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Topic Area: Optical Metrology

Displaying records 1 to 10 of 134 records.
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1. Validation of Spectral Radiance Assignments to Integrating Sphere Radiance Standards for the Advanced Baseline Imager
Topic: Optical Metrology
Published: 9/22/2014
Authors: Bettye C Johnson, Stephen E Maxwell, Eric L Shirley, Kim Slack, Gary Graham
Abstract: The Advanced Baseline Imager (ABI) is the next generation imaging sensor for NOAA‰s operational meteorological satellites in geostationary orbit. One pathway for traceability of the visible and near infrared radiometric response for ABI is to a 1.65 ...

2. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Optical Metrology
Published: 7/29/2014
Authors: Ravikiran (Ravikiran) Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...

3. NIST traceable measurements of radiance and luminance levels of night-vision-goggle test-instruments
Topic: Optical Metrology
Published: 7/2/2014
Authors: George P Eppeldauer, Vyacheslav B Podobedov
Abstract: In order to perform radiance and luminance level measurements of night-vision-goggle (NVG) test instruments, NIST developed new-generation transfer-standard radiometers (TR). The new TRs can perform low-level radiance and luminance measurements with ...

4. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Optical Metrology
Published: 5/15/2014
Authors: Bonghwan Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...

5. Precise Measurement of Lunar Spectral Irradiance at Visible Wavelengths
Series: Journal of Research (NIST JRES)
Report Number: 118.020
Topic: Optical Metrology
Published: 11/12/2013
Authors: Keith R Lykke, John Taylor Woodward IV, Allan W. Smith
Abstract: We report a measurement of lunar spectral irradiance with an uncertainty below 1 % from 420 nm to 1000 nm. This measurement uncertainty meets the stability requirement for many climate data records derived from satellite images, including those f ...

6. Practical Use and Calculation of CCT and Duv
Topic: Optical Metrology
Published: 10/18/2013
Author: Yoshihiro Ohno
Abstract: The Correlated Color Temperature (CCT) is often used to represent chromaticity of white light sources, but chromaticity is two-dimensional, and another dimension, the distance from the Planckian locus, is often missing. Duv is defined in ANSI C78.377 ...

7. Report of the Key Comparison CCPR-K5 Spectral Diffuse Reflectance
Topic: Optical Metrology
Published: 10/2/2013
Authors: Yoshihiro Ohno, Maria E Nadal, Kenneth L Eckerle, E. A. Early
Abstract: This is an official report from Consultative Committee of Photometry and Radiometry (CCPR) on the Key Comparison CCPR-K5 spectral diffuse reflectance, conducted in the framework of CIPM Mutual Recognition Arrangement (MRA). 13 national laboratories ...

8. Assessing consistency of a Mueller matrix measurement by rotation of the sample under test
Topic: Optical Metrology
Published: 9/27/2013
Author: Thomas Avery Germer
Abstract: We present a method for checking the consistency of a Mueller matrix measurement. The method is based upon the rotational properties of a Mueller matrix. The sample is placed in the polarimeter in a precision rotation stage. The Mueller matrix is th ...

9. Fourier Domain Optical Tool Normalization for Quantitative Parametric Image Reconstruction
Topic: Optical Metrology
Published: 9/5/2013
Authors: Jing Qin, Richard M Silver, Bryan M Barnes, Hui Zhou, Francois R. Goasmat
Abstract: There has been much recent work in developing advanced optical metrology methods that use imaging optics for critical dimension measurements and defect detection. Sensitivity to nanometer scale changes has been observed when measuring critical dimens ...

10. Optical Measurements of OLED Panels for Lighting Applications
Topic: Optical Metrology
Published: 7/22/2013
Authors: Tokihisa Kawabata, Yoshihiro Ohno
Abstract: Optical characteristics of OLED panels have been investigated for the purpose of developing a test method for OLED panels for lighting applications. The electrical characteristics, total luminous flux and chromaticity (x, y), and their dependence ...

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