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Displaying records 81 to 90 of 319 records.
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81. Recommendation for Password-Based Key Derivation Part I: Storage Applications
Series: Special Publication (NIST SP)
Report Number: 800-132
Topic: Electronics & Telecommunications
Published: 12/22/2010
Authors: Meltem Sonmez Turan, Elaine B Barker, William Edward Burr, Lidong Chen
Abstract: This Recommendation specifies techniques for the derivation of master keys from passwords or passphrases to protect stored electronic data or data protection keys.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907381

82. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Topic: Electronics & Telecommunications
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904215

83. Conductive Carbon Nanotubes for Semiconductor Metrology
Topic: Electronics & Telecommunications
Published: 8/10/2010
Authors: Joseph J Kopanski, Victor H. Vartanian, Vladimir Mancevski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin
Abstract: This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906923

84. REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS
Topic: Electronics & Telecommunications
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906017

85. COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura
Topic: Electronics & Telecommunications
Published: 7/14/2010
Authors: Katherine MacReynolds, Michael H Francis, Douglas T. Tamura
Abstract: A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906057

86. Calibration service for instruments that measure laser beam diameter
Series: Special Publication (NIST SP)
Report Number: 250-87
Topic: Electronics & Telecommunications
Published: 7/1/2010
Author: Shao Yang
Abstract: This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this do ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903067

87. Automated Parameter Extraction Software for Silicon and High-Voltage Silicon Carbide Power Diodes
Topic: Electronics & Telecommunications
Published: 6/24/2010
Authors: Nanying Yang, Tam Hoang Duong, Jeong-O Jeong, Jose Miguel Ortiz, Allen R Hefner Jr., Kathleen Meehan
Abstract: This paper presents an automated parameter extraction software tool developed for constructing Silicon (Si) and Silicon Carbide (SiC) power diode models, which is called DIode Model Parameter extrACtion Tools (DIMPACT). This software tool extracts th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905858

88. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Electronics & Telecommunications
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

89. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"
Topic: Electronics & Telecommunications
Published: 6/7/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907081

90. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Electronics & Telecommunications
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series