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Topic Area: Electronics
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Displaying records 81 to 90 of 722 records.
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81. Flip Chip Lamination to electrically contact organic single crystals on flexible substrates
Topic: Electronics & Telecommunications
Published: 4/20/2011
Authors: Oana Jurchescu, Brad Conrad, Christina Ann Hacker, David J Gundlach, Curt A Richter
Abstract: The fabrication of top metal contacts for organic electronics represents a challenge and has important consequences for electrical properties of such systems. We report a low cost and non-destructive printing process, Flip Chip Lamination (FCL), to f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907524

82. Reduced Flammability of Polyurethane Foam Using a Carbon Nanofiber-based Multilayer Nanocoating
Topic: Electronics & Telecommunications
Published: 4/10/2011
Authors: Yeon Seok Kim, Rick D Davis, Jaime C. Grunlan, Amanda A Cain
Abstract: For the first time, Layer-by-layer (LbL) assemblies made with carbon nanofiber (CNFs) are shown to improve the fire performance of polyurethane foam. The (359 ± 36) nm thick four bilayer coating of polyethyleneimine/CNF (cationic layer) and poly(ac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906819

83. NIST Tools for Quality Assurance in Botanical Dietary Supplement Measurements
Topic: Electronics & Telecommunications
Published: 4/7/2011
Author: Melissa Meaney Phillips
Abstract: The accurate analysis of botanical dietary supplements presents significant challenges for the analytical laboratory. Analyte stability, extraction efficiency, and availability of calibration materials and appropriate analytical controls all con ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907821

84. An electronic measurement of the Boltzmann constant
Topic: Electronics & Telecommunications
Published: 3/30/2011
Authors: Samuel Paul Benz, Alessio Pollarolo, Jifeng Qu, Horst Rogalla, Chiharu Urano, Weston Leo Tew, Paul David Dresselhaus, D. R White
Abstract: The Boltzmann constant was measured by comparing the Johnson noise of a resistor at the triple point of water with a quantum-based voltage reference signal generated with a superconducting Josephson-junction waveform synthesizer. The measured value ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907640

85. Effects of shape distortions and imperfections on mode frequencies and collective linewidths in nanomagnets
Topic: Electronics & Telecommunications
Published: 3/28/2011
Authors: Hans Toya Nembach, Justin M Shaw, Thomas J Silva, Ward L Johnson, Sudook A Kim, Robert D McMichael, Pavel Kabos
Abstract: We used Brillouin light scattering to show that shape distortions in Ni80Fe20 nanoelements can have a dramatic effect on the measured linewidth of certain modes. By intentionally introducing an amount of ,egg-likeŠ shape distortion to an ideal ellip ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907044

86. Modeling the transfer of line edge roughness from an EUV mask to the wafer
Topic: Electronics & Telecommunications
Published: 3/25/2011
Authors: Gregg M. Gallatin, Patrick Naulleau
Abstract: Contributions to line edge roughness (LER) from extreme ultraviolet (EUV) masks have recently been shown to be an issue of concern for both the accuracy of current resist evaluation tests as well the ultimate LER requirements for the 22 nm production ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908144

87. Summer Undergraduate Research Fellowships (SURF) at the National Institute of Standards and Technology
Topic: Electronics & Telecommunications
Published: 3/15/2011
Authors: Joseph J Kopanski, Richard L Steiner, Lisa Jean Fronczek, Christopher C White, Chiara F Ferraris
Abstract: We recruit students from underrepresented groups and at Colleges and Universities with limited on-campus opportunities for research experience. We strive to provide the highest quality and challenging undergraduate research experience by involving st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908434

88. Nanoelectronics Lithography
Topic: Electronics & Telecommunications
Published: 3/1/2011
Authors: Stephen Knight, Vivek M Prabhu, John H Burnett, James Alexander Liddle, Christopher L Soles, Alain C. Diebold
Abstract: This is a compiled chapter that will be included into the Handbook of Nanophysics.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901888

89. A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium
Topic: Electronics & Telecommunications
Published: 2/17/2011
Authors: Jolene D Splett, Dominic F. (Dominic F.) Vecchia, Loren Frederick Goodrich
Abstract: We compare methods for estimating the residual resistivity ratio (RRR) of high-purity niobium samples and investigate the effects of using different functional models on the final value. RRR is typically defined as the ratio of the electrical resista ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906197

90. Analysis of Three Different Regression Models to Estimate the Ballistic Performance of New and Environmentally Conditioned Body Armor
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7760
Topic: Electronics & Telecommunications
Published: 2/14/2011
Authors: Diane Mauchant, Michael A Riley, Kirk D Rice, Amanda Lattam Forster, Dennis D Leber, Daniel Victor Samarov
Abstract: The performance standard for ballistic-resistant body armor published by the National Institute of Justice (NIJ), NIJ Standard 0101.06, recommends estimating the perforation performance of body armor by performing a statistical analysis on V50 bal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907749



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