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You searched on: Topic Area: Electronics Telecommunications Sorted by: date

Displaying records 11 to 20 of 356 records.
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11. Software-defined Radio Based Measurement Platform for Wireless Networks
Topic: Electronics & Telecommunications
Published: 10/16/2015
Authors: I-Chun Chao, Kang B Lee, Richard Candell, Frederick M Proctor, Chien-Chung Shen
Abstract: There has been a dramatic push to adopting wireless networking technologies and protocols (such as 802.11, ZigBee, WirelessHART, Bluetooth, ISA100.11a, etc.) into time-critical networks. End-to-end latency is critical to many distributed applications ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918707

12. Cracking and delamination behaviors of photovoltaic backsheet after accelerated laboratory weathering
Topic: Electronics & Telecommunications
Published: 9/23/2015
Authors: Chiao-Chi Lin, Yadong Lyu, Donald Lee Hunston, Jae Hyun Kim, Kai-Tak Wan, Deborah L Stanley, Xiaohong Gu
Abstract: The channel crack and delamination phenomena that occurred during tensile tests were utilized to study surface cracking and delamination properties of a multilayered backsheet. A model sample of commercial PPE (polyethylene terephthalate (PET)/PE ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919057

13. Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics
Topic: Electronics & Telecommunications
Published: 9/23/2015
Authors: Aric Warner Sanders, Anna E Fox, Paul David Dresselhaus
Abstract: Superconducting electronics is an established technological field for sensors, quantum computation and quantum-based standards and is emerging as an important low-power alternative to semiconductors. As in any electronics fabrication, the production ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917945

14. Simulated Sinewave Testing of DataAcquisition Systems using SineFitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Electronics & Telecommunications
Published: 7/30/2015
Authors: Jon C Geist, Muhammad Yaqub Afridi
Abstract: This report studies the effect of frequency offset, quantization error, random additive noise, and random phase jitter on the results of sine fitting and performing Discreet Fourier Transforms (DFT) of measurements of sinewaves with Data Acquisition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918705

15. Experimentally, How Does Cu TSV Diameter Influence its Stress State?
Topic: Electronics & Telecommunications
Published: 5/27/2015
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Yaw S Obeng, Ruqing Xu
Abstract: In this work, an experimental study of the influence of Cu through-silicon via (TSV) diameter on stress build up was performed using synchrotron-based X-ray microdiffraction technique. Three Cu TSV diameters were studied; 3 µm, 5 µm and 8 µm, all of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918579

16. Electro-thermal Simulation of 1200 V 4H-SiC MOSFET Short-Circuit SOA
Topic: Electronics & Telecommunications
Published: 5/10/2015
Authors: Tam Hoang Duong, Jose Miguel Ortiz, David Warren Berning, Allen R Hefner Jr., Sei-Hyung Ryu, John W. Palmour
Abstract: The purpose of this paper is to introduce a dynamic electro-thermal simulation and analysis approach for device design and short-circuit safe-operating-area (SOA) characterization using a physics-based electro-thermal Saber®* model. Model parameter e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918177

17. Simultaneous multiplexed materials characterization using a high-precision hard-X-ray micro-slit array
Topic: Electronics & Telecommunications
Published: 5/1/2015
Authors: Fan Zhang, Andrew John Allen, Lyle E Levine, Derrick C. Mancini, Jan Ilavsky
Abstract: The needs both for increased experimental throughput and for in-operando characterization of functional materials under increasingly realistic experimental conditions have emerged as major challenges across the whole of crystallography. Aiming to a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917168

18. Rolled-Up Nanoporous Membranes by Nanoimprint Lithography and Strain Engineering
Topic: Electronics & Telecommunications
Published: 4/7/2015
Authors: Jaehyun Park, ChangKyu Yoon, Qianru Jin, Lei Chen, David H Gracias
Abstract: It is extremely challenging to enable nanoscale patterning in three dimensional (3D) curved geometries using conventional nanolithographic approaches. In this paper, we describe a highly parallel approach that combines nanoimprint lithography (NIL) a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917673

19. Shape-changing magnetic assemblies as high-sensitivity NMR-readable nanoprobes
Topic: Electronics & Telecommunications
Published: 4/2/2015
Authors: Gary Zabow, Stephen Dodd, Alan Koretsky
Abstract: Fluorescent and plasmonic probes have proven invaluable in the life sciences, but function poorly in optically inaccessible regions. Here we present radio-frequency addressable analogs that afford sensing opportunities similar to those of fluorescent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917493

20. Challenges, Strategies and Opportunities for Measuring Carbon Nanotubes within a Polymer Composites by X-ray Photoelectron Spectroscopy
Series: Special Publication (NIST SP)
Report Number: 1200-10
Topic: Electronics & Telecommunications
Published: 3/14/2015
Authors: Justin M Gorham, Jeremiah W Woodcock, Keana C K Scott
Abstract: FOREWORD This NIST Special Publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917794



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  • SP 250-XX: Calibration Services
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