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Displaying records 61 to 70 of 753 records.
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61. Confocal Microscopy Analysis of Breech Face Marks on Fired Cartridge Cases from Ten Consecutively Manufactured Pistol Slides
Topic: Electronics & Telecommunications
Published: 7/1/2012
Authors: Xiaoyu A Zheng, Robert Meryln Thompson, Todd Weller
Abstract: Ten (10) pistol slides with consecutively manufactured breech faces, were obtained from Sturm, Ruger Co, Inc. A total of nine (9) test fires from each pistol, for a total of ninety (90) test fired cartridge cases, were compared using comparison micr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906690

62. A Low-Complexity Tree-Search Algorithm to Decode Diversity-Oriented Block Codes with Inter-Symbol Interference
Topic: Electronics & Telecommunications
Published: 6/10/2012
Author: Hamid Gharavi
Abstract: In order to contain a differential propagation delay in a block based cooperative MIMO system, a guard interval can be inserted to mitigate the effect of inter-symbol interference. A larger block size could substantially increase the effective symbo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910576

63. Guideline for the Implementation of Coexistence for Broadband Power Line Communication Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7862
Topic: Electronics & Telecommunications
Published: 6/6/2012
Authors: David H Su, Stefano Galli
Abstract: Power Line Communication (PLC) systems provide a bi-directional communication platform capable of delivering data for a variety of Smart Grid applications such as home energy management and intelligent meter reading and control. One benefit of applyi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911198

64. SIM.EM-S5 Voltage, Current and Resistance Comparison
Topic: Electronics & Telecommunications
Published: 6/1/2012
Authors: Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph E Elmquist, Nien F Zhang
Abstract: This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910567

65. Robust Auto-Alignment Technique for Orientation-Dependent Etching of Nanostructures
Topic: Electronics & Telecommunications
Published: 5/29/2012
Authors: Craig Dyer McGray, Richard J Kasica, Ndubuisi George Orji, Ronald G Dixson, Michael W Cresswell, Richard A Allen, Jon C Geist
Abstract: A robust technique is presented for auto-aligning nanostructures to slow-etching crystallographic planes in materials with diamond cubic structure. Lithographic mask patterns are modified from the intended dimensions of the nanostructures to compen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908076

66. Design, fabrication and characterization of a single-layer out-of-plane electrothermal actuator for SOI-MEMS Applications
Topic: Electronics & Telecommunications
Published: 5/3/2012
Authors: Yong Sik Kim, Nicholas G Dagalakis, Satyandra K. Gupta
Abstract: This paper presents the design, fabrication and characterization of a single-layer out-of-plane electrothermal actuator based on MEMS (Micro-Electro-Mechanical System). The proposed electrothermal actuator is designed to generate motions along the ou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910830

67. A review of fire blocking technologies for soft furnishings
Topic: Electronics & Telecommunications
Published: 4/23/2012
Authors: Shonali Nazare, Rick D Davis
Abstract: Fire barrier fabrics are expected to play an increasingly important role in complying with existing and proposed soft furnishing flammability regulations. The number of commercial fire blocking technologies is large in order to accommodate the vast ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910355

68. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Electronics & Telecommunications
Published: 4/10/2012
Authors: Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

69. Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography
Topic: Electronics & Telecommunications
Published: 4/10/2012
Authors: Ravikiran Attota, Shrawan Singhal, Sreenivasan S.V.
Abstract: Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it is imperative to have control of the residual layer thickness (RLT) of cured resist undern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910872

70. On CD-AFM bias related to probe bending
Topic: Electronics & Telecommunications
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903



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