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Topic Area: Electronics
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Displaying records 621 to 630 of 749 records.
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621. Simulating the Dynamic Electro-Thermal Behavior of Power Electronic Circuits and Systems
Topic: Electronics & Telecommunications
Published: 10/1/1993
Authors: Allen R Hefner Jr, David L. Blackburn

622. Simulating the Dynamic Electro-Thermal Behavior of Power Electronic Circuits and Systems
Topic: Electronics & Telecommunications
Published: 12/31/1992
Author: Allen R Hefner Jr

623. Simulations of Noise-Parameter Uncertainties
Topic: Electronics & Telecommunications
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...

624. Single Fiber Composites: A New Methodology for Determining Interfacial Shear Strength
Topic: Electronics & Telecommunications
Published: 1/1/2000
Authors: Gale Antrus Holmes, Donald Lee Hunston, Walter G McDonough, R C Peterson
Abstract: One of the critical factors controlling the long-term performance and durability of composites in structural applications is the interfacial shear strength (IFSS). The single fiber composite (SFC) test has been viewed by many as the best test for de ...

625. Single fiber tensile properties measured by the Kolsky bar using a direct fiber clamping method
Topic: Electronics & Telecommunications
Published: 6/1/2013
Authors: Jae Hyun Kim, Nathanael A Heckert, Walter G McDonough, Kirk D Rice, Gale Antrus Holmes

626. Small fluctuations in epitaxial growth via conservative noise
Topic: Electronics & Telecommunications
Published: 7/7/2011
Authors: Paul N. Patrone, Rongrong Wang, Dionisios Margetis
Abstract: We study the combined effect of growth (material deposition from above) and nearest-neighbor entropic and force-dipole interactions in a stochastically perturbed system of N line defects (steps) on a vicinal crystal surface in 1+1 dimensions. Firs ...

627. Small mass measurements for tuning fork-based force microscope cantilever spring constant calibration
Topic: Electronics & Telecommunications
Published: 6/7/2010
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Cutting edge mass sensors are capable of discriminating mass changes as small as several dozens of atoms, however the smallest mass commercially available from NIST with a calibration traceable to the International System of Units (SI) is 0.5 mg. To ...

628. Sources of Uncertainty for Near-Field Measurements
Topic: Electronics & Telecommunications
Published: 11/11/2007
Authors: Michael H Francis, Ronald Curtis Wittmann
Abstract: We discuss the sources of uncertainty in near-field measurements and their impact on far-field antenna parameters. The methods of estimating these uncertainties can be considered in three broad categories: theoretical estimation (analytical), compute ...

629. Spatial Resolution with Time-and-Polarization-Resolved Acoustic Microscopy
Topic: Electronics & Telecommunications
Published: 1/1/1997
Authors: D Xiang, Gerald V. Blessing, Nelson N. Hsu
Abstract: We have developed a time-and-polarization-resolved acoustic microscopy technique to determine material properties of solids immersed in water. At the heart of this technique is a specially designed large aperture, lensless, cylindrical PVDF transduce ...

630. Spin transfer switching of spin valve nanopillars using nanosecond pulsed currents
Topic: Electronics & Telecommunications
Published: 10/29/2004
Authors: Shehzaad F. Kaka, Matthew R Pufall, William H Rippard, Thomas J Silva, Stephen E Russek, Jordan A Katine, Matt Carey
Abstract: Spin valve nanopillars are reversed via the mechanism of spin momentum transfer using current pulses applied perpendicular to the film plane of the device. The applied pulses were varied in amplitude from 1.8 to 7.8 mA, and varied in duration within ...

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