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Displaying records 621 to 630 of 702 records.
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621. TEM Analysis of Deformation in Thin Films of Aluminum after both AC Thermomechanical and Tensile Deformation
Topic: Electronics & Telecommunications
Published: 4/1/2005
Authors: Roy Howard Geiss, Robert R Keller, David Thomas Read, Yi-Wen Cheng
Abstract: Thin films of sputtered aluminum were deformed by two distinctly different experimental techniques. One experiment comprised of passing high electrical AC current density, 12.2 MA/cm2 at 100 Hz, through 800 ¿¿m long X 3.3 ¿¿m wide and 0.5 ¿¿m thick p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50149

622. TEM Horn Antenna Design Principles
Series: Technical Note (NIST TN)
Report Number: 1544
Topic: Electronics & Telecommunications
Published: 1/23/2007
Authors: Chriss A. Grosvenor, Robert T. Johnk, David R Novotny, Nino Canales, Benjamin Davis, Jason Veneman
Abstract: The National Institute of Standards and Technology has developed several ultra-wideband, TEM Horn antennas with phase linearity, short impulse duration, and a near constant antenna factor. These are time-domain antennas used to measure impulsive fiel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32473

623. TEM horn antennas: A promising new technology for compliance testing
Topic: Electronics & Telecommunications
Published: 8/1/2004
Authors: Chriss A. Grosvenor, Robert T. Johnk, David R Novotny, Seturnino Canales
Abstract: Abstract-This paper discusses the advantages of using a TEM-horn antenna over conventional EMC antennas such as the log-periodic, hybrids, or biconical antennas. Important issues such as frequency coverage, linearity, time-resolution of events, cost, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31664

624. Terahertz imaging and spectroscopy based on hot electron bolometer (HEB) heterodyne detection
Topic: Electronics & Telecommunications
Published: 1/23/2008
Authors: Eyal Gerecht, Lixing You
Abstract: Imaging and spectroscopy at terahertz frequencies have great potential for healthcare, plasma diagnostics, and homeland security applications. Terahertz frequencies correspond to energy level transitions of important molecules in biology and astrophy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32856

625. Terahertz radiometer design for traceable noise-temperature measurements
Topic: Electronics & Telecommunications
Published: 7/14/2006
Authors: Eyal Gerecht, Dazhen Gu, James Paul Randa, David K Walker, Robert L Billinger
Abstract: We report on design of a radiometer for traceable noise-temperature measurements at terahertz frequencies, including noise measurements on cryogenic IF components, development and test of quasi-optical adapter technology, development of black body st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32174

626. Textile Composites: Modelling Strategies
Topic: Electronics & Telecommunications
Published: 1/1/2001
Authors: S V Lomov, G Huysmans, Y Luo, Richard~undefined~undefined~undefined~undefined~undefined Parnas, A Prodromou, I Verpoest, Frederick R Phelan Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853774

627. The Application of Optical Coherence Tomography to Problems in Polymer Matrix Composites
Topic: Electronics & Telecommunications
Published: 1/1/2001
Authors: Joy P Dunkers, Frederick R Phelan Jr, D P Sanders, M J Everett, William H. Green, Donald Lee Hunston, Richard~undefined~undefined~undefined~undefined~undefined Parnas
Abstract: The Composites Group at the National Institute of Standards and Technology has found optical coherence tomography (OCT) to be a powerful tool for non-destructive characterization of polymer matrix composites. Composites often exhibit superior proper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851711

628. The Dependence of the Thermal Electron Attachment Rate Constant in Gases and Liquids on the Energy Position of the Electron Attaching State
Topic: Electronics & Telecommunications
Published: 11/1/1996
Author: Loucas G. Christophorou
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14035

629. The Determination of Near-Field Correction Parameters forCircularly Polarized Probes
Topic: Electronics & Telecommunications
Published: 10/1/1984
Authors: Allen C. Newell, Michael H Francis, D P Kremer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31068

630. The Effect of Processing on Interfacial Shear Properties of Composite Materials
Topic: Electronics & Telecommunications
Published: 1/1/2000
Authors: Walter G McDonough, Joy P Dunkers, Gale Antrus Holmes, Richard~undefined~undefined~undefined~undefined~undefined Parnas
Abstract: The objective of our research was to extend the use of the single fiber fragmentation test to include fast reacting resin systems and to determine the effect of gelation time on interfacial shear properties. To do this work, we developed a processin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851683