NIST logo

Publications Portal

You searched on: Topic Area: Electronics Telecommunications Sorted by: title

Displaying records 621 to 630 of 753 records.
Resort by: Date / Title


621. Silicon Carbide PiN and Merged PiN Schottky Power Diode Models Implemented in the Saber Circuit Simulator
Topic: Electronics & Telecommunications
Published: 5/1/2004
Authors: Ty R. McNutt, Allen R Hefner Jr., Alan Mantooth, J L. Duliere, David Warren Berning, Ranbir Singh
Abstract: Dynamic electrothermal circuit simulator models are developed for silicon carbide power diodes. The models accurately describe the temperature dependence of on-state characteristics and reverse-recovery switching waveforms. The models are verified fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31565

622. Silicon Carbide Power MOSFET Model and Parameter Extraction Sequence
Topic: Electronics & Telecommunications
Published: 6/11/2003
Authors: Ty R. McNutt, Allen R Hefner Jr., Alan Mantooth, David Warren Berning, Sei-Hyung Ryu
Abstract: A compact circuit simulator model is used to describe the performance of a 2000-V, 5-A 4-H Silicon Carbide (SiC) power DiMOSFET and to perform a detailed comparison with the performance of a widely used 400-V, 5-A Silicon (Si) power MOSFET. The model ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31326

623. Simple Method for the Determination of alpha-Tocopherol and gamma-Tocopherol in Some Oils and in Vitamin E Capsules by HPLC
Topic: Electronics & Telecommunications
Published: 3/1/1987
Authors: A A Moustafa, E M Abdelmoety, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902243

624. Simulating the Dynamic Electro-Thermal Behavior of Power Electronic Circuits and Systems
Topic: Electronics & Telecommunications
Published: 10/1/1993
Authors: Allen R Hefner Jr., David L. Blackburn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5150

625. Simulating the Dynamic Electro-Thermal Behavior of Power Electronic Circuits and Systems
Topic: Electronics & Telecommunications
Published: 12/31/1992
Author: Allen R Hefner Jr.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14148

626. Simulations of Noise-Parameter Uncertainties
Topic: Electronics & Telecommunications
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24469

627. Single Fiber Composites: A New Methodology for Determining Interfacial Shear Strength
Topic: Electronics & Telecommunications
Published: 1/1/2000
Authors: Gale Antrus Holmes, Donald Lee Hunston, Walter G McDonough, R C Peterson
Abstract: One of the critical factors controlling the long-term performance and durability of composites in structural applications is the interfacial shear strength (IFSS). The single fiber composite (SFC) test has been viewed by many as the best test for de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851647

628. Single fiber tensile properties measured by the Kolsky bar using a direct fiber clamping method
Topic: Electronics & Telecommunications
Published: 6/1/2013
Authors: Jae Hyun Kim, Nathanael A Heckert, Walter G McDonough, Kirk D Rice, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914325

629. Small fluctuations in epitaxial growth via conservative noise
Topic: Electronics & Telecommunications
Published: 7/7/2011
Authors: Paul N. Patrone, Rongrong Wang, Dionisios Margetis
Abstract: We study the combined effect of growth (material deposition from above) and nearest-neighbor entropic and force-dipole interactions in a stochastically perturbed system of N line defects (steps) on a vicinal crystal surface in 1+1 dimensions. Firs ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908523

630. Small mass measurements for tuning fork-based force microscope cantilever spring constant calibration
Topic: Electronics & Telecommunications
Published: 6/7/2010
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Cutting edge mass sensors are capable of discriminating mass changes as small as several dozens of atoms, however the smallest mass commercially available from NIST with a calibration traceable to the International System of Units (SI) is 0.5 mg. To ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905829



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series