has met every two years at national metrology ins ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907536

33. Experimental realization of a low-noise heralded single photon source
Topic: Optical Metrology
Published: 1/17/2011
Authors: Alan L Migdall, Sergey V Polyakov, Marco Genovese, Fabrizio Piacentini, I. Ruo Berchera, Ivo P Degiovanni, Giorgio Brida
Abstract: We present a heralded single-photon source with a much lower level of unwanted background photons in the output channel by using the herald photon to control a shutter in the heralded channel. The shutter is implemented using a simple field program ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906225

34. Far Infrared Absorption Measurements of Single Walled Carbon Nanotubes
Topic: Optical Metrology
Published: 1/17/2011
Authors: Shin G Chou, Zeeshan Ahmed, Georgy Samsonidze, Jing Kong, Mildred Dresselhaus, David F Plusquellic
Abstract: Variable temperature high resolution far infrared absorption measurements were carried out for single walled carbon nanotubes samples with different diameter distributions. At a temperature where kBT is significantly lower than the phonon energy, th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906962

35. Fast high-resolution frequency agile spectroscopy of laser sources
Topic: Optical Metrology
Published: 10/24/2010
Authors: Fabrizio Raphael Giorgetta, Ian R Coddington, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Time-resolved, high-accuracy and high-resolution spectroscopy of frequency-agile cw lasers is critical to realizing their full potential for sensing, but is not possible with conventional spectroscopy methods. We demonstrate a dual comb-based spectro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905724

36. Broadband coherent spectroscopy in the near infrared using dual coherent frequency combs
Topic: Optical Metrology
Published: 8/15/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Fiber-based frequency combs can provide broadband coherent light that enables new possibilities for high-accuracy, high-resolution broadband spectroscopy. We use a configuration with two coherently phase-locked combs; the output of one comb passes th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906584

37. Supercontinuum fiber laser source for reflectance calibrations in remote sensing
Topic: Optical Metrology
Published: 8/1/2010
Authors: Clarence Joseph Zarobila, Heather J Patrick
Abstract: The Optical Technology Division of the NIST provides reference measurements of specular and diffuse reflectance of materials, including measurements that provide traceability for diffuser plaques that are used as onboard calibration standards in remo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906175

38. Flatness measurements of thin, plane-parallel optics floated on a heavy liquid
Topic: Optical Metrology
Published: 6/23/2010
Authors: Ulf Griesmann, Quandou Wang, Eric C Benck, Jiyoung Chu, Jaewoong Sohn
Abstract: no abstract
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905895

39. A Simple Method to Improve Etching Uniformity when Making Phase Type CGHs on a Thick Glass Substrate
Topic: Optical Metrology
Published: 6/13/2010
Author: Quandou Wang
Abstract: A simple method to optimize the etching uniformity when making a Computer generated halogram on a thick optical glass substrate is described, which uses a Teflon ring to enclose the substrate during reactive-ion etching (RIE).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905044

40. A Toolbox for Designing and Analyzing Phase-Shifting Interferometry Algorithms with Characteristic Polynomials
Topic: Optical Metrology
Published: 6/13/2010
Author: Ulf Griesmann
Abstract: Many of the recent advances in understanding of phase-shifting algorithms have yet to be incorporated into the software for commercial phase shifting interferometers. A toolbox, for the open-source computer algebra system Maxima, simplifies analysis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905043