NIST logo

Publications Portal

You searched on:
Topic Area: Electronics
Sorted by: title

Displaying records 41 to 50 of 721 records.
Resort by: Date / Title

41. Absolute Spatially- and Temporally-Resolved Optical Emission Measurements of rf Glow Discharges in Argon
Series: Journal of Research (NIST JRES)
Topic: Electronics & Telecommunications
Published: 3/1/1993
Authors: S. Djurovic, J R Roberts, Mark A Sobolewski, James K Olthoff

42. Absorption, transmission, and scattering of expanded polystyrene at millimeter-wave and terahertz frequencies
Topic: Electronics & Telecommunications
Published: 3/17/2008
Authors: Charles Dietlein, Jon E. Bjarnason, Erich N Grossman, Zoya Popovic
Abstract: Conventional material measurements of transmission and reflection in the millimeter-wave and terahertz frequency range do not differentiate between scattering and absorption, grouping effects from both mechanisms together into 'loss'. Accurate knowle ...

43. Accurate Determination of Planar Near-Field Correction Parameters for Linearly Polarized Probes
Topic: Electronics & Telecommunications
Published: 6/1/1988
Authors: Andrew G. Repjar, Allen C. Newell, Michael H Francis

44. Accurate Picometers for DC and Low-Frequency Displacement Measurement
Topic: Electronics & Telecommunications
Published: 4/6/2009
Authors: Jon Robert Pratt, Douglas T Smith, Lowell Howard
Abstract: We have developed a fiber-optic interferometer optimized for best performance in the frequency range from DC to 1 kHz, with displacement linearity of 1 % over a range of 25 nm, and noise-limited resolution of 2 pm [1]. The interferometer uses a tun ...

45. Acoustic Emission Sensors and Their Calibration
Topic: Electronics & Telecommunications
Published: 1/1/2004
Authors: Donald G Eitzen, Franklin R Breckenridge
Abstract: Noting Item: Request for NOTING- originally published in the Nondestructive Testing Handbook, Second Edition: Vol.5 Acoustic Emission Testing. Columbus, OH : American Society for Nondestructive Testing (1987): p121-134.

46. Adhesion Research at the National Institute of Standard and Technology (NIST)
Topic: Electronics & Telecommunications
Published: 3/11/2009
Authors: Donald Lee Hunston, Christopher M Stafford
Abstract: Over the years, NIST has been very active in adhesion research. Although there has never been an organizational group or large-scale program that focused specifically on this topic, a wide variety of projects have had adhesion, or related properties ...

47. Alignment Procedures for Field-Evaluation Measurements on a Spherical Surface
Topic: Electronics & Telecommunications
Published: 10/1/1999
Authors: Jeffrey R Guerrieri, Seturnino Canales

48. Amorphous Calcium Phosphate Based Composites: Effect of Surfactants and Poly(Ethylene Oxide) on Filler and Composite Properties
Topic: Electronics & Telecommunications
Published: 8/19/2008
Authors: Joseph M Antonucci, Da-Wei Liu, Drago Skrtic
Abstract: The uncontrolled aggregation of amorphous calcium phosphate (ACP) particulate fillers and their uneven distribution within polymer matrices can have adverse effects on the properties of ACP composites. In this paper we assessed the influence of non- ...

49. Amplifier Noise Measurements at NIST
Topic: Electronics & Telecommunications
Published: 4/1/1997
Authors: D. F. Wait, James Paul Randa

50. An Analysis of the Fiber-Fiber Interactions Using the Fragmentation Test and Optical Coherence Tomography
Topic: Electronics & Telecommunications
Published: 10/1/2002
Authors: Walter G McDonough, Gale Antrus Holmes, Joy P Dunkers
Abstract: Multi-fiber model composites are being used to conduct fundamental studies into the nucleation of failure in fibrous composites. Current results have revealed that the nucleation of critical flaws in unidirectional fibrous composites may rely on the ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series