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Displaying records 1 to 10 of 735 records.
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1. 10 TOhm and 100 TOhm High Resistance Measurements at NIST
Topic: Electronics & Telecommunications
Published: 9/25/2013
Authors: Dean G Jarrett, Marlin E Kraft
Abstract: The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913673

2. 10 kV, 5A 4H-SiC Power DMOSFET
Topic: Electronics & Telecommunications
Published: 5/1/2006
Authors: Sei-Hyung Ryu, Sumi Krishnaswami, Hull Brett, James Richmond, Anant Agarwal, Allen R Hefner Jr
Abstract: In this paper, we report 4H-SiC power DMOSFETs capable of blocking 10 kV. The devices were scaled up to 5 A, which is a factor of 25 increase in device area compared to the previously reported value. The devices utilized 100 {mu}m thick n-type epilay ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32301

3. 2D and 3D Topography Comparisons of Toolmarks Produced from Consecutively Manufactured Chisels and Punches.
Topic: Electronics & Telecommunications
Published: 5/20/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Robert Meryln Thompson, John Villanova, Taher Kakal
Abstract: A 2009 report by the National Academies [1] recommended strengthening the scientific basis of procedures and criteria employed by the forensic science specialty of toolmark identification. The current method of comparison and determination of ide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914887

4. 4 Amp 4H-SiC JBD Diodes
Topic: Electronics & Telecommunications
Published: 5/1/2000
Authors: Ranbir Singh, Sei-Hyung Ryu, M. Palmer, Allen R Hefner Jr, Jih-Sheng Lai
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9146

5. A 100 Tohm Guarded Hamon Transfer Standard
Topic: Electronics & Telecommunications
Published: Date unknown
Authors: Dean G Jarrett, Edward O'Brien, Marlin E Kraft
Abstract: Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915486

6. A Bibliography of the NIST Electromagnetic Fields Division Publications
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 3945
Topic: Electronics & Telecommunications
Published: 8/1/1990
Author: Ruth-Marie Lyons
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16663

7. A Calibration Service for Coaxial Reference Standards for Microwave Power
Series: Technical Note (NIST TN)
Report Number: 1374
Topic: Electronics & Telecommunications
Published: 5/1/1995
Author: Fred R. Clague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5834

8. A Certification Plan for a Planar Near-Field Range Used for High-Performance Phased-Array Testing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 3991
Topic: Electronics & Telecommunications
Published: 7/1/1992
Authors: Michael H Francis, Andrew G. Repjar, D P Kremer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20678

9. A Certification Plan for a Planar Near-Field Range Used for High-Performance Phased-Array Testing
Topic: Electronics & Telecommunications
Published: 7/1/1992
Authors: Michael H Francis, Andrew G. Repjar, D P Kremer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28086

10. A Comparison of K-Correction and Taylor-Series Correction for Probe-Position Errors in Planar Near-Field Scanning
Topic: Electronics & Telecommunications
Published: 11/1/1995
Author: Michael H Francis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12488



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