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Topic Area: Electronics
Telecommunications

Displaying records 81 to 90 of 747 records.
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81. Structural and electrical properties of Flip Chip Laminated metal-molecule-silicon structures modifying molecular backbone and atomic tether
Topic: Electronics & Telecommunications
Published: 10/19/2011
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
Abstract: The formation of electrical contacts on organic molecules preserving their integrity and using a scalable technique is a key step toward the fabrication of molecular electronic devices. Here we study the structural and electrical properties of metal- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906090

82. In Situ Gas Phase Diagnostics for Titanium Nitride Atomic Layer Deposition
Topic: Electronics & Telecommunications
Published: 10/14/2011
Authors: James E Maslar, William Andrew Kimes, Brent A Sperling
Abstract: This report describes the performance of a technique for the simultaneous, rapid measurement of major gas phase species present during titanium nitride thermal atomic layer deposition involving tetrakis(dimethylamido) titanium (TDMAT) and ammonia. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909194

83. High-Accuracy Photoreceiver Frequency Response Measurements at 1.55 um by Use of a Heterodyne Phase-Locked Loop
Topic: Electronics & Telecommunications
Published: 9/29/2011
Authors: Tasshi Dennis, Paul D Hale
Abstract: We demonstrate a high-accuracy heterodyne measurement system for characterizing the magnitude of the frequency response of high-speed 1.55 µm photoreceivers from 2 MHz to greater than 50 GHz. At measurement frequencies below 2 GHz, we employ a phase- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908885

84. Rectangular Scale-Similar Etch Pits in Monocrystalline Diamond
Topic: Electronics & Telecommunications
Published: 9/15/2011
Authors: Craig Dyer McGray, Richard A Allen, Marc J Cangemi, Jon C Geist
Abstract: Etching of monocrystalline diamond in oxygen and water vapor at 1100° C through small pores in a silicon nitride film produced smooth-walled rectangular cavities. The cavities were imaged by electron microscope and measured by interferometric microsc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908075

85. The mechanisms of damage in ballistic fibers
Topic: Electronics & Telecommunications
Published: 9/13/2011
Authors: Walter G McDonough, Haruki Kobayashi, Jae Hyun Kim, Amanda Lattam Forster, Kirk D Rice, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908283

86. Linking Degree of Filler Dispersion to Photodegradation Rate in a NanoTiO2-Latex Coating: An Accelerated Weathering Study
Topic: Electronics & Telecommunications
Published: 9/4/2011
Authors: Li Piin Sung, Yongyan Pang, Stephanie S Watson
Abstract: The objective of this study is to investigate the influence of the filler dispersion of nano-TiO2 in polymeric coatings on the surface morphology evolution of the coatings under UV exposure. Two types of nano-TiO2 with different surface treatments we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908287

87. Extent and Quality of Interface in Cellulose-PE Nanocomposites
Topic: Electronics & Telecommunications
Published: 8/28/2011
Authors: Mauro Zammarano, Paul Hutsell Maupin, Li Piin Sung, Jeffrey W Gilman, Edward D. McCarthy, Yeon S. Kim, Douglas M. Fox
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908081

88. Calibration of dynamic sensors for noncontact-atomic force microscopy
Topic: Electronics & Telecommunications
Published: 8/12/2011
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906206

89. DETERMINATION OF MEAN DENSITIES, POROSITY AND THICKNESS OF BIOFILMS ATTACHED ON IRREGULAR-SHAPED MEDIA
Topic: Electronics & Telecommunications
Published: 8/10/2011
Authors: Edward Joseph Garboczi, Meng Hu, Tian Zhang
Abstract: Biofilm density, porosity, and thickness are biofilm architecture properties that are important but often difficult to measure. In this study, wet and dry biofilm densities and biofilm porosity in shredded tire biofilters were determined using conven ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908860

90. GaN Nanowires Grown by Molecular Beam Epitaxy
Topic: Electronics & Telecommunications
Published: 8/1/2011
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: The unique properties of GaN nanowires grown by molecular beam epitaxy are reviewed. These properties include the absence of residual strain, exclusion of most extended defects, long photoluminescence lifetime, low surface recombination velocity,and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909502



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