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Displaying records 61 to 70 of 346 records.
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61. Broadband Dielectric Relaxation of Polymer Composite Films
Topic: Electronics & Telecommunications
Published: 1/1/2001
Authors: C. K. Chiang, R Popielarz, R Nozaki, Jan Obrzut
Abstract: The broadband dielectric relaxation of a BaTiO3-polymer composite film was studied. The complex dielectric constant data from 10^u-4^ Hz to 10^u10^ Hz reveals the existence of a relaxation process at a frequency of 10 MHz in the polymer composite. ...

62. Broadband Rydberg Atom Based Self-Calibrating RF E-field Probe
Topic: Electronics & Telecommunications
Published: 8/16/2014
Authors: Christopher L Holloway, Joshua A Gordon, Steven R Jefferts, Thomas Patrick Heavner
Abstract: We present a significantly new approach for an electric (E) field probe. The probe is based on the interaction of RF-fields with Rydberg atoms, where alkali atoms are excited optically to Rydberg states and the applied RF-field alters the resonant st ...

63. COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura
Topic: Electronics & Telecommunications
Published: 7/14/2010
Authors: Katherine MacReynolds, Michael H Francis, Douglas T. Tamura
Abstract: A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the ...

64. Calibration Service for Low-Loss, Three-Terminal Capacitance Standards at 100 kHz and 1 MHz
Series: Technical Note (NIST TN)
Report Number: 1348
Topic: Electronics & Telecommunications
Published: 2/1/1992
Authors: George Free, R. N. Jones

65. Calibration of Antenna Factor at a Ground Screen Field Site Using an Automatic Network Analyzer
Topic: Electronics & Telecommunications
Published: 5/1/1989
Authors: E B Larsen, R. L. Ehret, Dennis G. Camell, Galen H. Koepke

66. Calibration service for instruments that measure laser beam diameter
Series: Special Publication (NIST SP)
Report Number: 250-87
Topic: Electronics & Telecommunications
Published: 7/1/2010
Author: Shao Yang
Abstract: This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this do ...

67. Ceramic Whisker Reinforcement of Dental Resin Composites
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: H H Xu, T A Martin, Joseph M Antonucci, F Eichmiller

68. Certification of Elements in and Use of Standard Reference Material 3280 Multivitamin/Multielement Tablets
Topic: Electronics & Telecommunications
Published: 12/2/2013
Authors: Gregory C. Dr. (Gregory C.) Turk, Katherine E Sharpless, Steven J Christopher, Danielle Cleveland, Russell D Day, Stephen E Long, Elizabeth A Mackey, Anthony F Marlow, Rick L. Paul, John R Sieber, Rabia Oflaz, Laura J Wood, Lee Lijian Yu, Rolf Louis Zeisler, Stephen Albert Wise, James H Yen, E. Greene, J. Harnly, I-P Ho, Joseph M Betz, R. Q. Thompson, Candace Jongsma
Abstract: Standard Reference Material (SRM) 3280 Multivitamin/Multielement Tablets was issued by the National Institute of Standards and Technology (NIST) in 2009 and has certified and reference mass fraction values for 13 vitamins, 26 elements, and 2 caroteno ...

69. Certification of Standard Reference Materials for Bitter Orange
Topic: Electronics & Telecommunications
Published: 7/1/2008
Authors: Lane C Sander, K. Putzbach, Bryant C Nelson, Catherine A Rimmer, Mary Bedner, Jeanice M Brown Thomas, Barbara J. Porter, Laura J Wood, Michele Miller Schantz, Karen E Murphy, Katherine E Sharpless, Stephen Albert Wise, James H Yen, P. H. Siitonen, R. I. Evans, A. NguyenPho, M. C. Roman, J. M. Betz

70. Challenges and Opportunities of Organic Electronics
Topic: Electronics & Telecommunications
Published: 4/2/2010
Author: Calvin Chan

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
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  • SP 823-XX: Integrated Services Digital Network Series