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You searched on: Topic Area: Electronics Telecommunications

Displaying records 81 to 90 of 317 records.
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81. Conductive Carbon Nanotubes for Semiconductor Metrology
Topic: Electronics & Telecommunications
Published: 8/10/2010
Authors: Joseph J Kopanski, Victor H. Vartanian, Vladimir Mancevski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin
Abstract: This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906923

82. REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS
Topic: Electronics & Telecommunications
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906017

83. COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura
Topic: Electronics & Telecommunications
Published: 7/14/2010
Authors: Katherine MacReynolds, Michael H Francis, Douglas T. Tamura
Abstract: A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906057

84. Calibration service for instruments that measure laser beam diameter
Series: Special Publication (NIST SP)
Report Number: 250-87
Topic: Electronics & Telecommunications
Published: 7/1/2010
Author: Shao Yang
Abstract: This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this do ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903067

85. Automated Parameter Extraction Software for Silicon and High-Voltage Silicon Carbide Power Diodes
Topic: Electronics & Telecommunications
Published: 6/24/2010
Authors: Nanying Yang, Tam Hoang Duong, Jeong-O Jeong, Jose Miguel Ortiz, Allen R Hefner Jr., Kathleen Meehan
Abstract: This paper presents an automated parameter extraction software tool developed for constructing Silicon (Si) and Silicon Carbide (SiC) power diode models, which is called DIode Model Parameter extrACtion Tools (DIMPACT). This software tool extracts th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905858

86. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Electronics & Telecommunications
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

87. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"
Topic: Electronics & Telecommunications
Published: 6/7/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907081

88. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Electronics & Telecommunications
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

89. Dual-rate linear optical sampling for remote monitoring of complex modulation formats
Topic: Electronics & Telecommunications
Published: 6/2/2010
Authors: Tasshi Dennis, Paul A Williams
Abstract: We demonstrate linear optical sampling using simultaneous pulsed and CW local oscillators to enable phase tracking of a data modulated carrier. The technique enables the direct measurement of remotely received signals with low phase noise.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904987

90. A Low Complexity Interference Cancellation Technique for Multi-User DS-CDMA Communications
Topic: Electronics & Telecommunications
Published: 5/27/2010
Authors: Wen-Bin Yang, Kamran Sayrafian
Abstract: A low complexity Parallel Interference Cancellation (PIC) technique is proposed to suppress Multi-Access Interference (MAI) and minimize near-far effect for multi-user communication using Direct-Sequence Code Division Multiple Access (DS-CDMA). Inter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903857



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series