Publications Portal

You searched on:
Topic Area: Electronics
Telecommunications

Displaying records 21 to 30 of 701 records.
Resort by: Date / Title


21. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Electronics & Telecommunications
Published: 4/10/2012
Authors: Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

22. Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography
Topic: Electronics & Telecommunications
Published: 4/10/2012
Authors: Ravikiran Attota, Shrawan Singhal, Sreenivasan S.V.
Abstract: Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it is imperative to have control of the residual layer thickness (RLT) of cured resist undern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910872

23. On CD-AFM bias related to probe bending
Topic: Electronics & Telecommunications
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

24. Detection and Speciation of Brominated Flame Retardants in Consumer Products and Household Dust
Topic: Electronics & Telecommunications
Published: 3/27/2012
Authors: Richard D Holbrook, Jeffrey M Davis, Keana C k Scott, Christopher W Szakal
Abstract: The ubiquitous presence of brominated flame retardants in humans, biota, and the environment has caused concerns about their toxicity, transformations, and persistence. Polymeric materials, which often are intercalated with include brominated flame ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905365

25. Durable nanoparticle coatings to reduce polyurethane foam flammability
Topic: Electronics & Telecommunications
Published: 3/24/2012
Authors: Yeon Seok Kim, Rick D Davis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909889

26. Flexible polyurethane foam with well characterized and reproducible smoldering
Topic: Electronics & Telecommunications
Published: 3/24/2012
Authors: Mauro Zammarano, Szabolcs S. Matko, Rick D Davis, Roland H. Kraemer
Abstract: Smoldering is a self-sustaining heterogeneous oxidation reaction that induces a slow, low temperature, flameless combustion.1 Flexible polyurethane foams (PUF) are particularly prone to smoldering due to their high air permeability and low density. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909925

27. Modeling the effects of acid amplifiers on photoresist stochastics
Topic: Electronics & Telecommunications
Published: 3/23/2012
Authors: Gregg M. Gallatin, Patrick Naulleau, Robert Brainard
Abstract: The tradeoff between Resolution, Line Edge Roughness (LER) and Sensitivity, the so called RLS tradeoff, continues to be a difficult challenge, especially for EUV lithography. Acid amplifiers have recently been proposed as a method to improve upon t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910777

28. The National Ballistics Imaging Comparison (NBIC) Project
Topic: Electronics & Telecommunications
Published: 3/10/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou, Robert Meryln Thompson, James H Yen, Thomas B Renegar, Xiaoyu A Zheng, Richard M Silver, Martin Ols
Abstract: In response to the guidelines issued by the ASCLD/LAB-International (American Society of Crime Laboratory Directors/Laboratory Accreditation Board) to establish traceability and quality assurance in U.S. crime laboratories, a NIST/ATF joint project e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907871

29. Nanomanufacturing with DNA Origami: Factors Affecting the Kinetics and Yield of Quantum Dot Binding
Topic: Electronics & Telecommunications
Published: 3/7/2012
Authors: Seung Hyeon Ko, Gregg M. Gallatin, James Alexander Liddle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907933

30. Critical Sustainability Impacts from Polymeric and Concrete Inputs to Construction
Series: OTHER
Topic: Electronics & Telecommunications
Published: 2/29/2012
Author: Barbara Cassard Lippiatt
Abstract: This paper analyzes environmentally-extended I-O tables to identify and quantify the sustainability impacts of most concern for broad categories of polymeric and concrete materials used in the U.S. construction industry. The extended I-O tables trace ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910417



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series