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Topic Area: Electronics
Telecommunications

Displaying records 61 to 70 of 722 records.
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61. Analytical Approaches to Determination of Total Choline in Foods and Dietary Supplements
Topic: Electronics & Telecommunications
Published: 11/29/2011
Author: Melissa Meaney Phillips
Abstract: Choline is a quaternary amine that is synthesized in the body or consumed through the diet. Choline is critical for cell membrane structure and function and in synthesis of the neurotransmitter acetylcholine. While the human body produces this micron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910122

62. In Situ Gas Phase Diagnostics for Titanium Nitride Atomic Layer Deposition
Topic: Electronics & Telecommunications
Published: 10/14/2011
Authors: James E Maslar, William Andrew Kimes, Brent A Sperling
Abstract: This report describes the performance of a technique for the simultaneous, rapid measurement of major gas phase species present during titanium nitride thermal atomic layer deposition involving tetrakis(dimethylamido) titanium (TDMAT) and ammonia. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909194

63. High-Accuracy Photoreceiver Frequency Response Measurements at 1.55 um by Use of a Heterodyne Phase-Locked Loop
Topic: Electronics & Telecommunications
Published: 9/29/2011
Authors: Tasshi Dennis, Paul D Hale
Abstract: We demonstrate a high-accuracy heterodyne measurement system for characterizing the magnitude of the frequency response of high-speed 1.55 µm photoreceivers from 2 MHz to greater than 50 GHz. At measurement frequencies below 2 GHz, we employ a phase- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908885

64. Rectangular Scale-Similar Etch Pits in Monocrystalline Diamond
Topic: Electronics & Telecommunications
Published: 9/15/2011
Authors: Craig Dyer McGray, Richard A Allen, Marc J Cangemi, Jon C Geist
Abstract: Etching of monocrystalline diamond in oxygen and water vapor at 1100° C through small pores in a silicon nitride film produced smooth-walled rectangular cavities. The cavities were imaged by electron microscope and measured by interferometric microsc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908075

65. The mechanisms of damage in ballistic fibers
Topic: Electronics & Telecommunications
Published: 9/13/2011
Authors: Walter G McDonough, Haruki Kobayashi, Jae Hyun Kim, Amanda Lattam Forster, Kirk D Rice, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908283

66. Calibration of dynamic sensors for noncontact-atomic force microscopy
Topic: Electronics & Telecommunications
Published: 8/12/2011
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906206

67. DETERMINATION OF MEAN DENSITIES, POROSITY AND THICKNESS OF BIOFILMS ATTACHED ON IRREGULAR-SHAPED MEDIA
Topic: Electronics & Telecommunications
Published: 8/10/2011
Authors: Edward Joseph Garboczi, Meng Hu, Tian Zhang
Abstract: Biofilm density, porosity, and thickness are biofilm architecture properties that are important but often difficult to measure. In this study, wet and dry biofilm densities and biofilm porosity in shredded tire biofilters were determined using conven ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908860

68. GaN Nanowires Grown by Molecular Beam Epitaxy
Topic: Electronics & Telecommunications
Published: 8/1/2011
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: The unique properties of GaN nanowires grown by molecular beam epitaxy are reviewed. These properties include the absence of residual strain, exclusion of most extended defects, long photoluminescence lifetime, low surface recombination velocity,and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909502

69. Lithography and Chemical Modeling of Acid Amplfiers for Use in EUV Photoresists
Topic: Electronics & Telecommunications
Published: 7/28/2011
Authors: Kirstin Kruger, craig higgins, Gregg M. Gallatin, Robert Brainard
Abstract: We postulate that the best way to simultaneously improve resolution, line edge roughness (LER), and sensitivity all in EUV resists is to increase the number of acid molecules generated per absorbed photon. In previous work, we showed that acid ampli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908397

70. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electronics & Telecommunications
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932



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