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Displaying records 61 to 70 of 318 records.
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61. Calibration service for instruments that measure laser beam diameter
Series: Special Publication (NIST SP)
Report Number: 250-87
Topic: Electronics & Telecommunications
Published: 7/1/2010
Author: Shao Yang
Abstract: This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this do ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903067

62. Ceramic Whisker Reinforcement of Dental Resin Composites
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: H H Xu, T A Martin, Joseph M Antonucci, F Eichmiller
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853726

63. Certification of Elements in and Use of Standard Reference Material 3280 Multivitamin/Multielement Tablets
Topic: Electronics & Telecommunications
Published: 12/2/2013
Authors: Gregory C Turk, Katherine E Sharpless, Steven J Christopher, Danielle Cleveland, Russell D Day, Stephen E Long, Elizabeth A Mackey, Anthony F Marlow, Rick L Paul, John R Sieber, Rabia Oflaz, Laura J Wood, Lee Lijian Yu, Rolf Louis Zeisler, Stephen A Wise, James H Yen, E. Greene, J. Harnly, I-P Ho, Joseph M Betz, R. Q. Thompson, Candace Jongsma
Abstract: Standard Reference Material (SRM) 3280 Multivitamin/Multielement Tablets was issued by the National Institute of Standards and Technology (NIST) in 2009 and has certified and reference mass fraction values for 13 vitamins, 26 elements, and 2 caroteno ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912503

64. Certification of Standard Reference Materials for Bitter Orange
Topic: Electronics & Telecommunications
Published: 7/1/2008
Authors: Lane C Sander, K. Putzbach, Bryant C Nelson, Catherine A Rimmer, Mary Bedner, Jeanice M Brown Thomas, Barbara J. Porter, Laura J Wood, Michele M Schantz, Karen E Murphy, Katherine E Sharpless, Stephen A Wise, James H Yen, P. H. Siitonen, R. I. Evans, A. NguyenPho, M. C. Roman, J. M. Betz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902882

65. Challenges and Opportunities of Organic Electronics
Topic: Electronics & Telecommunications
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

66. Challenges, Strategies and Opportunities for Measuring Carbon Nanotubes within a Polymer Composites by X-ray Photoelectron Spectroscopy
Series: Special Publication (NIST SP)
Report Number: 1200-10
Topic: Electronics & Telecommunications
Published: 3/14/2015
Authors: Justin M Gorham, Jeremiah Wallace Woodcock, Keana C K Scott
Abstract: FOREWORD This NIST Special Publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917794

67. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Electronics & Telecommunications
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L Billinger, Joseph Paul Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5598

68. Characterization of Composite Microstructure and Damage Using Optical Coherence Tomography
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: Joy P Dunkers, C G Zimba, Kathleen M. Flynn, Donald Lee Hunston, R Prasankumar, X Li, J G Fujimoto
Abstract: Optical coherence tomography (OCT) is a non-destructive and non-contact technique that images microstructure within scattering media. In this work, the versatility of OCT for non-destructive evaluation is demonstrated through imaging of composite mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851542

69. Characterization of On-Wafer Diode Noise Sources
Topic: Electronics & Telecommunications
Published: 6/1/1998
Authors: James Paul Randa, David K Walker, Lawrence P. Dunleavy, Robert L Billinger, Joseph Paul Rice
Abstract: A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27897

70. Checks of Amplifier Noise-Parameter Measurements
Topic: Electronics & Telecommunications
Published: 6/11/2004
Authors: James Paul Randa, David K Walker
Abstract: We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31669



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series