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Topic Area: Electronics
Telecommunications

Displaying records 81 to 90 of 745 records.
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81. High-Accuracy Photoreceiver Frequency Response Measurements at 1.55 um by Use of a Heterodyne Phase-Locked Loop
Topic: Electronics & Telecommunications
Published: 9/29/2011
Authors: Tasshi Dennis, Paul D Hale
Abstract: We demonstrate a high-accuracy heterodyne measurement system for characterizing the magnitude of the frequency response of high-speed 1.55 µm photoreceivers from 2 MHz to greater than 50 GHz. At measurement frequencies below 2 GHz, we employ a phase- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908885

82. Rectangular Scale-Similar Etch Pits in Monocrystalline Diamond
Topic: Electronics & Telecommunications
Published: 9/15/2011
Authors: Craig Dyer McGray, Richard A Allen, Marc J Cangemi, Jon C Geist
Abstract: Etching of monocrystalline diamond in oxygen and water vapor at 1100° C through small pores in a silicon nitride film produced smooth-walled rectangular cavities. The cavities were imaged by electron microscope and measured by interferometric microsc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908075

83. The mechanisms of damage in ballistic fibers
Topic: Electronics & Telecommunications
Published: 9/13/2011
Authors: Walter G McDonough, Haruki Kobayashi, Jae Hyun Kim, Amanda Lattam Forster, Kirk D Rice, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908283

84. Linking Degree of Filler Dispersion to Photodegradation Rate in a NanoTiO2-Latex Coating: An Accelerated Weathering Study
Topic: Electronics & Telecommunications
Published: 9/4/2011
Authors: Li Piin Sung, Yongyan Pang, Stephanie S Watson
Abstract: The objective of this study is to investigate the influence of the filler dispersion of nano-TiO2 in polymeric coatings on the surface morphology evolution of the coatings under UV exposure. Two types of nano-TiO2 with different surface treatments we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908287

85. Extent and Quality of Interface in Cellulose-PE Nanocomposites
Topic: Electronics & Telecommunications
Published: 8/28/2011
Authors: Mauro Zammarano, Paul Hutsell Maupin, Li Piin Sung, Jeffrey W Gilman, Edward D. McCarthy, Yeon S. Kim, Douglas M. Fox
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908081

86. Calibration of dynamic sensors for noncontact-atomic force microscopy
Topic: Electronics & Telecommunications
Published: 8/12/2011
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906206

87. DETERMINATION OF MEAN DENSITIES, POROSITY AND THICKNESS OF BIOFILMS ATTACHED ON IRREGULAR-SHAPED MEDIA
Topic: Electronics & Telecommunications
Published: 8/10/2011
Authors: Edward Joseph Garboczi, Meng Hu, Tian Zhang
Abstract: Biofilm density, porosity, and thickness are biofilm architecture properties that are important but often difficult to measure. In this study, wet and dry biofilm densities and biofilm porosity in shredded tire biofilters were determined using conven ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908860

88. GaN Nanowires Grown by Molecular Beam Epitaxy
Topic: Electronics & Telecommunications
Published: 8/1/2011
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: The unique properties of GaN nanowires grown by molecular beam epitaxy are reviewed. These properties include the absence of residual strain, exclusion of most extended defects, long photoluminescence lifetime, low surface recombination velocity,and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909502

89. Lithography and Chemical Modeling of Acid Amplfiers for Use in EUV Photoresists
Topic: Electronics & Telecommunications
Published: 7/28/2011
Authors: Kirstin Kruger, craig higgins, Gregg M. Gallatin, Robert Brainard
Abstract: We postulate that the best way to simultaneously improve resolution, line edge roughness (LER), and sensitivity all in EUV resists is to increase the number of acid molecules generated per absorbed photon. In previous work, we showed that acid ampli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908397

90. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electronics & Telecommunications
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932



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