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Displaying records 21 to 30 of 350 records.
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21. Effect of Heterogeneity in Nano-TiO2 Filled Acrylic Urethane Coatings on Surface Degradation under Accelerated UV Exposure
Topic: Electronics & Telecommunications
Published: 10/30/2014
Authors: Yongyan Pang, Stephanie S Watson, Li Piin Sung
Abstract: The objective of this study was to investigate how the heterogeneity due to nanoparticle dispersion of polymeric coatings affects surface morphological changes during ultraviolet (UV) exposure under different weathering conditions. Three types of nan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909005

22. NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0
Series: Special Publication (NIST SP)
Report Number: 1108r3
Topic: Electronics & Telecommunications
Published: 10/1/2014
Authors: Christopher Greer, David A Wollman, Dean Eldon Prochaska, Paul A Boynton, Jeffrey A. Mazer, Cuong T Nguyen, Gerald J FitzPatrick, Thomas L Nelson, Galen H. Koepke, Allen R Hefner Jr., Victoria Y Pillitteri, Tanya L Brewer, Nada T Golmie, David H Su, Allan C Eustis, David G Holmberg, Steven T Bushby
Abstract: Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110‹140) directs NIST ,,to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperabili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916755

23. GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy
Topic: Electronics & Telecommunications
Published: 9/26/2014
Authors: Joel C Weber, Paul T Blanchard, Aric Warner Sanders, Jonas Gertsch, Steven George, Samuel Berweger, Atif A. Imtiaz, Thomas M Wallis, Kristine A Bertness, Pavel Kabos, Norman A Sanford, victor bright
Abstract: We report on the fabrication of a GaN nanowire probe for near-field scanning microwave microscopy. The probe has a capacitive resolution of ~0.03 fF, surpassing that of a commercial Pt tip. Imaging of MoS2 sheets found the probe to be immune to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916071

24. Towards a Standard Mixed-Signal Parallel Processing Architecture for Miniature and Microrobotics
Series: Journal of Research (NIST JRES)
Report Number: 119.020
Topic: Electronics & Telecommunications
Published: 9/18/2014
Authors: Brian M. Sadler, Sebastian Hoyos
Abstract: The conventional analog-to-digital conversion (ADC) and digital signal processing (DSP) architecture has led to major advances in miniature and micro-systems technology over the past several decades. The outlook for these devices is significant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911266

25. A 100 Tohm Guarded Hamon Transfer Standard
Topic: Electronics & Telecommunications
Published: 8/24/2014
Authors: Dean G Jarrett, Edward O'Brien, Marlin E Kraft
Abstract: Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915486

26. Photonic-assisted Endoscopic Analysis of Guided W-band Pulses
Topic: Electronics & Telecommunications
Published: 8/24/2014
Authors: Jeffrey A Jargon, DongJoon Lee, JaeYong Kwon
Abstract: We present a photonic-assisted time-domain measurement technique for exploring millimeter-wave propagation through a W-band waveguide. The electric fields, guided inside a rectangular waveguide, are sampled using a sub-millimeter-scale electro-optic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915464

27. Broadband Rydberg Atom Based Self-Calibrating RF E-field Probe
Topic: Electronics & Telecommunications
Published: 8/16/2014
Authors: Christopher L Holloway, Joshua A Gordon, Steven R Jefferts, Thomas Patrick Heavner
Abstract: We present a significantly new approach for an electric (E) field probe. The probe is based on the interaction of RF-fields with Rydberg atoms, where alkali atoms are excited optically to Rydberg states and the applied RF-field alters the resonant st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915542

28. Characterizing a Device's susceptibility to broadband signals: A case study
Topic: Electronics & Telecommunications
Published: 8/4/2014
Authors: Jason B Coder, John M Ladbury, David Hunter
Abstract: It is common for electronic devices to be tested for their susceptibility to radiated signals they may be exposed to during their normal operation. A reverberation chamber is well suited to perform this type of testing because it can expose the d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915392

29. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Electronics & Telecommunications
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

30. Nanoparticle Released from Consumer Products: Flooring Nanocoatings and Interior Nanopaints
Series: Technical Note (NIST TN)
Report Number: 1835
Topic: Electronics & Telecommunications
Published: 7/21/2014
Authors: Li Piin Sung, Tinh Nguyen, Andrew Keith Persily
Abstract: Nanoparticles are increasingly incorporated in flooring coatings and interior paints to improve their abrasion and microbial resistance. One particular concern of this application is the release of nanoparticles from these surfaces due to repeated m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914979



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