NIST logo

Publications Portal

You searched on:
Topic Area: Electronics
Telecommunications

Displaying records 71 to 80 of 736 records.
Resort by: Date / Title


71. In Situ Gas Phase Diagnostics for Titanium Nitride Atomic Layer Deposition
Topic: Electronics & Telecommunications
Published: 10/14/2011
Authors: James E Maslar, William Andrew Kimes, Brent A Sperling
Abstract: This report describes the performance of a technique for the simultaneous, rapid measurement of major gas phase species present during titanium nitride thermal atomic layer deposition involving tetrakis(dimethylamido) titanium (TDMAT) and ammonia. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909194

72. High-Accuracy Photoreceiver Frequency Response Measurements at 1.55 um by Use of a Heterodyne Phase-Locked Loop
Topic: Electronics & Telecommunications
Published: 9/29/2011
Authors: Tasshi Dennis, Paul D Hale
Abstract: We demonstrate a high-accuracy heterodyne measurement system for characterizing the magnitude of the frequency response of high-speed 1.55 µm photoreceivers from 2 MHz to greater than 50 GHz. At measurement frequencies below 2 GHz, we employ a phase- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908885

73. Rectangular Scale-Similar Etch Pits in Monocrystalline Diamond
Topic: Electronics & Telecommunications
Published: 9/15/2011
Authors: Craig Dyer McGray, Richard A Allen, Marc J Cangemi, Jon C Geist
Abstract: Etching of monocrystalline diamond in oxygen and water vapor at 1100° C through small pores in a silicon nitride film produced smooth-walled rectangular cavities. The cavities were imaged by electron microscope and measured by interferometric microsc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908075

74. The mechanisms of damage in ballistic fibers
Topic: Electronics & Telecommunications
Published: 9/13/2011
Authors: Walter G McDonough, Haruki Kobayashi, Jae Hyun Kim, Amanda Lattam Forster, Kirk D Rice, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908283

75. Linking Degree of Filler Dispersion to Photodegradation Rate in a NanoTiO2-Latex Coating: An Accelerated Weathering Study
Topic: Electronics & Telecommunications
Published: 9/4/2011
Authors: Li Piin Sung, Yongyan Pang, Stephanie S Watson
Abstract: The objective of this study is to investigate the influence of the filler dispersion of nano-TiO2 in polymeric coatings on the surface morphology evolution of the coatings under UV exposure. Two types of nano-TiO2 with different surface treatments we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908287

76. Extent and Quality of Interface in Cellulose-PE Nanocomposites
Topic: Electronics & Telecommunications
Published: 8/28/2011
Authors: Mauro Zammarano, Paul Hutsell Maupin, Li Piin Sung, Jeffrey W Gilman, Edward D. McCarthy, Yeon Seok Kim, Douglas M. Fox
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908081

77. Calibration of dynamic sensors for noncontact-atomic force microscopy
Topic: Electronics & Telecommunications
Published: 8/12/2011
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906206

78. DETERMINATION OF MEAN DENSITIES, POROSITY AND THICKNESS OF BIOFILMS ATTACHED ON IRREGULAR-SHAPED MEDIA
Topic: Electronics & Telecommunications
Published: 8/10/2011
Authors: Edward Joseph Garboczi, Meng Hu, Tian Zhang
Abstract: Biofilm density, porosity, and thickness are biofilm architecture properties that are important but often difficult to measure. In this study, wet and dry biofilm densities and biofilm porosity in shredded tire biofilters were determined using conven ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908860

79. GaN Nanowires Grown by Molecular Beam Epitaxy
Topic: Electronics & Telecommunications
Published: 8/1/2011
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: The unique properties of GaN nanowires grown by molecular beam epitaxy are reviewed. These properties include the absence of residual strain, exclusion of most extended defects, long photoluminescence lifetime, low surface recombination velocity,and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909502

80. Lithography and Chemical Modeling of Acid Amplfiers for Use in EUV Photoresists
Topic: Electronics & Telecommunications
Published: 7/28/2011
Authors: Kirstin Kruger, craig higgins, Gregg M. Gallatin, Robert Brainard
Abstract: We postulate that the best way to simultaneously improve resolution, line edge roughness (LER), and sensitivity all in EUV resists is to increase the number of acid molecules generated per absorbed photon. In previous work, we showed that acid ampli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908397



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series